可控空心光束在单轴晶体中的传输特性

基于光束在各向异性单轴介质中的傍轴矢量传输理论,对可控空心光束(CDHB)在单轴晶体中的传输特性作了研究.得出该光束在单轴晶体中传输的横向慢变振幅的表达式,并利用此表达式作数值计算,研究了CDHB在单轴晶体中的传输特性.研究表明,可控空心光束在单轴晶体中传输时,控制参数ξ和光束阶数N的取值对其光强分布有较大的影响.随着...     

基于低双折射光子晶体光纤Sagnac干涉仪的超低温度系数扭曲传感器

研究了低双折射光子晶体光纤中由光纤扭曲造成的圆双折射效应,并应用Sagnac干涉仪结构设计了扭曲传感器.在Sagnac环中的光子晶体光纤上施加机械压力引入初始线双折射并产生正弦干涉光谱,再扭曲光纤产生圆双折射使干涉光谱随扭曲角度移动.光谱峰值波长随扭曲角度变化符合Sinc函数关系,理论分析与实验相符.传感器灵敏度为1....     

Luminescence properties of Y3Al5O12:Ce nanoceramics

Comparative analysis of the luminescent properties of Y₃Al₅O₁₂:Ce (YAG:Ce) transparent optical ceramics (OС) with those of single crystal (SC) and single crystalline film (SCF) analogues has been performed under excitation by pulsed synchrotron radiation in the fundamental absorption range of YAG host. It has been shown that the properties of YAG:Ce OC are closer to the properties of the SCF counterpart, where Y_Al antisite defects are completely absent, rather than to the properties of SC of this garnet with large concentration of Y_Al antisite defects. At the same time, the luminescence spectra of YAG:Ce OC show weak emission bands in the 200-470 nm range related to Y_Al antisite defects and charged oxygen vacancies (F⁺ and F centers). YAG:Ce ОС also possesses significantly larger contribution of slow components in the Ce³⁺ luminescence decay under high-energy excitation in comparison with SC and SCF of this garnet due to the involvement of antisite defects, charged oxygen vacancies as well as boundaries of grains in the energy transfer processes from the host to the Ce³⁺ ions.     

Birefringence dispersion in a quartz crystal retrieved from a channeled spectrum resolved by a fiber-optic spectrometer

We present a simple method for measuring the wavelength dependence of both the phase and group birefringences in a quartz crystal of known thickness. The method utilizes interference of polarized waves resolved by a fiber-optic spectrometer as a channeled spectrum (spectral fringes). The fringe order versus the precise position of the interference maximum in the spectrum is fitted to the approximate function, from which the phase birefringence as a function of wavelength is retrieved. We also determine the group birefringence dispersion. The functions measured in a range from 500 to 900 nm are compared with those resulting from the available dispersion relation, and very good agreement is confirmed.     

Two-dimensional cell parameters measurement of nematic liquid crystal using optical interferometry and Fourier transform fringe analysis technique

We report a method for the measurement of nematic liquid crystal (NLC) cell parameters i.e., switching voltage, birefringence, retardation, dielectric anisotropy, average tilt angle and change in refractive index with applied DC voltage to LC material. The proposed method is based on optical interferometry and Fourier transform fringe analysis technique, in which we obtain 2-dimensional (2D) phase map of the interferograms as a function of applied voltage. Mach-Zehnder interferometer (MZI) was used for the study of cell parameters and interferograms were recorded at different applied DC voltages to NLC cell using CCD camera. From the phase map, 2D-refractive index distribution of the LC cell with applied voltage was reconstructed. Analytical equations are derived based on optical interferometry and then solved to obtain cell parameters. The present method is fast and can give 2D-cell parameters from only two quick interferograms.     

Multilayer dielectric cylindrical mirrors based on omnidirectional reflection from a one-dimensional photonic crystal

A multilayer dielectric cylindrical mirror (MDCM) based on the one-dimensional omnidirectional reflection of a photonic crystal is presented. In this case, the refractive indices of the two materials are 1.6 (polystyrene) and 4.6 (tellurium), and the corresponding optimized thicknesses are 0.75a and 0.25a. A very high reflectance over a wide frequency range is observed. In this case, a is the lattice constant of the photonic crystal. In this band, the MDCM has good reflection and focal properties. Therefore, it is feasible to use the MDCM for integrated waveguide devices. As an example, an etched diffraction grating demultiplexer based on the MDCM is also proposed. Both the operational principle and design of the device are introduced. This provides a method for designing compact integrated waveguide devices.     

Simultaneous measurement of curvature and temperature based on PCF-based interferometer and fiber Bragg grating

A sensor head consisting of a photonic crystal fiber (PCF)-based Mach-Zehnder interferometer (MZI) and a fiber Bragg grating (FBG) is proposed and experimentally demonstrated for simultaneous measurement of curvature and temperature. The MZI fabricated by splicing a short length of PCF between two single-mode fibers with the air-hole structure that completely collapsed near the splicing points, is sensitive to fiber bending and surrounding temperature, while the FBG is only sensitive to the later. Simultaneous measurement of curvature and temperature is therefore obtained. Sensitivities of 4.06 nm/m^− 1 and 6.30 pm/°C are achieved experimentally for curvature and temperature, respectively. And the corresponding resolutions are 5.2 × 10^− 4 m^− 1 and 1.25 °C for curvature and temperature, respectively, based on the wavelength measurement resolution of 10 pm.     

基于光子晶体光纤交叉敏感分离的磁场温度传感研究

提出了一种基于定向耦合效应和表面等离子共振效应的交叉敏感分离的磁场温度传感结构.在光子晶体光纤的一个特定空气孔中填充磁流体,利用磁流体的磁光效应和定向耦合效应形成磁场传感通道;在垂直方向的另一空气孔的内壁镀金纳米薄膜并填充甲苯液体,利用甲苯的温敏效应和表面等离子共振效应形成温度传感通道.对应输出谱出现两个损耗峰,测量损耗峰位置可以间接测出磁场强度和温度变化.通过理论计算()和结构优化,在90—270 Oe1 Oe=10~3/(4π) A/m范围内,磁场强度的灵敏度最高可达1.16 nm/Oe;在25—60?C范围内,温度的灵敏度可达-9.07 nm/?C.虽然填充的两种液体的折射率都受环境温度的影响,但通过建立灵敏度系数矩阵,可以消除磁场强度与温度的交叉敏感,实现磁场温度双参量的高灵敏度检测.     

ZnO晶体的偏振拉曼散射的深入研究

利用拉曼选择定则,设计了ZnO单晶的直角偏振几何配置。在室温下测量了ZnO单晶的各种振动模式的偏振拉曼散射光谱。与原先的文献相比较,初步讨论了各种振动模式的线宽和强度的变化原因。除ZnO晶体中包括非极性和极性拉曼基频振动,准横光学和准纵光学模式和振动属性被指认外,它们的高阶拉曼散射模式首先被确定。本研究结果为深入了解ZnO晶体和薄膜的宏观性质和微观结构提供了依据。     

一维光子晶体缺陷模的偏振特性研究

利用周期结构的布洛赫定理推导了一维无限光子晶体缺陷模方程,研究了缺陷模的偏振特性,以及在不同入射角和缺陷层厚度下缺陷模位置的变化.利用传输矩阵方法对有限周期数光子晶体也进行了研究,分别对应一维无限光子晶体和有限周期数光子晶体给出了数值计算结果.通过比较这两者的数值结果得出了缺陷模随入射角和缺陷层厚度变化的一般规律.