Geometrically well-defined patterns of surface-immobilized proteins can be produced with several methods. We developed a method for patterning of proteins by means of specific, non-covalent interactions between a protein and a metal complex immobilized at the surface. In particular, reproducible patterns of lactoferrin have been obtained by exploiting the different adsorption properties of this protein on a OH-terminated self-assembled monolayer (SAM) or onto an iron-containing SAM present in certain regions of the pattern. The OH-terminated SAM was etched with a focused ion beam (FIB) in order to produce square regions of bare gold. These regions were selectively covered with a SAM of iron-terpyridine complex, formed via a stepwise procedure involving the initial formation of a mixed component SAM (containing the terpyridine ligand) and the subsequent reaction with an iron(II) salt in order to produce the complex. The patterned substrate was finally allowed to interact with a lactoferrin solution. It is shown that lactoferrin selectively and stably adsorbs on iron-containing layers, whereas it is not retained on the OH-terminated regions of the surface. The use of ToF-SIMS was crucial for obtaining this information, as well as for monitoring each sequential step necessary for the preparation of the patterns. 相似文献
Molecular depth profiling and three-dimensional imaging using cluster projectiles and SIMS have become a prominent tool for organic and biological materials characterization. To further explore the fundamental features of cluster bombardment of organic materials, especially depth resolution and differential sputtering, we have developed a reproducible and robust model system consisting of Langmuir-Blodgett (LB) multilayer films. Molecular depth profiles were acquired, using a 40-keV C60+ probe, with LB films chemically alternating between barium arachidate and barium dimyristoyl phosphatidate. The chemical structures were successfully resolved as a function of depth. The molecular ion signals were better preserved when the experiment was performed under cryogenic conditions than at room temperature. A novel method was used to convert the scale of fluence into depth which facilitated quantitative measurement of the interface width. Furthermore, the LB films were imaged as a function of depth. The reconstruction of the SIMS images correctly represented the original chemical structure of the film. It also provided useful information about interface mixing and edge effects during sputtering. 相似文献
A transient suppression method for piezoelectric ceramic transducer is presented. By adding some special pedestal pulses to the original transmitted signal, the transient effects in the output of the transducer can be just precisely transmission by use of a narrowband transducer. canceled, thereby achieving the broadband The experimental results show that the transient responses of the sinusoid pulses and coded signals are suppressed successfully and the acoustic waveforms radiated into the surrounding water are improved significantly. 相似文献
A compact ultrafast terahertz (CUTE) free-electron laser (FEL) is being developed at the Raja Ramanna Centre for Advanced
Technology (RRCAT), Indore. The undulator required for the CUTE-FEL has recently been developed. We have designed, built and
characterized a variable gap, 5 cm period, 2.5 m long pure permanent magnet undulator in two identical segments. The tolerable
error in the magnetic field was 1% in rms, and we have measured it to be 0.7%. The obtained rms phase shake is around 2°.
To ensure that the trajectories do not have an exit error in position or angle, corrector coils have been designed. Shimming
coils have been applied for both the undulator segments to reduce the amplitude of the betatron oscillations in the vertical
trajectory. Details of novel corrector coils and soft iron shims are given and their performance is discussed.
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In this Letter we research the space charge limiting current value at which the oscillating virtual cathode is formed in the relativistic electron beam as a function of the external magnetic field guiding the beam electrons. It is shown that the space charge limiting (critical) current decreases with growth of the external magnetic field, and that there is an optimal induction value of the magnetic field at which the critical current for the onset of virtual cathode oscillations in the electron beam is minimum. For the strong external magnetic field the space charge limiting current corresponds to the analytical relation derived under the assumption that the motion of the electron beam is one-dimensional [D.J. Sullivan, J.E. Walsh, E. Coutsias, in: V.L. Granatstein, I. Alexeff (Eds.), Virtual Cathode Oscillator (Vircator) Theory, in: High Power Microwave Sources, vol. 13, Artech House Microwave Library, 1987, Chapter 13]. Such behavior is explained by the characteristic features of the dynamics of electron space charge in the longitudinal and radial directions in the drift space at the different external magnetic fields. 相似文献
The aim of this paper is to check the effect of artefacts introduced by focused ion beam (FIB) milling on the strain measurement by convergent beam electron diffraction (CBED). We show that on optimized silicon FIB samples, the strain measurement can be performed with a sensitivity of about 2.5 × 10−4 which is very close to the theoretical one and we conclude that FIB preparation can be suitable for such measurements in microelectronic devices.
To achieve this, we first used CBED and electron energy loss spectroscopy (EELS) which provide a procedure permitting an exact knowledge of the sample geometry, i.e. the thickness of both amorphous and crystalline layers. This procedure was used in order to measure the FIB-amorphized sidewall layer. It was found that if the FIB preparation is optimized one can reduce this amorphous layer down to around 7 nm on each side. Secondly different preparation techniques (cleavage, Tripod™ and FIB) permit to check if the surface damaged layer introduced by FIB influences the strain state of the sample. Finally, it was found that the damaged layer does not introduce measurable strain in pure silicon but reduces appreciably the quality of the CBED patterns. 相似文献