Roughness measurement of metallic surfaces based on the laser speckle contrast method

A method of measuring surface roughness of flat lapped, ground and polished metallic surfaces, by the far-field speckle contrast method is presented in this paper. The laser speckle contrast technique depends on the existence of an approximately linear relationship between the speckle contrast and the roughness of the illuminated surface. Initially it was shown that the linear relationship existed up to 0.1 μm Ra (centre-line average) roughness using Helium–Neon light, after which a saturation effect was observed. The effect of varying the incident angle of illumination was investigated with a view to extending the measurement range. The use of high incident angles of illumination has been found to increase the surface roughness range up to 0.4 μm measurement Ra.     

Speckle correlation fringes denoising using stationary wavelet transform. Application in the wavelet phase evaluation technique

This paper presents a stationary wavelet transform (SWT) method for speckle noise reduction in digital speckle pattern interferometry fringes. The main advantage of SWT is its translation invariance, which makes it important in statistical image processing applications. This method was used to denoise a simulated speckle fringe patterns, a good fidelity value was obtained. Applied to the wavelet phase evaluation, it has provided a phase distribution with a good accuracy.     

Measurement of pure curvature fringe distribution by using a double whole-field filtering technique

A double whole-field filtering technique to measure pure curvature fringe distribution of a deformed object is proposed. In this method, the slope fringes which are contained in the pattern of curvature fringes can be completely eliminated from the curvature fringes. Thus the pattern of pure curvature fringes with a good contrast can be obtained. Theoretical analysis and experimental results are given in this paper.     

Chemical metrology in New Zealand

Recent developments in international trade will have a significant impact on New Zealand’s measurement infrastructure, especially for chemical metrology. This article describes the background to these developments and outlines the activities of the Measurement Standards Laboratory, New Zealand’s National Metrology Institute, in response to these developments.     

A review of X-ray intensity fluctuation spectroscopy

This article reviews the literature on X-ray fluctuation intensity spectroscopy or, as it is often called, X-ray photon correlation spectroscopy. It highlights measurements using different types of diffuse scattering. To cite this article: M. Sutton, C. R. Physique 9 (2008).     

A new method of spatial compounding imaging

A new method of spatial compound imaging is presented that improves image quality without the usual requirement to decrease the frame rate. The new method of imaging utilizes three transducers for data acquisition. The transducer located at the center of the transducer system is a phased array probe that acts as both transmitter and receiver. The other transducers are unfocused pistons that act only as receivers. Envelope data acquired by each transducer are combined to form a final image with improved quality (speckle contrast, target detectability and lateral resolution). It is shown that the improvement in speckle contrast depends on the correlation between individual images acquired by the transducers. The effective aperture approach is used for analytic estimation of the correlation between images in order to optimize the lateral separation between transducers. Using simulations, several compounding strategies have been performed to find the strategy that maximizes image quality. The central frequency of 2.5 MHz is used in simulations. Quantitative analysis of simulated B-mode images shows that the new method of imaging efficiently improves visibility, detectability, and lateral resolution of low contrast regions. The image frame rate is preserved because multiple scans are not required for the spatial compounding.     

一种改进的载波电子散斑干涉处理方法

提出了一种新的载波电子散斑干涉的处理方法,该方法将载波所形成的直条纹和包含物体变形信息的弯曲条纹在频域直接比较, 避免了传统载波干涉方法中的载波频率计算和由此带来的误差. 因此在准确程度和方便性方面都有明显改进. 本文在给出理论分析的同时进行了实验验证.     

单参考束型全息-散斑干涉术

本文提出了一种三维变形分离测量技术——单参考束型全息-散斑干涉术,给出了理论分析及实验结果。