Cluster speckle structures through multiple apertures forming a closed curve

In this work, cluster-like speckle patterns are analyzed. These patterns are generated when a diffuser illuminated by coherent light is imaged by a lens having a pupil mask with multiple apertures forming a closed curve. We show that the cluster structure results from the complex modulation produced inside each speckle which is generated by multiple interferences of light through the apertures. In particular, when the apertures are uniformly distributed along a closed curve, the resulting image speckle cluster replicates the pupil aperture distribution. Experimental results and theoretical simulations show that cluster features depend on the apertures distribution and the size of the closed curves.     

Gaussian pre-filtering for uncertainty minimization in digital image correlation using numerically-designed speckle patterns

This paper discusses the effect of pre-processing image blurring on the uncertainty of two-dimensional digital image correlation (DIC) measurements for the specific case of numerically-designed speckle patterns having particles with well-defined and consistent shape, size and spacing. Such patterns are more suitable for large measurement surfaces on large-scale specimens than traditional spray-painted random patterns without well-defined particles. The methodology consists of numerical simulations where Gaussian digital filters with varying standard deviation are applied to a reference speckle pattern. To simplify the pattern application process for large areas and increase contrast to reduce measurement uncertainty, the speckle shape, mean size and on-center spacing were selected to be representative of numerically-designed patterns that can be applied on large surfaces through different techniques (e.g., spray-painting through stencils). Such “designer patterns” are characterized by well-defined regions of non-zero frequency content and non-zero peaks, and are fundamentally different from typical spray-painted patterns whose frequency content exhibits near-zero peaks. The effect of blurring filters is examined for constant, linear, quadratic and cubic displacement fields. Maximum strains between ±250 and ±20,000 µε are simulated, thus covering a relevant range for structural materials subjected to service and ultimate stresses. The robustness of the simulation procedure is verified experimentally using a physical speckle pattern subjected to constant displacements. The stability of the relation between standard deviation of the Gaussian filter and measurement uncertainty is assessed for linear displacement fields at varying image noise levels, subset size, and frequency content of the speckle pattern. It is shown that bias error as well as measurement uncertainty are minimized through Gaussian pre-filtering. This finding does not apply to typical spray-painted patterns without well-defined particles, for which image blurring is only beneficial in reducing bias errors.     

The Surface Analysis Working Group at the Consultative Committee for Amount of Substance,Metrology in Chemistry and Biology: A successful initiative by Martin Seah

Dr Martin Seah, NPL, was the initiator, founder, and first chairman of the Surface Analysis Working Group (SAWG) at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology (CCQM) at the Bureau International des Poids et Mesures (BIPM), the international organization established by the Metre Convention. This tribute letter summarizes his achievements during his chairmanship and his long-running impact on the successful work of the group after his retirement.     

Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomography

Polystyrene latex (PSL) nanoparticle (NP) sample is one of the most widely used standard materials. It is used for calibration of particle counters and particle size measurement tools. It has been reported that the measured NP sizes by various methods, such as Differential Mobility Analysis, dynamic light scattering (DLS), optical microscopy (OM), scanning electron microscopy (SEM) and atomic force microscopy (AFM), differ from each other. Deformation of PSL NPs on mica substrate has been reported in AFM measurements: the lateral width of PSL NPs is smaller than their vertical height. To provide a reliable calibration standard, the deformation must be measured by a method that can reliably visualize the entire three dimensional (3D) shape of the PSL NPs. Here we present a method for detailed measurement of PSL NP 3D shape by means of electron tomography in a transmission electron microscope. The observed shape of the PSL NPs with 100 nm and 50 nm diameter were not spherical, but squished in direction perpendicular to the support substrate by about 7.4% and 12.1%, respectively. The high difference in surface energy of the PSL NPs and that of substrate together with their low Young modulus appear to explain the squishing of the NPs without presence of water film.     

