Materials with a desired refraction coefficient can be made by embedding small particles

A method is proposed to create materials with a desired refraction coefficient, possibly negative one. The method consists of embedding into a given material small particles. Given n₀(x), the refraction coefficient of the original material in a bounded domain , and a desired refraction coefficient n(x), one calculates the number N(x) of small particles, to be embedded in D around a point xD per unit volume of D, in order that the resulting new material has refraction coefficient n(x).     

Amphoteric refraction exhibited by anisotropic crystals

Amphoteric refraction of light ray at the interface between isotropic materials and anisotropic materials is analyzed. Depending on the incident angle, the refractive light ray can either refract positively or negatively. This amphoteric refraction phenomenon can be quite prevalent when the difference of the two principal refractive indices is large. The reflectance under various incident angles has also been calculated, and an experimental demonstration with a calcite crystal in air is presented.     

Fresnel coefficients for a layer of NIM

Reflection and transmission of traveling and evanescent waves by a layer of material with a negative index of refraction (NIM) is studied by means of the Fresnel coefficients. We derive their values in the “NIM limit”, and we show that this limit is consistent with the exact solution. It is also indicated that simply substituting the negative values of the relative permittivity and permeability of the NIM material into the exact solution leads to incorrect results for evanescent waves.     

SiOxNy thin films with variable refraction index: Microstructural, chemical and mechanical properties

In this work amorphous silicon oxynitride films with similar composition (ca. Si_0.40N_0.45O_0.10) were deposited by reactive magnetron sputtering from a pure Si target under different N₂-Ar mixtures. Rutherford backscattering (RBS) studies revealed that the coatings presented similar composition but different density. The mechanical properties evaluated by nanoindentation show also a dependence on the deposition conditions that does not correlate with a change in composition. An increase in nitrogen content in the gas phase results in a decrease of hardness and Young's modulus.The microstructural study by high resolution scanning electron microscopy (SEM-FEG) on non-metalized samples allowed the detection of a close porosity in the form of nano-voids (3-15 nm in size), particularly in the coatings prepared under pure N₂ gas. It has been shown how the presence of the close porosity allows tuning the refraction index of the films in a wide range of values without modifying significantly the chemical, thermal and mechanical stability of the film.     

Automated interferometric technique for express analysis of the refractive indices in isotropic and anisotropic optical materials

This paper deals with the technique for the refractive index measurements based on the interferometry of a rotated parallel plate (IRPP). The device consists of the Michelson interferometer, the sample rotation system and the optoelectronic registration system. A refractive index of parallel plates is determined by their rotation through measuring simultaneously a shift of interference fringes. Although the IRPP technique is known from long ago [Shumate MS. Appl Opt 1966;5:327] several considerable improvements have been done in order to improve the accuracy of the method. The measuring process is completely automated. The method has been tested on the model crystals of the lithium niobate giving the magnitudes for ordinary and extraordinary refractive indices as n₀=2.2865±0.0007 and n_e=2.2034±0.0007. A considerable increase of accuracy is reached in our case by an automation of the measuring procedure, development of a new software as well as implementing the interferometric method for a precise determination of a sample zero position. The automated refractometer is offered for use in research laboratories and industry.     

Third order nonlinear optical characterization using focal shift measurements

We report on third order optical nonlinear experimental characterization using Z-scan method through focal shift measurements of a converging lens. The sample is fixed in front of a lens and is illuminated by a collimated beam. The shift of the geometrical focus in the nonlinear regime using input Gaussian beams is related to the nonlinear induced dephasing owing to a simple linear relation. Numerical calculations based on the Helmholtz wave equation are performed. Good agreement is obtained between experimental and theoretical results.     

Energy dispersion relation for negative refraction (NR) materials

A general energy dispersion relation is developed for metamaterials having the negative-refraction (NR) property. It is shown that absorption effects are involved with NR phenomena, and the conditions under which NR occurs are discussed. Simple equations for NR are developed by using Lorentzian models.     

超宽带聚合物调制器的优化设计

设计了一种以聚合物作为材料的低损耗、宽带宽的Mach—Zehnder光波导调制器。分析了调制器的脊波导的模式特性,设计了脊波导的结构,并使用BPM软件模拟了脊形波导的光场分布;通过对光场分布的分析,优化了脊形波导的宽度Wg,脊高6,芯层高度H。同时对聚合物调制器的电极进行了优化,包括电极宽度W和电极间距D,使得调制器有较小的导体损耗以及较好的阻抗匹配。并结合了脊波导的结构参数和电极的优化参数,给出了优化结果,它能够使微波的有效折射率与光波的有效折射率达到匹配,从而使带宽达到177GHz,导体损耗为0．2569dB／cm·GHz1／2。     

胶体铁磁流体的光子特性研究

这篇综述回顾了我们今年来在铁磁流体方面的一些研究工作。铁磁流体是一种纳米磁颗粒或亚铁磁颗粒悬浮在基液（如：水或煤油）中形成的悬浮液。铁磁流体之所以受到广泛关注,是因为它们在许多方面都有着潜在应用,例如在机械工程和生物医学等领域。再次综述中,我们首先介绍了铁磁流体的场感应各向异性结构,然后,介绍了几种铁磁流体基软物质材料的光学性质,即：光学负折射、磁控光子待隙和非线性光学响应。我们采用的研究方法主要是分子动力学模拟,有效煤质近似和有限元模拟.     

水下物体视觉形象的分析与模拟研究

水下物体的视觉形象是一个看似简单但极易出错的问题.本文对此问题进行了较为系统的分析和模拟计算,纠正了一些流行的错误看法,指出在不同情况下水下物体的表观位置、表观大小及表观形状均会发生通常直观想象难以预见的复杂变化.该问题的讨论提供了一个培养学习者创新思维和利用基本知识分析及解决实际问题的能力的极好例证.