基于迈克耳孙干涉光程差放大法的微小位移测量

基于迈克耳孙干涉光路,介绍了一种新的测量微小位移的实验方法.通过在迈克耳孙干涉原光路中添加平行平面镜组,使入射光和反射光在反射镜组中多次反射.当平行平面镜之间的距离发生微小变化后,两反射光束之间光程差将会被放大,通过观测干涉条纹的变化可以计算出微小的位移.设计了实验光路,对该方法进行了实验验证.与传统的迈克耳孙干涉实验相比,该方法的测量精度有很大的提高.     

基于加权最小二乘法的干涉图校准方法

针对现有干涉图校准方法的不足，提出了一种基于加权最小二乘法的干涉图校准方法。根据干涉图中标准件边缘与干涉条纹边缘之间的差异，用合适大小的掩模对标准件的边缘进行初步判定和提取，再利用加权最小二乘法对提取出的边缘进行精确定位。通过计算标准件中已知尺寸部分在干涉图中所占据的像素数目，求出每个像素代表的实际距离，完成校准。实验表明，该方法的计算耗时较霍夫变换法减少一半，定位精度小于1个像素，且适用于不同对比度的干涉图，具有很强的实用性。     

Theoretical Analysis of Interference Nanolithography of Surface Plasmon Polaritons without a Match Layer

Interference nanolithography techniques based on long-range surface plasmon polaritons （LR-SPP） are hardly ever achieved by experiments at present. One key reason is that suitable liquid materials are difflcult to find as the match layer connects the metal film and the resist. We redesign a Kretschmann-Raether structure for interference lithography. A polymer layer is coated under the metal film, and an air layer is placed between the polymer layer and the resist layer. This design not only avoids the above-mentioned question of the match layer, but also can form a soft contact between the polymer layer and the resist layer and can protect the exposure pattern. Simulation results confirm that a device with an appropriately thick polymer layer can form high intensity and contrast interference fringes with a critical dimension of about λ/7 in the resist. In addition, the fabrication of the device is very easy.     

点波源干涉图样的数学形式是双曲线

阐述了两个点波源所形成的干涉图样是多组双曲线.     

Spectral feature with sub-natural linewidth due to quantum interference in a four-level system

This paper studies the narrow spectral feature appearing in a four-level system coupled by two strong coherent fields and probed by a weak laser field. The linewidth is examined as a function of the Rabi frequencies of coupling fields, and the result is explained by using the dressed-state formalism.     

Absolute small-angle measurement based on optical feedback interferometry

We present a simple but effective method for small-angle measurement based on optical feedback interferometry （or laser self-mixing interferometry）. The absolute zero angle can be defined at the biggest fringe amplitude point, so this method can also achieve absolute angle measurement. In order to verify the method, we construct an angle measurement system. The Fourier-transform method is used to analysis the interference signal. Rotation angles are experimentally measured with a resolution of 10^-6 rad and a measurement range of approximately from -0.0007 to ＋0.0007 rad.     

利用等厚干涉条纹测量微光的调制传递函数MTF

通过对微光的调制传递函数 (MTF)的讨论 ,结合传统的“分辨率板法” ,提出了一种新的测量微光的MTF的方法。该方法直接从MTF的物理含义出发 ,利用迈克尔逊干涉仪产生一系列空间频率的等厚干涉条纹来模拟分辨率板的作用 ,在计算机的控制下 ,自动测量出连续的MTF曲线。给出的实验光路和实验结果表明 ,利用干涉条纹测量微光的MTF是一种可行的简便方法 ,在计算机的控制下 ,可快速完成夜视仪的传递函数测量     

Tl2Ba2CaCu2O8薄膜直流超导量子干涉器的噪声特性

本给出了Ｔｌ２Ｂａ２ＣａＣｕ２Ｏ８薄膜双晶结直流超导量子干涉器噪声测量的实验结果。与至今最好的ＹＢＣＯ薄膜器件噪声测量结果相比，铊器件１／ｆ特性低频噪声的起始频率要低二个数量级。本还详细介绍了器件在闭环工作模式时，其噪声频谱的测量方法。     

相移测量技术中相移器研究

本文介绍一种用于相移测量技术的相移器。该相移器由计算机通过Ｄ／Ａ接口板自动控制输出电压幅度，其电路采用闭环控制，位移由压电晶体产生，具有很高的电压稳定度（０１％）和较小的相移误差（小于３°）。描述相移器的结构、驱动源工作原理及相移器标定方法