Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces

Secondary ion mass spectrometry (SIMS) relies on the fact that surface particles ejected from a solid surface are ionized under ion bombardment. By comparing the signal of molecular secondary ions desorbed from an organic film with that of the corresponding sputtered neutral precursor molecules, we investigate the variation of the molecular ionization probability when depth profiling through the film to the substrate interface. As a result, we find notable variations of the ionization probability both at the original surface and in the interface region, leading to a strong distortion of the measured SIMS depth profile. The experiments show that the effect can act in two ways, leading either to an apparent broadening or to an artificial sharpening of the observed film‐substrate transition. As a consequence, we conclude that care must be taken when assessing interface location, width, or depth resolution from a molecular SIMS depth profile.     

间隔靶对射流侵彻影响的数值模拟和实验研究

对某聚能装药射流侵彻靶板的过程进行了数值模拟 ,得出其碰撞点附近应力分布与传统理论相符 ,侵彻深度与实验结果及工程计算结果基本相符 ;分别对该聚能装药侵彻连续靶和间隔靶的过程进行了数值模拟 ,数值模拟结果显示间隔靶的侵彻深度明显低于连续靶的侵彻深度 ,这说明侵彻开坑阶段的能耗侵深比远大于准定常阶段。为了验证间隔靶对射流侵彻的影响 ,用另一聚能装药分别对连续靶和间隔靶进行了侵彻实验 ,并排除了炸高的影响。实验结果也表明 ,间隔靶对射流侵彻的确存在着不利影响。还结合数值模拟及实验结果对传统的侵彻公式进行了修正。     

Formation of artificial micro‐pits on Al alloy with the photon rupture method and the localized corrosion behavior of the formed pits

An in situ artificial micro‐pit fabrication method with an area selective electrochemical measurement technique was applied to investigate the effect of the geometry of artificially formed pits on their localized corrosion behavior in anodized 1000 series aluminum. This technique enables the fabrication of artificial micro‐pits with different aspect ratios (pit depth/pit diameter) in solutions. The aspect ratios of the fabricated artificial micro‐pits in this experiment could be varied from 0.13 to 1.83 by controlling the irradiation time of the focused pulsed YAG laser beam. By applying a constant potential to the final laser‐beam‐irradiated spot in chloride environments, localized dissolution occurred only at the laser beam irradiated area, because the anodic oxide film acted as an insulator. The corrosion current and charge increase with increasing aspect ratio at any applied potential. Copyright © 2010 John Wiley & Sons, Ltd.     

MCNP Dose Calculations in a CT Phantom for Therapeutic External Photon Beam

In this paper, we have addressed the problem of the radiation transport with the Monte Carlo N particle(MCNP) code. This is a general purpose Monte Carlo tool designed to transport neutron, photon and electron in three dimensional geometries. To examine the performance of MCNP5 code in the field of external radiotherapy, we performed the modeling of an Electron Density phantom (EDP) irradiated by photons from 60Co source. The model was used to calculate the Percent Depth Dose (PDD) at different depths in an EDP. One field size for PDD has been examined. A 60Co photons source placed at 80 cm source to surface distance (SSD). The results of calculations were compared to TPS data obtained at National Institute of Oncology of Rabat.     

杆式射流侵彻半无限靶的理论分析

 理论分析高速杆式射流侵彻半无限靶过程时,考虑速度梯度对聚能射流的影响,将射流进行分段计算,得到了射流拉伸后实际碰靶时的微元长度和直径变化。采用伯努利方程和静力学方法,通过对射流形状和速度分布作线性近似,理论分析了高速杆式射流侵彻半无限靶的过程,得到了靶体中的侵彻深度和侵彻孔径与射流长度、速度及直径之间的关系。将模拟结果与实验结果进行对比,结果表明理论分析结果与侵彻实验结果符合较好。     

808 nm大功率半导体激光器阵列的优化设计

 采用激射波长为808 nm的GaAs/AlGaAs梯度折射率波导分别限制单量子阱结构外延片,制备了沟道深度不同的半导体激光器阵列,并对载流子分布进行理论分析和模拟。理论和实验结果表明：引入脊形台面和隔离沟道后,激光器阵列的输出功率、电光转换效率、斜率效率和光谱特性均有显著提高。随着沟道的加深,对电流侧向扩散的限制作用增强,从而提高了阵列性能。     

Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy

In the present work, X-ray photoelectron spectroscopy (XPS) was used to investigate the composition depth profiles of Bi_3.15Nd_0.85Ti₃O₁₂ (BNT) ferroelectric thin film, which was prepared on Pt(1 1 1)/Ti/SiO₂/Si(1 0 0) substrates by chemical solution deposition (CSD). It is shown that there are three distinct regions formed in BNT film, which are surface layer, bulk film and interface layer. The surface of film is found to consist of one outermost Bi-rich region. High resolution spectra of the O 1s peak in the surface can be decomposed into two components of metallic oxide oxygen and surface adsorbed oxygen. The distribution of component elements is nearly uniform within the bulk film. In the bulk film, high resolution XPS spectra of O 1s, Bi 4f, Nd 3d, Ti 2p are in agreement with the element chemical states of the BNT system. The interfacial layer is formed through the interdiffusion between the BNT film and Pt electrode. In addition, the Ar⁺-ion sputtering changes lots of Bi³⁺ ions into Bi⁰ due to weak Bi-O bond and high etching energy.     

可调光瞳滤波器的轴向焦移及扩展焦深

光学超分辨、焦深扩展及焦移3种效应一直受到研究人员的关注,且在光学显微成像、光学校准、光学相干层析成像及光存储中有着重要的应用.提出一种可调谐光瞳滤波器来实现光学系统的轴向焦移及扩展焦深.该光瞳滤波器由两个完全相同且相互平行的λ/4波片和置于其间的λ/2波片组成,其中λ/2波片分为两个可作相对旋转的区域,并且通过推导得...     

Local Ions Distribution Inhomogeneities in Polymer Based Light Emitting Cells

 In the last years the development of light emitting electrochemical cells on a polymer base has made a great progress. They are extremely interesting due to their low cost, but still, problems concerning the stability and lifetime of these elements remain. The performance of light-emitting electrochemical cells (LEC) is strongly influenced by the inhomogeneous distribution of the three main components (light emitting polymer, ion conductive polymer, ionic molecules) in the device. The local ions distribution of lithium and triflate (short for the CF₃SO₃ ⁻ species) ions in a blend with the ionic conducting polymer poly(ethylene oxide) (PEO) and the conjugated polymer m-LPPP (methyl substituted poly(para phenylene)) throughout the polymer layer has been investigated by secondary ion mass spectroscopy (SIMS). Different combinations of top- and base-electrodes have been investigated and have been found to influence the distribution of the ions strongly. Received January 13, 1999. Revision June 16, 2000.     

Grid‐independent depth‐averaged simulations with a collocated unstructured finite volume scheme

In this article, the depth‐averaged transport equations are written in a new way so that it is possible to solve the transport equations for very small water depths. Variables are interpolated into the cell face with two different schemes and, the schemes are compared in terms of computational cost and accuracy. The bed source terms are computed using two different assumptions. The effect of these assumptions on numerical simulations is then investigated. Solutions of transport equations on different types of unstructured triangular grids are compared and, an appropriate choice of grid is suggested. Copyright © 2011 John Wiley & Sons, Ltd.