Development of microscale pattern for digital image correlation up to 1400 °C

Speckle patterns to be used for digital image correlation (DIC) at the micrometer level up to 1400 °C were fabricated by several methods. The quality of the patterns before and after heating was evaluated in terms of the mean intensity gradient (MIG) and the speckle size distribution. The displacement accuracy in simulative translation of images showed that the MIG alone was not enough to evaluate the pattern properties; a large MIG, an even speckle size distribution, and a wide speckle size range pattern were required for a good DIC. The reaction between the patterning material and substrate, the cracking of speckles, and the plastic flow of patterning material may cause changes in the pattern morphology at high temperature. Two patterning methods, spraying a mixture of ceramics powder and binder by a fine-nozzle air brush and abrading a polished surface, yielded a small pattern with high MIG values and even size distributions that was stable at 1400 °C. The potential of the fabricated patterns was shown by measuring the coefficient of thermal expansion of polycrystalline Al₂O₃ from 800 °C to 1400 °C.     

Quantitative characterization of holographic displays based on liquid-crystal-on-silicon spatial light modulator

This report discusses the effect of speckle size on the quality of holographic images based on a liquid-crystal-on-silicon (LCoS) spatial light modulator (SLM). Further, it proposes methods of quantifying the average speckle size and holographic image resolution. These methods enable both characteristics to be compared using the same unit (the number of pixels in the holographic image), providing an intuitive and effective comparative analysis method. In particular, by varying the LCoS resolution ratio, the change in the resolvable minimum pixels of the holographic image is interpreted in conjunction with the average speckle size; moreover, an analysis of the correlation between the latter two is presented. This approach, based on LCoS resolution division, could provide useful insights into single-SLM-based, full-color holographic displays using space division. Furthermore, it could be extended to other components, including more advanced LCoS SLMs, and used to identify the relative effects on image quality with speckles.     

Comment on the paper: H.-E. Hwang, P. Han, Theoretical analysis for surface tilt and translation detection based on speckle photography in the Fresnel domain, Opt. Commun. 282 (2009) 351-354

In a recent paper [H.-E. Hwang, P. Han, Opt. Commun. 282 (2009) 351] a speckle based metrology system is proposed which it is claimed provides significant advantages over existing systems. In this paper, we show that the discussion presented in [H.-E. Hwang, P. Han, Opt. Commun. 282 (2009) 351] is deficient, and that several of the statements made are incorrect and/or misleading.     

Speckle interferometry methods for displacement and strain measurements using photorefractive crystal

Photorefractive crystals offer several attractive features such as high resolution and in situ processing. As the images are erasable, these crystals are suitable for read–write applications and hence find potential use in speckle photography, image processing and holography. The barium titanate (BaTiO₃) crystal as recording medium has been extensively used as a novelty filter for real-time in-plane displacement measurements employing two-beam coupling configuration. This paper presents new optical configurations in speckle shear photography to measure in-plan displacement and the strain in real time using BaTiO₃ crystal as recording medium. Speckle photography studies are made using a simple two-beam coupling configuration. In speckle shear photography, a diffused object illuminated with two parallel narrow laser beams is imaged inside the crystal, and a pump beam is added at this plane. The speckle patterns due to each beam and the pump beam produce index gratings. When the object is deformed, the speckle patterns shift consequently. We now have four speckle fields: two generated from the interaction of pump beam with the index gratings and two pertaining to deformed states directly transmitted through the crystal. Thus, the fields from respective points on the object interfere after passage through the crystal and produce the Young's fringe patterns. Due to strain, the fringes in each pattern are of different width and orientation, resulting in the generation of a Moiré pattern. The strain is obtained from the width and orientation of the fringes in the Moiré pattern. The experiments are conducted on a specimen with a notch, which is subjected to tensile loading. The in-plane displacement is measured separately in another experiment. The above studies are carried out at Nd–Yag laser.     

In situ calibration of a Michelson type, speckle-shearing interferometer: Wobbling mirror effect

In situ calibration of piezoelectric transducers in a phase stepping, Michelson type, speckle-shearing interferometer can be affected by mirror wobbling introduced by the transducers. When this happens, a modulation of the curves employed for calibration can be readily detected in imaging systems with large apertures. A calibration method that takes into account the modulation of these curves is, therefore, essential to insure the required regularity of the phase steps. A computer model of speckle-shearing interferometry is used to deal with piezoelectric non-linearities and mirror wobbling in the interferometer, and to show how the calibration curves are affected when both phenomena are present. Computer simulated and experimental results validate the calibration technique advanced here.