Ellipsometric analysis of corrosion behavior of 3C magnesium alloy surface touched by simulated sweat

As an optimum shell material, AZ80 magnesium alloys are widely applied in the 3C (computers, communications and consumer electronics) industries. The case of 3C products corroded by a sweaty hand has been simulated and the corrosion characters have been investigated by ellipsometric technology. Thickness variation of corrosive medium film on a Mg alloy surface was monitored. Surface structure of a corrosion layer was described with a three‐layer optical model (substrate—EMA—Cauchy) and thickness of each layer for different soaking time was obtained by fitting experimental data with the model. The corrosion product films with a refractive index of 1.45–1.62, loose corrosion product layer, can only provide limited protection to the substrate when a Mg alloy surface is corroded by sweat again. Copyright © 2010 John Wiley & Sons, Ltd.     

Optical characterization of InxGa1−xN alloys

InGaN layers were grown by molecular beam epitaxy (MBE) either directly on (0 0 0 1) sapphire substrates or on GaN-template layers deposited by metal-organic vapor-phase epitaxy (MOVPE). We combined spectroscopic ellipsometry (SE), Raman spectroscopy (RS), photoluminescence (PL) and atomic force microscopy (AFM) measurements to investigate optical properties, microstructure, vibrational and mechanical properties of the InGaN/GaN/sapphire layers.The analysis of SE data was done using a parametric dielectric function model, established by in situ and ex situ measurements. A dielectric function database, optical band gap, the microstructure and the alloy composition of the layers were derived. The variation of the InGaN band gap with the In content (x) in the 0 < x ≤ 0.14 range was found to follow the linear law E_g = 3.44-4.5x.The purity and the stability of the GaN and InGaN crystalline phase were investigated by RS.     

各向异性表面的椭偏测量的消光过程

本文描述了在正向入射条件下,当待测的各向异性反射面(如全息光栅)的两个笛卡儿本征矢方向与系统的指向有微小偏离时,椭偏测量的消光过程由理想的两步过程转变成多步过程。文中同时定量指出该偏离所造成的影响及应用。     

Molecular orientation of aromatic polycarbonates containing fluorene side chains by polarized infrared spectroscopy and birefringence analysis

The molecular orientation of an aromatic polycarbonate containing fluorene side chains was investigated by polarized infrared spectroscopy and birefringence analyses. The copolymers were synthesized from 2,2‐bis(4‐hydroxyphenyl)propane (BPA), 9,9‐bis(4‐hydroxy‐3‐methylpheny)fluorene (BMPF), and phosgene by interfacial polycondensation. The 1449‐cm^?1 band of the uniaxially oriented films, stretched at the glass‐transition temperature (T_g) plus 5 °C, was assigned to various combinations of CC stretching and CH in‐plane bending vibrations in the fluorene ring, and the transition moment angle was estimated to be 90°. The intrinsic birefringence of aromatic polycarbonate films with BMPF molar ratios ranging from 0.5 to 1 was obtained with the 1449‐cm^?1 band. The copolymer was estimated to show zero intrinsic birefringence at the BMPF molar ratio of 0.75, and the BMPF homopolymer showed negative intrinsic birefringence. A linear relationship between the volume fraction of BMPF units and the intrinsic birefringence indicated that the two monomer units of BPA and BMPF in each copolymer were not independent, and an intrinsic birefringence could be defined even in the copolymer. The sign of the photoelastic coefficient in the homopolymer with BMPF units was positive. The different signs of the photoelastic coefficient and the intrinsic birefringence suggest that the fluorene side‐chain orientation induced by stress in the glass state is quite different from the orientation of the uniaxially oriented films stretched at T_g + 5 °C. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 1554–1562, 2003     

Quantitative characterization of the optical properties of absorbing polymer films: Comparative investigation of the internal reflection intensity analysis method

Nondestructive, three‐dimensional refractive‐index measurements are used for the determination of both the crystallinity and orientation in thin polymer films. The prism wave‐guide coupler is particularly suited for three‐dimensional isotropic and anisotropic thin‐film studies because of the quantitative character of the information obtained and the ease of data acquisition. It has been limited, however, to determining only the refractive index of transparent or weakly absorbing thin‐film samples. On the basis of thin‐film optics, this study develops a new internal reflection intensity analysis (IRIA) method, which uses the intensity information rather than the conventional mode angle values to acquire both the refractive index and the extinction coefficient over a range of transparent to highly absorbing polymer films. Therefore, the IRIA method overcomes the limitations of this prism wave‐guide coupler technique, which can only measure the refractive index of a weakly absorbing sample. With a Metricon PC‐2010 as the skeletal framework, a prototype instrument has been developed to apply and test the IRIA method. A study comparing both the refractive index and extinction coefficient obtained with ellipsometry, ultraviolet–visible/near‐infrared reflectometry, and IRIA for solvent blue 59 dyed polystyrene films confirms that the IRIA method is effective for obtaining the three‐dimensional refractive indices and extinction coefficients of polymer films. In addition, the refractive index and extinction coefficient spectrum (400–800 nm) of solvent blue 59 have been determined with the effective media theory. Furthermore, the three‐dimensional complex refractive indices of highly absorbing black electrical tape, inaccessible to other optical measurement because of its surface character, has been determined by the IRIA method. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 842–855, 2003     

