Study of the first nucleation steps of thin films by XPS inelastic peak shape analysis

The initial steps in the formation of thin films have been investigated by analysis of the peak shape (both inelastic background and elastic contributions) of X‐ray photoelectron spectra. Surface coverage and averaged height of the deposited particles have been estimated for several overlayers (nanometre range) after successive deposition cycles. This study has permitted the assessment of the type of nucleation and growth mechanisms of the films. The experiments have been carried out in situ in the preparation chamber of an XPS spectrometer. To check the performance of the method, several materials (i.e. cerium oxide, vanadium oxide and cadmium sulfide) have been deposited on different substrates using a variety of preparation procedures (i.e. thermal evaporation, ion beam assisted deposition and plasma enhanced chemical vapour deposition). It is shown that the first deposited nuclei of the films are usually formed by three‐dimensional particles whose heights and degree of surface coverage depend on the chemical characteristics of the growing thin film and substrate materials, as well as the deposition procedure. It is concluded that XPS peak shape analysis can be satisfactorily used as a general method to characterize morphologically the first nanometric moieties that nucleate a thin film. Copyright © 2006 John Wiley & Sons, Ltd.     

Surface film formation on a graphite electrode in Li‐ion batteries: AFM and XPS study

The formation of a passivation film (solid electrolyte interphase, SEI) at the surface of the negative electrode of full LiCoO₂/graphite lithium‐ion cells using LiPF₆ (1M ) in carbonate solvents as electrolyte was investigated by means of x‐ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The analyses were carried out at different potentials of the first and the fifth cycles, showing the potential‐dependent character of the surface‐film species formation. These species were mainly identified as Li₂CO₃ up to 3.8 V and LiF up to 4.2 V. This study shows the formation of the SEI during charging and its partial dissolution during discharge. Copyright © 2005 John Wiley & Sons, Ltd.     

Analytical characterization of bioactive fluoropolymer ultra-thin coatings modified by copper nanoparticles

Copper–fluoropolymer (Cu-CFx) nano-composite films are deposited by dual ion-beam sputtering. The extensive analytical characterization of these layers reveals that inorganic nanoparticles composed of Cu(II) species are evenly dispersed in a branched fluoropolymer matrix. In particular, X-ray photoelectron spectroscopy has been employed to study the surface chemical composition of the material and to assess how it changes on increasing the copper loading in the composite. Transmission electron microscopy reveals that the copper nanoclusters have a mean diameter of 2–3 nm and are homogeneously in-plane distributed in the composite films. Electrothermal atomic absorption spectroscopy has been used to study the kinetics of copper release in the solutions employed for the biological tests. The Cu-CFx layers are employed as bioactive coatings capable of inhibiting the growth of target microorganisms such as Saccharomyces cerevisiae, Escherichia coli, Staphylococcus aureus, and Lysteria. The results of the analytical characterization enable a strict correlation to be established among the chemical composition of the material surface, the concentration of copper dissolved in the microorganisms broths, and the bioactivity of the nano-structured layer.     

NiOxHy薄膜的电致变色特性和机理

运用循环伏安和阶跃电位方法研究了Ni（OH）2粉末靶直流溅射沉积的NiOxHy薄膜电致变色特性．结合实时的光透射-时间变化，发现着色后的薄膜在零外电势下有一自发的消色过程，该过程可能对应着Li 的自发注入。着色没有自发过程，获取了着消色状态Ni2p3／2和O1s的XPS谱，表明在着色态镍被氧化，消色态镍被还原，相应地氧的化学环境发生改变．     

聚酰亚胺LB膜热解制备SiC薄膜的XPS研究

用XPS对沉积在硅基片上的聚酰亚胺LB膜以及由它真空热解制备的SiC薄膜进行了研究 ,并对其形成过程进行了跟踪分析 .XPS结果显示聚酰亚胺LB膜结构均匀 ,质量良好 ;真空热解时 ,约在 6 70℃时LB膜中的C与衬底Si反应形成SiC ;Ar离子溅射深度俄歇谱表明所制备的SiC膜中Si和C浓度成梯度分布 ,说明SiC是由Si和C相互扩散反应形成的     

