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31.
德国夏洛滕堡物理技术研究所(The Physikallisch-Technische Reichanstalt,简称PTR)是世界上第一个国家级的物理技术研究所,它开创了科学研究和技术研究相结合,服务于工业和国家经济之先河。文章从PTR建立的历史背景、早期研究工作和所产生的影响等方面作较为全面的讨论。 相似文献
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C. Guillermier 《Applied Surface Science》2006,252(19):6644-6647
The yield of CN from glycine rises from one CN per projectile impact to two when the sample is covered with a nominally 1 nm thick layer of silver. These yields were obtained for bombardment with Au4004+ projectile with 136 keV impact energy. A multitude of CN-based clusters, e.g. AgxOy(CN)z are produced concurrently. As a result, a total of three CN-based secondary ions are generated per projectile impact. The exceptionally high yield for CN is of interest for biological SIMS. 相似文献
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Tony Donnelly 《Applied Surface Science》2006,252(13):4445-4448
Ultra-thin (0.5-5 nm) films of Ag have been prepared by pulsed laser deposition in vacuum using a 26 ns KrF excimer laser at 1 J cm−2. The deposition was controlled using a Langmuir ion probe and a quartz crystal thickness monitor. Transmission electron microscopy showed that the films are not continuous, but are structured on nanometer size scales. Optical absorption spectra showed the expected surface plasmon resonance feature, which shifted to longer wavelength and increased in strength as the equivalent film thickness was increased. It is shown that Maxwell Garnett effective medium theory can be used to calculate the main features of optical absorption spectra. 相似文献
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The Li oxides species formed on Li over-deposited V2O5 thin film surfaces have been studied by using X-ray and UV induced photoelectron spectroscopy (XPS and UPS). The photoelectron spectroscopic data show that the Li over-deposited V2O5 system itself is not stable. Further chemical decomposition reactions are taken place even under UHV conditions and lead to form Li2O and Li2O2 compounds on the surface. The formation of Li2O2 causes to arise an emission line at about 11.3 eV in the valence band spectra. 相似文献
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P.S Erdman M Fajardo K.M Sando W.C Stwalley 《Journal of Quantitative Spectroscopy & Radiative Transfer》2004,88(4):447-481
Experimental results are reported for a unique spectroscopic device called the Plasma Spectroscopy Cell. Optical absorption of lithium metal vapor was observed at high density and temperature. Absorption spectra are analyzed using theoretical calculations of absorption cross sections for lithium-helium interactions, and singlet and triplet state transitions of diatomic lithium in the visible spectral range. This is believed to be the most complex example yet calculated in which absolute bound-bound, bound-free, free-bound, and free-free contributions for all possible optically allowed transitions are all included, in quite respectable agreement with experiment. 相似文献
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同轴双无衍射光的理论与实验 总被引:5,自引:3,他引:2
提出同轴双无衍射光的概念。如果两束汇聚角略有不同的同轴无衍射光同时存在,则它们相互之间叠加干涉后产生一种纵向呈周期变化的光场结构,这是一种新的光束空间分布,这种光束在横向仍是一种同心环光斑,可用于精密对准。而在不同纵向位置,这些同心环的强度分布是不同的,且是周期性变化的。同轴双无衍射光的轴向周期性可用于沿光束传播方向的定位。文中提出了双环缝法、分段圆锥透镜法、正弦相位环光栅法等实现同轴双无衍射光的理论与实验方法,分析了同轴双无衍射光的横向与纵向传播的衍射光斑特性,理论计算与实验测量的结果基本相符合。 相似文献
40.
Pulsed laser deposition with a Nd:YAG laser was used to grow thin films from a pre-synthesized Ti3SiC2 MAX-phase formulated ablation target on oxidized Si(1 0 0) and MgO(1 0 0) substrates. The depositions were carried out in a substrate temperature range from 300 to 900 K, and the pressure in the deposition chamber ranged from vacuum (10−5 Pa) to 0.05 Pa Argon background pressure. The properties of the films have been investigated by Rutherford backscattering spectrometry for film thickness and stoichiometric composition and X-ray diffraction for the crystallinity of the films. The silicon content of the films varied with the energy density of the laser beam. To suppress especially the silicon re-sputtering from the substrate, the energy of the incoming particles must be below a threshold of 20 eV. Therefore, the energy density of the laser beam must not be too high. At constant deposition energy density the film thickness depends strongly on the background pressure. The X-ray diffraction measurements show patterns that are typical of amorphous films, i.e. no Ti3SiC2 related reflections were found. Only a very weak TiC(2 0 0) reflection was seen, indicating the presence of a small amount of crystalline TiC. 相似文献