碲化铅/硫化锌红外多层滤光片的光谱漂移研究

采用碲化铅和硫化锌作为镀膜材料,研制了空间红外光学系统使用的红外多层带通滤光片。本文首次利用导纳轨迹图解技术,当在空间低温条件下使用时,对由碲化铅的折射率变化引起的光谱漂移机理进行了研究。根据多层膜各膜层间存在的光学厚度的补偿效应,建立了光谱漂移模型。并对设计的滤光片采用对分法计算了它在低温条件下波长的漂移量,计算结果与研制出的滤光片实测结果吻合很好。并成功地将研究结果应用于滤光片的设计,对原设计结果进行了准确的修正,使得最终研制的滤光片在低温下完全满足使用要求。     

纳米银粒子表面包覆分子共振吸收峰的红移现象

本文首次发现了两种电性不同的染料分子若丹明6G及荧光素钠包覆纳米银粒子时,染料分子共振吸收峰的红移现象,以及产生红移的条件。前者只有在KC1、KBr、KI等电解质存在时才产生红移;而后者则无需这些电解质存在。其红移量分别为27um及13nm.并对产生红移的机理进行了讨论。     

条纹图象的数字化自动分析处理技术之二:相位分析法

相位分析法是目前光学条纹图象数字化自动分析处理中的最重要方法之一。本文较全面地介绍了相位分析技术,并对相位分析的关键技术--相位的滤波和解包络方法做了重点说明。文中给出了相位解包络的实例并讨论了图象数字化自动分析处理技术的实际应用状况。     

光电直读光谱仪同时测定金属铝中15个元素

本文研究了用光电直读光谱法同时测定金属铝中１５个元素的方法,对光源及测定条件进行了最佳选择,具有测定时间短,灵敏度、准确度高等优点。含量在０．１－１％之间,ＲＳＤ〈３％含量在０．００１－０．１％之间,ＲＳＤ〈６％;含量〈０．００１％,ＲＳＤ〈１４％,经与化学法比对,结果十分吻合。     

水煤气变换反应初始微观反应动力学的模拟研究

用蒙特水罗方法对水气转移反应两种典型机理的寝反应动力学进行了研究。结果表明,Ｔｅｍｋｉｎ等人的氧化－还原机理中,无论反应物ＣＯ和Ｈ２Ｏ的相对浓度怎样变化,ＣＯ２和Ｈ２的初始生成速率总是相差很大。     

On the Trace Formula of Perturbation Theory. II

In a previous paper for a class of pairs of operators in a Hilbert space with nuclear difference or under a more general nuclearity condition there was introduced a spectral shift functional. Here we consider the local integrability of this spectral shift functional, i.e., the problem when this functional can locally be represented by an integrable function. The general results are then applied to pairs of definitizable and locally definitizable unitary operators in a Krein space.     

铁铬系高（中）温变换催化剂研究现状

本文介绍和评述了国内外铁铬系高（中）温变换催化剂的现状和研究动态,其中包括铁铬系高温变换催化剂的应用和研究意义、变换反应的机理以及各种助剂的影响,并指出了该研究的发展趋势。     

Fe—Cu—K催化剂上费托合成反应的研究

通过一系列实验,研究了固定床中工业ＦｅＣｕＫ催化剂上费托合成反应的规律。结果表明,反应温度、压力、原料气Ｈ２／ＣＯ等操作条件影响费托反应转化率、产物分布和产物的收率。随着操作温度（５０３～５４３Ｋ）的升高,ＸＣＯ＋Ｈ２、Ｃ１＋、Ｃ５＋均有明显的增加,碳氢化合物向轻组分方向偏移,产物中烯／烷比呈有规律的变化;随着压力的升高（１．０～３．０ＭＰａ）,ＸＣＯ＋Ｈ２、Ｃ１＋、Ｃ２＋、Ｃ５增大,轻油（Ｃ２～Ｃ４）的组分含量也有增加趋势,但压力对烯烃、烷烃的选择性影响不同,压力增大产物中烯／烷比下降,有利于烷烃的生成;原料气Ｈ２／ＣＯ比亦较大程度地改变了ＦｅＣｕＫ催化剂上的产物分布和收率,原料气Ｈ２／ＣＯ比（１．０２～２．８３）升高可增大ＸＣＯ,产物中低碳烃含量上升,但Ｃ１＋和Ｃ５＋收率减少。本文还对铁基费托合成催化剂上伴随的水煤气变换反应的变化规律进行了探讨。     

Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

We have investigated the force interactions between the Si tip and the Si(100)2×1 reconstructed surface in the noncontact atomic-force microscopy (AFM) measurement. We observed two types of frequency shift curves without and with discontinuity, similar to the Si(111)7×7 surface. The image contrast changes drastically whether the frequency shift curve shows discontinuity or not. In the case of the frequency shift curves without discontinuity, the noncontact AFM images almost reflect the surface topography including dimers and adsorbates. In the case of the frequency shift curves with discontinuity, they reflect strongly the chemical reactivity of surface. Furthermore, in the case of the frequency shift curves without discontinuity, for the first time, the stabilize-buckling of dimers induced by a defect can be observed. This suggests that the force interactions during the noncontact AFM measurement hardly influence the surface dynamics.     

Calculation of the frequency shift in dynamic force microscopy

A theoretical study of the quality and the range of validity of different numerical and analytical methods to calculate the frequency shift in dynamic force microscopy is presented. By comparison with exact results obtained by the numerical solution of the equation of motion, it is demonstrated that the commonly used interpretation of the frequency shift as a measure for the force gradient of the tip–sample interaction force is only valid for very small oscillation amplitudes and leads to misinterpretations in most practical cases. Perturbation theory, however, allows the derivation of useful analytic approximations.