Carbon-Fluorine Bondings of Fluorinated Fullerene and Graphite

Carbon-fluorine bondings of fluorinated fullerenes and fluorine-graphite intercalation compound C_xF were investigated in detail on the basis of XPS data and the potential model using the charge distribution calculated by semiempirical method. It has been confirmed by the present study that two peaks in the C_1s spectra observed for fluorinated fullerenes are assigned to carbon atoms bonded to fluorine atoms and those unbound to fluorine atoms, and the small difference in charges and Madelung potentials of fluorine atoms in different circumstances well explains the single peak in F_1s spectra of fluorinated fullerenes. In the calculated structures of 1,3-C₆₀F₂ and 1,2-C₆₀F_x (x = 2?6) used as the models of C_xF, three kinds of carbon-fluorine bondings were observed corresponding to nearly ionic, semicovalent and covalent C? F bondings. The calculated result supports that the bi-intercalation structure of stage 1 C_xF consists of nearly ionic and semi-covalent fluorines.     

Lead underpotential deposition on Au(110)

The electrochemical underpotential deposition (UPD) of lead on Au(110) was investigated by XPS using a custom‐built ultrahigh vacuum apparatus containing a chamber for electrochemical studies. A two‐step deposition process for lead UPD was confirmed. A large increase in the surface concentration of oxygen was found in solutions containing lead. The presence of lead was detected on the gold surface at all potentials within the range investigated (?500 mV to 1500 mV vs. Ag/AgCl). Degradation of chlorine by x‐rays was observed. The change in surface components with potential was investigated and linked to models of UPD and oxidation. The initial random deposition of lead from solution led to surface disordering. Copyright © 2003 John Wiley & Sons, Ltd.     

Surface analysis of plasma‐treated polydimethylsiloxane by x‐ray photoelectron spectroscopy and surface voltage decay

Surface states of polydimethylsiloxane (PDMS) treated by plasma were investigated by x‐ray photoelectron spectroscopy and surface voltage decay. X‐ray photoelectron spectroscopy confirmed the formation of a silica‐like (SiO_x, x = 3–4) oxidative surface layer. This layer increased in thickness with increasing exposure duration of plasma. Plasma exposure lowers the surface resistivity from 1.78 × 10¹⁴ to 1.09 × 10¹³ Ω □^?1 with increasing plasma treatment time. By measuring the decay time constant of surface voltage, the calculated surface resistivity was compared with the value measured directly by a voltage–current method; good agreement between the two methods was obtained. It was observed that plasma treatment led to a decrease in the thermal activation energy of the surface conduction from 31.0 kJ mol^?1 for an untreated specimen to 21.8 kJ mol^?1 for a plasma‐treated specimen for 1 h. Our results allow the examination of effects of plasma on the electrical properties of PDMS. Copyright © 2003 John Wiley & Sons, Ltd.     

PAMAM体型缩聚物的制备及其性能研究

以分子末端带有多官能度活泼端基的PAMAM等为原料 ,通过缩聚反应制备了一类新型体型缩聚物 .借助X射线光电子能谱仪 (XPS)对制备的体型缩聚物进行分析 ,利用其化学分析电子光谱 (ESCA)中碳元素价态的拟合数据判断体型缩聚反应进行的程度 ,数据表明酯基碳 (—COO)拟合峰已基本消失 ,说明其与氨基缩合反应转化为酰胺基 (—CON) ,且反应进行的比较彻底 .通过体型缩聚物在乙醇、正己烷、甲苯、氯仿、异丙醇、乙酸、甲酸、去离子水中进行溶胀试验 ,发现其在甲酸作为溶剂体系中的溶胀比出现最大值 ,根据溶度参数的意义估测体型缩聚物的溶度参数约为δ2 =2 7 6 (MJ m3) 1 2 (即甲酸的溶度参数 ) .对原料PAMAM以及制备的体型缩聚物进行DSC分析 ,发现制备体型缩聚物的玻璃化转变温度 (Tg)有了较大提高 ,从初始原料PAMAM的负值提高到 4 8℃左右 .