An Example of a Fiber in Fibrations Whose Serre Spectral Sequences Collapse

We give an example of a space X with the property that every orientable fibration with the fiber X is rationally totally non-cohomologous to zero, while there exists a nontrivial derivation of the rational cohomology of X of negative degree.     

导子交换子幂值的零化子条件

Let R be a prime ring with center Z(R), I a nonzero ideal of R, d a nonzero derivation of R and 0≠a∈ R. In the present paper, our object is to study the situation a[d(xk), xk]n∈ Z(R) for all x ∈ I under certain conditions, where n(≥ 1), k(≥ 1) are fixed integers.     

The Even Part of Finite-Dimensional Modular Lie Superalgebra Г

Let F be the underlying base field of characteristic p ＞ 3 and denote by Γō the even part of the finite-dimensional Lie superalgebra Γ.We give the generator sets of the Lie algebra Γō.Using certain properties of the canonical tori of Γō,we describe explicitly the derivation algebra of Γō.     

环上的广义导子与Von Neumann代数上的P-核值保持映射

设Ａ是Ｂ（Ｈ）的子代数，ψ是Ａ到Ａ的线性映射，且对Ａ中的每个正交投影算子ｐ，有ψ（ｐ）（ｋｅｒｐ）ｒａｎｐ，则称ψ是Ａ到Ａ的Ｐ－核值保持映射，本文主要得到如下结果：每个２－非绕的半素环上的广义Ｊｏｒｄａｎ导子都是广义导子；每个ＶｏｎＮｅｕｍａｎｎ代数上的范数拓扑连续的Ｐ－核值保持映射是广义内导子．     

Banach代数上的高阶Jordan-triple导子系的广义Hyers-Ulam-Rassias稳定性

针对Banach代数上的高阶Jordan—triple导子系,基于与函数方程有关的广义的Hyers—Ulam-Rassias稳定性的原理．采用线性算子论的方法,结合广义的Jensen等式,证明了Banach代数上与高阶导子系有关的函数方程具有广义的Hyers—Ulam-Rassias稳定性．证明结果表明该方法实用性强,...     

The reliability of measurements on electron energy distribution function in silane rf glow discharges

Electron energy distribution function (EEDF) is a key parameter of plasmas, which is directly proportional to the second derivative of the probe I-V characteristics. Because of an amplifying effect of unavoidable noises in the experimental probe I-V curves during the derivation process, the experimental I-V curves should be smoothed before performing the numerical derivation. This paper investigates the effect of adjustable factors used in the smoothing process on the deduced second derivative of the I-V curves, and an optimum group of the adjustable factors is selected to make the rms deviation of the smoothed I-V curves from the measured curves less than 1%. A simple differentiation circuit is designed and used to measure the EEDF parameter straightforwardly. It is the first time, so far as we know, to measure the EEDF parameters simultaneously by means of both numerical and circuit derivative methods under the same discharge conditions and on the same discharge equipment. The deviation between two groups of mean electron energy E and electron density n_e obtained by the above different methods is within about 7%. This apparently improves the reliability of the measurements of the EEDF parameters.