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HUANGRui LINXuan-Ying YUYun-Peng LINKui-Xun WEIJun-Hong YUChu-Ying WANGZhao-Kui 《中国物理快报》2004,21(6):1168-1170
We report the discovery, of fast growth of polycrystalline silicon films under low temperature of 200-300℃ from SiCl4/H2 mixture gases by plasma enhanced chemical vapour deposition technique. The deposition rate strongly depends not only on the rf power and the flow ratio of H2/SiCl4, but also on the substrate temperature, while the crystalline fraction is mainly affected by both the rf power and the flow ratio of H2/SiCl4. The high film-growth rate is due to the enhancement of the gas-phase reaction in SICI4/‘H2 plasma. By gleans of adjusting the matchingrelation between the flow ratio of H2/SiCl4 and rf power, and optimizing the substrate temperasure, we obtain the potycrystalline silicon films deposited at a higher deposition rate over 3.5A/s, with a crystalline fraction of 75% and an average crystallite size of 400-500nm in diameter. 相似文献
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针对四氯化硅催化氢化过程采用第一性原理机理对其进行模拟研究,结果表明:没有催化剂时,SiCl4与H2反应能垒为464.45 kJ/mol,反应能量为74.94 kJ/mol,与热力学计算结果 71.85 kJ/mol一致.负载在HZSM-5分子筛上的氯化钡可催化四氯化硅氢化反应,其最具催化活性表面为(111)面;H2在BaCl2(111)面上表现排斥性;SiCl4表现为吸附性,可在BaCl2(111)表面稳定吸附并生成.SiCl3自由基,过程吸附能为448.33 kJ/mol;在催化剂BaCl2存在条件下,SiCl4与H2反应为自由基反应,反应步骤能垒为400.23 kJ/mol;氢化过程能垒降为184.97kJ/mol;催化氢化反应过程所需能量为64.20 kJ/mol.催化氢化过程反应条件相对无催化剂过程更为温和. 相似文献