Surface morphologies of anthracene single crystals grown from vapor phase

The morphologies and lattice structures of anthracene single crystals grown from the vapor phase were investigated using optical microscopy, phase contrast microscopy, atomic force microscopy (AFM), and X-ray diffraction analysis. Common morphologies with hexagonal large planes were observed irrespective of crystal size. The observation of certain surface morphologies with a phase contrast microscopy revealed that the spiral steps originated from screw dislocations present on the (0 0 1) planes. Moreover, the center and edge of the (0 0 1) planes had large curvatures, similar to hills. Resultantly, quarter-monolayer (ML) steps were observed on the large and flat planes between both hills.     

喷气式Z箍缩等离子体辐射软X射线能谱的研究

研制了一台五通道ROSS-FILTER-PIN软X射线能谱仪，能谱范围为0.28—1.56keV.它由5个连续能段组成，每个能段的起止边由罗斯滤片对(ROSS-FILTERS)的L或K吸收边确定.罗斯滤片对的厚度通过优化计算得到，为了使每个通道的灵敏区外响应(即所测能段外响应)与通道总响应之比最小，在滤片对的第二滤片上镀上了一定厚度的第一滤片材料；为了缩减滤片表面积以增强低能滤片的抗冲击能力及方便滤片加工，能谱仪采用了小探测面积的PIN探测器(1mm²).借助此能谱仪，测量得到了喷气式Z箍缩(Z-pinch)等离子体辐射软X射线能谱的分布，并研究了软X射线产额随箍缩状况的变化趋势. 关键词： Z箍缩等离子体 罗斯滤片 软X射线能谱     

Spectroscopic and X-ray diffraction study of high Tc epitaxial YBCO thin films obtained by pulsed laser deposition

We report spectroscopic characterization of epitaxial YBCO thin films grown on LaAlO₃ by pulsed laser deposition. Raman spectroscopy and spectroscopic ellipsometry were used for film characterization and the results were correlated with X-ray diffraction measurements. The mentioned techniques allowed us to analyze crystallographic, micro-structural, and morphological properties of YBCO thin films. We also demonstrated that relatively low resolution Raman spectroscopy and spectroscopic ellipsometry are reliable techniques for a rapid and non-destructive characterization of epitaxial YBCO thin films.     

Effects of Moisture and Stresses on the Structure and Properties of Polyester Resin

The results of a complex study of structural changes in a cured Norpol 440 polyester resin under the action of damp environment and mechanical loading are presented. A considerable effect of absorbed moisture on the structure and some characteristics of the material is revealed by using thermophysical methods and X-ray diffractometry. The joint effect of moisture and mechanical stress is estimated by investigating the creep in stationary and nonstationary moisture conditions. The anisotropy of the material structure formed during creep is evaluated from the results of dilatometric measurements. It is found that the degree of anisotropy of the material after creep accompanied by moisture sorption is higher than that after creep in the conditions of moisture equilibrium with atmosphere. It is established that the aftercure and relaxation of the residual creep deformation come to an end at heating to 80-85°C. At a further rise in temperature and repeated heating, changes in the material structure are not observed.     

Multilayer optics for XUV spectral region: technology fabrication and applications

We present research investigations in the field of multilayer optics in X-ray and extreme ultra-violet ranges (XUV), aimed at the development of optical elements for applications in experiments in physics and in scientific instrumentation. We discuss normal incidence multilayer optics in the spectral region of “water window”, multilayer optics for collimation and focusing of hard X-ray, multilayer dispersing elements for X-ray spectroscopy of high-temperature plasma, multilayer dispersing elements for analysis of low Z-elements. Our research pays special attention to optimization of multilayer optics for projection EUV-lithography (ψ-13nm) and short period multilayer optics.     

Influence of annealing and chain defects on the melting behaviour of poly(vinylidene fluoride)

The melting behaviour of poly(vinylidene fluoride) (PVDF) was investigated by differential scanning calorimetry (DSC) and small- and wide-angle X-ray scattering in order to study the influence of the chain defects content and of the temperature of annealing on the crystallization and melting behaviour.All the DSC scans show a double endotherm and the analysis of the data suggests that the low temperature endotherm is due to the melting of a population of thin lamellae, whose thickness increases during the annealing, but a high content of chain defects prevents the lamellar thickening and the main effect in this case is the crystallization of thin lamellae from a portion of polymer which did not crystallize during the quenching from the melt. Furthermore, the two melting endotherms, which are observed, can be partially ascribed to a melting-recrystallization process.Furthermore, stepwise isothermal cooling was performed in a differential scanning calorimeter followed by melting scans of fractionated PVDF samples to point out the possible presence of a series of endothermic peaks.     

Charge density study under high pressure

The experimental and analytical method of the high-pressure powder experiment at BL10XU, SPring-8, is described. There is no doubt that BL10XU must be one of the most appropriate beam lines for high pressure X-ray diffraction experiment taking advantage of third generation synchrotron source. As an example of the advanced charge density study under high pressure, the structural change of Cs₂Au₂Br₆ by applying pressure is studied by Rietveld/MEM analysis. It reveals that the structural change of Cs₂Au₂Br₆ by applying pressure occurs basically at electron level, such as valence state change and chemical bonding, which may be called the electronic phase transition.     

大焦深成像系统仿真实验研究

如何增大非相干光学成像系统的焦深是应用光学研究领域的热点问题.本文对采用高次非球面光学掩模板与图像处理相结合增大成像光学系统焦深的新方法进行了深入分析,建立了大焦深成像系统仿真实验模型,并进行了大焦深成像系统仿真实验.实验结果证明了该方法在维持原相对孔径的同时使光学系统在较大的离焦范围内有好的成像质量.实际应用中还要综合考虑模板参量、信噪比等关键因素.     

双预脉冲驱动X射线激光实验研究

 在“星光-Ⅱ”激光装置上进行了双预脉冲驱动类氖铬X射线激光实验，介绍了实验方法和实验结果，并对结果进行了简短讨论。由于目前“星光”装置输出能量较低，所进行的双预脉冲驱动未能显著提高X射线激光强度，改变预脉冲幅度时X射线激光强度也未有显著变化。利用MED103程序进行了模拟计算，其结果与实验结果一致。     

射束有效宽度与成像系统MTF关系的研究

射线成像系统的射线有效宽度是评定系统成像分辨率的重要成像指标。以试验的方法,通过测试系统成像的MTF,通过对成像分辨率与射线有效宽度的关系进行研究,为射线数字成像(DR)及工业CT系统设计提供了参考。