Reevaluating the conventional approach for analyzing spectroscopic ellipsometry psi/delta versus time data. Additional statistical rigor may often be appropriate

A standard approach for confirming the stability of thin films consists of probing them over an extended period of time by spectroscopic ellipsometry (SE) and plotting the resulting psi (Ψ) and delta (Δ) values versus time at a few selected wavelengths across the spectral range. In general, if Ψ and Δ remain constant with time, or essentially constant, the material is deemed to be stable. Here, we suggest that in addition to this ‘eyeball’ approach, a statistical analysis of the data may often be appropriate. In particular, we reevaluate a set of Ψ/Δ versus time data from a sputtered bismuth–tellurium–selenium film that appear to remain essentially constant by the traditional approach, subjecting it to a distance analysis, a principal components analysis, and a cluster analysis. The application of these statistical tools, especially to range‐selected data (300–989 nm), reveals previously unobserved changes, suggesting that either the film in question or the analytical approach itself had changed during the course of the measurements. Weighted distance formulas for Ψ and Δ were also applied so that the data did not need to be range selected for the key effects to be observed. The distance approach was similarly applied (i) to a set of SE data from a thin carbon film, which revealed consistent changes in the material that were not apparent in the standard approach, and (ii) to samples that were deliberately contaminated or improperly measured. Thus, we recommend a more rigorous, statistical approach to the analysis of SE Ψ/Δ versus time data. Copyright © 2016 John Wiley & Sons, Ltd.     

Spectroscopic ellipsometry of SU‐8 photoresist from 190 to 1680 nm (0.740–6.50 eV)

SU‐8 is an important, epoxy‐based, negative photoresist that can create high aspect ratio features. Spectroscopic ellipsometry (SE) is a nondestructive analytical technique that can be performed in the open air. In this study, reflection and transmission SE measurement data were combined to model the optical function of SU‐8 photoresist. The data were fit using three different models: (i) a B‐spline model, (ii) a four‐Gaussian oscillator model with an ultraviolet (UV) and an infrared (IR) pole, and (iii) a Cody–Lorentz model with three additional Gaussian oscillators. All three models successfully fit the data, where the B‐spline model showed the lowest mean squared error. In situ SE data were also collected and fitted to follow possible changes in the optical properties of the SU‐8 during its development. Time‐dependent density functional theory (TD‐DFT) modeling of a complete SU‐8 monomer is qualitatively and quantitatively consistent with the measured optical function.     

Quantum confinement and interface structure of Si nanocrystals of sizes 3–5 nm embedded in a-SiO2

Spectroscopic ellipsometry and Monte Carlo simulations are employed to answer the fundamental question whether the energy gaps of Si nanocrystals with sizes in the range of 3–5 nm, which are embedded in amorphous silica, follow or deviate from the quantum confinement model, and to examine their interfacial structure. It is shown that the optical properties of these nanocrystals are well described by the Forouhi–Bloomer interband model. Analysis of the optical measurements over a photon-energy range of 1.5–5 eV shows that the gap of embedded nanocrystals with a mean size of 3.9 nm follows closely quantum confinement theory. A large band gap expansion (0.65 eV) compared to bulk Si is observed. The Monte Carlo simulations reveal a non-abrupt interface and a large fraction of interface oxygen bonds. This, in conjunction with the experimental observations, indicates that oxygen states and the chemical disorder at the interface have a negligible influence on the optical properties of the material in this size regime.     

聚对苯二甲酸乙二酯光学特性的椭圆偏振光谱研究

概要介绍椭圆偏振光谱 (SE)的原理与特点 ,并用椭偏光谱测定了一组结晶度不同的无取向PET薄膜的光学常数谱 ,研究半结晶性高聚物PET不同结晶形态对其光学性能的影响 ,发现随结晶度的增加 ,其光学常数显著增大 ,并趋于晶态的光学常数 .光学性质的改变可能与微晶的尺寸有关     

Probing interfacial interactions of nafion ionomer: Thermal expansion of nafion thin films on substrates of different hydrophilicity/hydrophobicity

Interfacial interactions of Nafion ionomer with superhydrophilic (Pt, Au), hydrophilic (SiO₂), and hydrophobic (graphene, octyltrichlorosilane [OTS]‐modified SiO₂) is investigated, using in situ thermal ellipsometry, by quantification of substrate‐ and thickness‐dependent thermal properties of the ultrathin Nafion films of nominal thickness ranging 25–135 nm. For sub‐50 nm thin Nafion films, the thermal expansion coefficient of films decreased in the order of most hydrophobic to most hydrophilic substrate: OTS > graphene > SiO₂ > Au > Pt, implying weaker interpolymer and polymer–substrate interactions for films on hydrophobic substrates. Expansion coefficient of films on SiO₂, graphene, and OTS‐modified SiO₂ decreased with thickness whereas that of films on Au and Pt substrates increased with thickness. Above ~100 nm of thickness, films on all substrates converged toward a common value representative of bulk Nafion. Thermal transition temperature was found to be higher for films on hydrophilic SiO₂ than that for films on hydrophobic graphene and OTS‐modified SiO₂ but was not discernible for films on Au and Pt substrates. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2019 , 57, 343–352