Exact Solution of the Pseudoharmonic Oscillator in the Space of Constant Positive Curvature

We present analytically the exact solution of the radial Schrödinger equation with the pseudoharmonic oscillator potential in constant positive curvature representation. Exact bound state eigenfunctions and eigenvalues obtained using factorization method. Finally, energy eigenvalues obtained here compared with the results of the theoretical methods in the limit of flat space.     

负载型复合半导体V2O5-TiO2/SiO2表面V2O5和TiO2的相互修饰作用

 采用表面改性法制备了负载型复合半导体材料V2O5-TiO2/SiO2,并用X射线衍射、比表面积测定、拉曼光谱、程序升温还原和紫外-可见漫反射光谱等技术对固体材料的结构和光响应性能进行了表征. 结果表明,V2O5和TiO2在负载型复合半导体V2O5-TiO2/SiO2表面有相互修饰的作用. 一方面,V2O5能扩展TiO2的光响应范围,使TiO2的吸光区域由紫外光区拓宽至可见光区,从而提高了复合半导体对光能的利用率; 另一方面,TiO2则有助于提高V2O5在载体表面的分散程度,抑制VOx的聚合,减小V2O5的微晶尺寸,提高固体材料的能隙值和氧化还原能力.     

毛细管电泳-柱端安培检测中分离毛细管与检测电极对接方式比较的研究

针对目前毛细管电泳中普遍采用的水平式和直立式两种柱端安培检测形式,在各种可能的对接角度下,以邻苯二酚、间苯二酚和对苯二酚3种二酚作为分离分析测试对象,对分离毛细管与检测电极的对接方式进行了优化比较,并对每一种对接方式的分析特性进行了测试。结果表明：在以3种典型的方式对接时,分离毛细管与检测电极为倒直立式对接时,获得的检测灵敏度最高,响应电流最大,水平式次之,直立式最小。     

铝对稀土元素基体效应的研究

研究了ICP光源中铝对稀土元素的影响。测定了0-1000mg/L铝(以氯化铝形式)对试液密度、粘度和提升量的影响。研究了铝对等离子体激发温度,Hα线半宽度及对MgⅡ／MgⅠ强度比的影响。结果表明,在所研究的Al浓度范围内,只要正确选择适宜的操作参数,铝的影响并不明显。稀土元素谱线强度的测定显示,在低观测高度处,Al对稀土元素(Eu、La、Nd、Y、Yb)有显著的抑制作用,随着观测高度的增加,Al的抑制效应逐渐消失。由此推断Al对稀土元素的抑制效应为蒸发原子化干扰,这可能是由于ICP光源中稀土元素与氧化铝形成难熔和难挥发的稀土铝酸盐类化合物有关。     

管内耦合换热的辐射热流特征及抽样模式比较

通过数值模拟,研究了圆管层流入口段辐射与对流祸合换热中的辐射热流分布特征,提出并比较了采用蒙特卡罗法计算辐射换热的两种抽样模式。结果表明,在圆管入口段的耦合换热中,同一截面的径向辐射热流密度与轴向辐射热流密度数量级相当,世分布形态差别很大。用蒙特卡罗方法计算辐射换热时,采取等权能束的抽样模式,可消除因抽样能束的能量不同而造成的计算误差、降低计算量、提高计算精度。     

雾室温度对ICP-MS分析性能影响的研究

研究了在电感耦合等离子体质谱分析中雾室温度对仪器分析性能的影响情况。在实验中选取半导体对雾室进行制冷,结果表明随着半导体制冷温度升高,进入等离子体水蒸气和分析元素气溶胶的量增加,但水蒸气引入量的增加幅度明显大于气溶胶,温度每增加1℃,等离子体中水的负载量增加2 3%,而气溶胶则只增加0.35%。同时随着半导体制冷温度的升高,分析元素的灵敏度下降,氧化物干扰增强,但氧化物的计数并未增加。根据元素灵敏度和氧化物干扰随半导体制冷温度变化的差异性,对人工模拟高纯Sm2O3中杂质稀土元素Dy、Ho、Er、Yb的量进行了计算,通过与模拟加入量比较,证明使用这种方法可对高纯稀土中某些受基体元素氧化物离子严重干扰的稀土元素进行快速定量分析,分析结果的偏差小于20%。     

温度为T时量子谐振子系统处在第n态的概率

研讨了温度为T时量子谐振子系统处在第n态的概率,并讨论了结果的物理意义．     

关于一种形象化的计算方法

对量子力学中的一种常见计算进行了形象化的改进处理．     

Laboratory intercomparison study on the analysis of short-chain chlorinated paraffins in an extract of industrial soil

Short-chain chlorinated paraffins (SCCPs) comprise a class of organic pollutants used in many industrial applications and released into the environment. The analytical determination of SCCPs is very challenging. Although there is at present no fully validated measurement procedure that might be applied in routine monitoring, the European Union Water Framework Directive (WFD) has required regular monitoring of this class of compounds at river-basin scale since 2007.To assess the status quo of the analysis of SCCPs in relation to the requirements of the WFD, we organized an interlaboratory comparison on the quantification of SCCPs in an extract of an industrial soil. Six laboratories participated in the exercise using three different techniques [i.e. gas chromatography (GC) coupled to mass spectrometry (MS) in electron-capture negative ionization mode, GC with atomic emission detection, and carbon-skeleton GC-MS]. The results reported were in the range 8.5–3200 mg/L. This confirms that reliable quantification of SCCPs is still very difficult to achieve and that the comparability of SCCP data reported to the European Commission is at least questionable.     

Local effects of atomizing analyte droplets on the plasma parameters of the inductively coupled plasma

Monodisperse droplets from aqueous analyte solutions with selected diameters in the range 35–67 µm are introduced into an inductively coupled plasma with frequencies between 1 to 10 droplets per second. The effect of desolvation and atomization in the ICP is studied end-on by optical emission spectroscopy employing simultaneously up to three calibrated monochromators with fast photomultipliers. The onsets of desolvation and analyte atomization and the extremely fast diffusion of hydrogen in the ICP and its effect on the plasma are studied by simultaneous measurements of hydrogen, analyte and Ar lines. The local cooling by analyte atomization as well as the recovering of the plasma excitation temperature after completed atomization is measured quantitatively in dependence on time applying the Boltzmann plot method to simultaneously recorded line intensities of atomized analyte atoms which act as plasma probes. Furthermore, it is shown that relatively small differences in analyte mass cause significant temperature changes during atomization and, as consequence, strong variations of the emission intensity of analyte lines during atomization if measured by end-on observation.