Encryption and decryption using a sandwich phase diffuser made by using two speckle patterns and placed in the Fourier plane: Simulation results

In the present paper, we describe the encryption and decryption of two-dimensional images. The encryption is done by employing a sandwich phase diffuser made by using two elongated speckle patterns, and placed in the Fourier plane of a double random phase encoding system. After encryption, the two constituent phase diffusers of such a sandwich diffuser are separated. During decryption, if the conjugate of either of the two elongated phase speckle patterns is used, the image cannot be retrieved. Correct decryption is also not possible if a sandwich diffuser with any of the phase speckle patterns is shifted in position with respect to the other. For decryption, the encrypted image is Fourier transformed and multiplied by the conjugate of the sandwich diffuser, and then the product is further Fourier transformed. It is possible to generate the image only if both the elongated phase speckle patterns are matched point-to-point and then the proper conjugate is made. The use of elongated speckle patterns in constituting a sandwich phase diffuser makes the system less complicated as compared to the use of a sandwich diffuser made with normal speckle patterns, enabling an easy alignment of the random phase diffuser at the time of rejoining the constituent diffusers for making the right key. The ease of alignment is due to the reduction of the requirement of 360° scanning at the time of rejoining these diffusers with little reduction in the security of the system. Simulation results are presented in support of the proposed idea. For optical implementation, the decrypted image may be obtained by generating a phase conjugate wave by the phase conjugation technique, and passing through the same sandwich phase diffuser. To evaluate the reliability of the technique, mean square error (MSE) between the decrypted and original image has been calculated.     

白蛋白酸致变性的动态激光散斑研究

利用动态激光散斑的方法研究了白蛋白的酸致变性过程。首先,利用动态散斑理论模拟生成了动态散斑序列图;然后,利用模拟和实验散斑图的时间序列散斑图及其灰度共生矩阵对白蛋白的酸致变性过程进行了分析;接着,又利用灰度共生矩阵的惯性矩和不同阶段的四幅散斑图的平均对比度图对该过程进行了更深入的研究。理论模拟和实验研究结果表明,在白蛋白酸致变性过程中,胶体溶液中的蛋白质微粒的运动由剧烈逐渐变得缓慢;同时,微粒数量减少而微粒尺寸增加。研究表明,动态激光散斑方法是一种实时、快速、有效的研究白蛋白变性过程的新手段。     

基于液晶体的大错位量散斑相移技术研究

系统地分析了大错位量散斑干涉术测量离面位移的原理,并结合晶体光学理论详细分析液晶体的相移过程．同时从理论上剖析了沃拉斯顿棱镜的错位机理,从而构造出一种新的基于液晶体实现大错位量散斑相移技术的测试系统。采用该检测系统对结构实体混凝土在不同养护时间情况下的力学行为进行测试研究。实验结果揭示：随着养护时间的增加,混凝土结构的力学性能指标也相应增加,但在养护21天后,混凝土结构材料的弹性模量和结构强度都达到某一稳定值(即标准试样在同等养护条件下的实验室测量值)。并且也发现该技术使用方便,检测时受环境的影响小,可以实现现场在线原位实时无损检测,并能够得到非常真实的检测结果,从而可以实现更精确的定量计算。     

The optical near-field speckles and their first order statistics on the basis of the integral equations of electromagnetic field

Speckle fields are the random light wave distributions produced when the light fields are scattered from random surfaces or a random medium. They appear in many optical phenomena that are related to light propagations[1,2] and have found wide appli-cations in a variety of scientific and technical fields. The examples of the recent impor-tant applications of speckles include the analysis of the movement of the granules[3], the three-dimensional imaging for the microstructures of metal nanocryst…     

Theory and experiment of spatially and temporally partially coherent speckle shearing interferometry

The theory and experiment of spatially and temporally partially coherent speckle shearing interferometry is reported in this rapid communication for the first time. The general requirements for the surface roughness and coherence area of a diffuse object surface in spatially and temporally partially coherent speckle shearing interferometry are discussed. An experimental verification is presented and the results of theory and experiment are in good agreement.     

