旋转锥镜散斑剪切术测量动态扭率和斜率

采用旋转锥镜技术，进行激光散斑剪切照相，测量变形物体的动态扭率和斜率，拍摄一幅散斑图可获得扭率和斜率动态变化的全过程。     

基于统计滤波的单幅散斑条纹图的相位恢复技术

基于统计信号处理技术的贝叶斯（Bayes）估计原理，提出一种新的滤波方法。该方法能有效减少散斑条纹图中的噪声，而且仅用一幅散区斑条纹图就能获得准确的条纹相位分布，通过实例说明了该方法的处理过程。     

An in-plane insensitive multiaperture speckle shear interferometer for slope measurement

A modified two-aperture speckle shear interferometer that eliminates the contribution of the in-plane component and its derivative to the phase change, and yields a fringe pattern corresponding to the first-order partial derivatives of the out-of-plane displacement component, is reported in this note. In this method, two laterally sheared object points are viewed axially. The wave fields from these points are independently combined at the image plane of the imaging system.     

测量悬臂梁试件截面转角的贴片光栅法

本文应用光栅的衍射行为提出了测量悬臂梁截面转角的方法,给出了普遍公式,并通过实验验证,结果很好.     

二次波面干涉的剪切散斑干涉计量术

提出了一种新的剪切散斑干涉方法─—二次波面干涉的剪切散斑干涉计量术．这一方法将被测物体变形前后波面的第一次干涉信息分别储存在两张全息干板上，通过光学信息处理实现波面的第二次干涉．两次波面干涉分别消除了位移和位移的一阶导数场对波面位相的影响，得到仅反映位移二阶导数场的条纹图．     

The identification of fringe positions in speckle patterns

This paper two methods of identifying fringe positions in speckle patterns. The first uses local directional averaging to track fringes, while the second uses standard image processing techniques to connect the patterns into a form where the fringes can be identified.     

基于Zemax的He-Ne激光光束聚焦物镜的设计

 为了得到一个合理的He-Ne激光光束聚焦物镜,采用以正前凸型为基础的高折射率双片结构,应用Zemax软件进行优化设计,获得了弥散斑直径为0.002mm的He-Ne激光聚焦物镜,该镜头只需校正轴上点球差。实验结果表明：设计的镜头比低折射率单片透镜得到的弥散圆直径更小,达到0.0019mm,球差被控制在-0.05mm～+0.05mm范围内,MTF曲线所围面积变大,中心点亮度增高,符合实际需要。     

Depth sensing using coherence mapping

A method for depth sensing based on sensing the visibility associated with the coherence function of a laser source is presented. The setup is based on an electronic speckle pattern interferometric (ESPI) setup, where the object depth is encoded into the amplitude of the interference pattern without the need for depth scanning. After performing phase-shifting method, the object three-dimensional (3-D) shape is reconstructed by means as a range image from the visibility of the image set of interferograms and where each gray level represents a given object depth. Experimental results validate the proposed approach for reflective diffuse objects at different measurement distances.     

Measuring thickness change of transparent plate by electronic speckle pattern interferometry and digital image correlation

The thickness change of transparent plates was measured by electronic speckle pattern interferometry (ESPI) method and digital image correlation (DIC) method. An out-of-plane ESPI system was developed based on the Michelson interferometer, and a new thickness measurement method was designed, which is on the basis of Snell's law of refraction and DIC. The main principles and experimental procedures of these two methods were presented. The thickness change of polymethyl specimens under uniaxial tensile loading were measured by the optical techniques and compared with each other. The results reveal that the data obtained with DIC method achieve better linearity than ESPI.     

高斯型弱散射屏产生的像面散斑场的分布特性研究

弱散射屏产生的远场散斑由一个中央亮斑和一个分布于亮斑周围而与正态散斑类似的散斑结构, 根据弱散射屏远场的散斑图样, 人们假设弱散射屏产生的像面散斑为均匀背景与正态散斑两者相干叠加的结果, 但这种假设与实际像面散斑存在歧异, 基于上述情况, 本文利用4f高通滤波光学成像系统, 研究了高斯型弱散射屏产生的像面散斑场的统计特性, 得出只有表面均方根粗糙度与入射光波的波长相差不多时上述假设才是可行的结论. 关键词： 弱散射屏 f光学成像系统')" href="#">4f光学成像系统 像面散斑