脉冲软X光辐射三种材料的喷射冲量实验研究

 在强光一号脉冲加速器上进行了国内首次的实验室软X光辐射三种材料的喷射冲量研究。结果表明，在能量为(0.2～0.33)keV、平均脉宽为39ns左右的X光辐射下，对灰漆、白漆和硬铝，在能注量分别为(92～152)J/cm²、(115～136)J/cm²和(163～192)J/cm²时，它们的冲量耦合系数分别为(0.61～0.80)Pa·s/(J·cm^-2)、(0.58～0.97)Pa·s/(J·cm^-2)和(0.61～0.84)Pa·s/(J·cm^-2)。     

FeS2多晶薄膜电子结构的实验研究

用磁控溅射方法制各纯Fe薄膜，并硫化合成FeS₂. 采用同步辐射X射线近边吸收谱与X射线光电子能谱研究了薄膜的电子结构. 结果表明，合成的FeS₂薄膜，在费米能级附近，有较强的Fe 3d态密度存在，同时，在价带谱中2—10eV处有强度较大的S 3p态密度存在；Fe的3d轨道在八面体配位场作用下分别为t_2g和e_g轨道，实验中由Fe的吸收谱计算得到两分裂能级之差为2.1eV;实验测得FeS₂价带结构中导带宽度约为2.4eV，导带上方仍存在第二能隙，其宽度约为2.8eV. 关键词： 磁控溅射 二硫化铁 X射线吸收近边结构 电子结构     

长寿命吸收过程对超快动力学过程测量的影响

使用飞秒时间分辨抽运-探测透射光谱技术,实验研究了GaAs体材料中光激发载流子的超快弛豫动力学的波长依赖.在相同的光激发载流子浓度和抽运/探测比时,发现760 nm和780 nm两中心波长处的瞬态透射变化延迟扫描信号出现负的和振荡的信号.与模拟计算结果对比,判定该实验瞬态信号是错误的.分析探测器输出波形,发现是由于反相波形导致的,而引起反相波形的原因在于样品中存在长寿命的吸收过程.指出通过提高探测器上的抽运/探测比能够矫正反相波形,从而获得正确的瞬态透射变化动力学.提高探测器上的抽运/探测比与目前的应尽量减小抽运光对探测器的散射贡献的观点是对立的.文章的研究结果对应用抽运-探测时间分辨光谱技术正确地测量超快瞬态动力学过程具有重要的参考价值. 关键词： 时间分辨抽运-探测透射光谱 饱和吸收 吸收增强 GaAs体材料     

Pt/C催化剂中纳米Pt颗粒团聚效应的小角X射线散射

 应用小角X射线散射(SAXS)技术,对乙二醇合成法、浸渍还原法和微波加热法制备的Pt/C催化剂粉体内纳米Pt颗粒的团聚效应进行了研究,得到了不同方法制备的Pt颗粒及其团聚体的特征尺寸、体积分布、表面积变化、团聚程度等信息,并利用透射电镜（TEM）对3种样品进行了测试。实验结果表明:微波加热法制备的催化剂中,Pt颗粒较好地分散于C载体上,且Pt颗粒具有尺度小、分布范围窄、总表面积大和团聚体较少等特征;常规浸渍和乙二醇还原两种方法制备的催化剂中Pt颗粒大小分布相似,但乙二醇还原法制备的催化剂总表面积和团聚体尺度更大,数量也更多。     

一种用于Z箍缩实验的软X射线成像系统

基于塑料闪烁体转换和光学条纹相机的方法建立了一套用于Z箍缩实验中的软X射线条纹图像诊断系统,解决了以往实验中使用的X射线条纹相机易被电磁环境干扰以及相机电极部件易被实验产生的高速粒子损伤的问题.诊断系统的光谱响应范围主要集中在0.2—10 keV,系统的空间分辨率经过理论评估小于120μm,通过标定闪烁体对X射线的时间...     

能量色散型X射线荧光光谱法测定聚合物材料中镉和铅含量

提出了能量色散型X射线荧光光谱测定聚合物材料中镉和铅的测试分析方法及制样技巧。按照仪器分析条件测定同时含有镉和铅的6块不同浓度级别的标准物质来建立校准工作曲线,其线性范围分别在250ug·g-1、1100ug·g-1以内。镉和铅的方法检出限依次为4.7ug·g-1、4.1ug·g-1。该方法应用于测定欧洲标准物质ERM-EC680和ERM-EC681k,其镉和铅的实际测定值与标准物质证书的标称值相符,测定实际样品中的镉和铅的回收率介于90~110%。该方法测定标准物质和实际样品中镉和铅的精密度均小于10%。     

A Model for Fractal Dimension of Rough Surfaces

We report a model for the fractal dimension D8 of rough surfaces based on the fractal distribution of roughness elements on surfaces and the fractal character of surface profiles. The proposed model for the fractal dimension Ds is expressed as a function of the fractaJ dimensions D for conic roughness diameter/height and Dp for surface profile, maximum roughness base diameter λmax, the ratio β of conic roughness height to its base radius as well as the ratio λmin/λmasx of the minimum to the maximal base diameter.     

Novel correction method for X-ray beam energy fluctuation of high energy DR system with a linear detector

A high energy digital radiography (DR) testing system has generated diverse scientific and technological interest in the field of industrial non-destructive testing. However, due to the limitations of manufacturing technology for accelerators, an energy fluctuation of the X-ray beam exists and leads to bright and dark streak artifacts in the DR image. Here we report the utilization of a new software-based method to correct the fluctuation artifacts. The correction method is performed using a high pass filtering operation to extract the high frequency information that reflects the X-ray beam energy fluctuation, and then subtracting it from the original image. Our experimental results show that this method is able to rule out the artifacts effectively and is readily implemented on a practical scanning system.     

Structure and Semiconducting Character of a Polymeric Iodoplumbate Coordination Complex

A new polymeric iodoplumbate complex [Zn(DMF)6][Pb2I6] 1 has been prepared and characterized by elemental analysis and single-crystal X-ray analysis. Its structure contains infinite iodoplumbate chains constructed by the [PbI5] subunit. EHT crystal orbital calculation and the experimental results show that this material is an unconventional semiconductor and the electrical character is associated with its structural feature.     

Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device （operated with argon gas）. The analysis is based on the effect of anomalous resistances. To study the energy spectrum, a four-channel diode X-ray spectrometer was used along with a special set of filters. The filters were suitable for detection of medium range X-rays as well as hard X-rays with energy exceeding 30 keV. The results indicate that the anomalous resistivity effect during the post pinch phase may cause multi-radiation of X-rays with a total duration of 300 ± 50 ns. The significant contribution of Cu-Kα was due to the medium range X-rays, nonetheless, hard X-rays with energies greater than 15 keV also participate in the process. The total emitted X-ray energy in the forms of Cu-K and Cu-K/3 was around 0.14 ± 0.02 （J/Sr） and 0.04 ±0.01 （J/Sr）, respectively. The total energy of the emitted hard X-ray （〉 15 keV） was around 0.12± 0.02 （J/Sr）.