利用TeO2减少多模光纤出射场散斑干扰的研究

 为了减少多模光纤出射光场的散斑干扰,提出了把声光布拉格衍射效应所形成的不同衍射级耦合到多模光纤中,由于衍射级具有不同的偏振态,消弱了光场相干条件,进而在出射光场中消弱了散斑场的对比度,并通过对改变声场频率后得到的散斑场对比度的分析,证实了利用各向异性晶体TeO2能够控制散斑场对比度,改善出射场的高斯分布,得出了可以利用布拉格衍射效应减少散斑场干扰的可能性。     

The separation of out-of-plane displacement from in-plane components by fringe carrier method based on large image-shearing ESPI

A fringe carrier method for separating out-of-plane displacement from in-plane components based on large image-shearing electronic speckle pattern interferometry (ESPI) is presented. If the test object is respectively illuminated by two expanded symmetric illuminations in large image-shearing ESPI, two interferometers are formed. Carrier fringe patterns can be introduced by tilting reference surface a small angle. The carrier fringe patterns are demodulated after deformation of the object. Two phase maps, which include out-of-plane and in-plane displacement, can be obtained by using Fourier transform. Then out-of-plane displacement can be easily separated from in-plane displacement by simple operation between two unwrapped phase distributions. The principle of spatial carrier frequency modulation in large image-shearing ESPI is discussed. A typical three-point-bending experiment is completed. Experimental results are offered. The results show that the method offers high visibility of carrier fringes. And the system presented does not need a special beam as a reference light and has simple optical setup.     

Applications of electronic speckle interferometry (ESI) techniques for spacecraft structural components

Laser-based electronic speckle interferometry (ESI) techniques, viz., electronic speckle pattern interferometry (ESPI) and electronic speckle shearographic interferometry (ESSI) are used for testing of spacecraft structural components. The combined ESPI and ESSI system developed in house was successfully used for the non-destructive evaluation (NDE) of honeycomb sandwich panels and propellant tanks of Indian Space Research Organization (ISRO). Debonds between face sheet and the honeycomb core were identified using (i) thermal and (ii) dual vacuum stressing methods. On-line NDE of the propellant tanks under internal pressure loading for identification of the minute cracks and thickness reduction areas were successfully implemented by ESI.     

ESPI solution for non-contacting MEMS-on-wafer testing

Rapid progress in the field of micro-electro-mechanical systems (MEMS) makes the development of appropriate measuring and testing means timely. Characterizing the mechanical properties of MEMS structures at a very early stage of manufacturing is a challenging task for quality assurance in this field. The paper describes a new solution that is based upon the vibration analysis of the microparts. The nanometer amplitudes are detected by advanced electronic speckle pattern interferometry (ESPI). A specific signal processing technique has been applied to make the solution robust. Comprehensive numerical simulations provide the theoretical base for the HNDT concept. A laboratory system for 4″ wafer has been built, and extensive tests show that such key properties as e.g. the thickness of springs or membranes can be determined exactly. Automated frequency scanning and corresponding digital image processing open the way to reliable and fast industrial systems for MEMS testing on wafer level.     

Automatic Deformation Analysis in Electronic Speckle Pattern Interferometry Using One Speckle Interferogram of Deformed Object

We propose a new fringe analysis method that uses only one speckle interferogram of a deformed object to obtain phase change distribution by deformation. This method uses cos^-1 operations to extract absolute, not signed, values of new phase after deformation. Considering the phase changes in a small local area, true phase changes retain almost the same value by assuming a continuous deformation in the area. This retention determines the sign of the new phase. From the new phase and the initial phase, the phase change distribution by the deformation can be obtained. Experimental results show the usefulness of this method.