Real-time visualisation of deformation fields using speckle interferometry and temporal phase unwrapping

A real-time system for analysing data from speckle interferometers, and speckle shearing interferometers, has been developed. Interferograms are continuously recorded by a digital camera at a rate of 60 frames s⁻¹ with temporal phase shifting carried out at the same rate. The images are analysed using a pipeline image processor. With a standard 4-frame phase-shifting algorithm (phase steps of π/2), wrapped phase maps are calculated and displayed at 15 frames s⁻¹. These are unwrapped using a temporal phase unwrapping algorithm to provide a real-time colour-coded display of the relevant displacement component. Each camera pixel (or cluster of pixels) behaves in effect as an independent displacement sensor. The reference speckle interferogram is updated automatically at regular user-defined intervals, allowing arbitrarily large deformations to be measured and errors due to speckle decorrelation to be minimised. The system has been applied to the problem of detecting sub-surface delamination cracks in carbon fibre composite panels.     

像管亮度增益与背景测试仪

论述像管亮度增益与背景测试仪的原理，介绍仪器的组成以及测试数据的处理方法。     

电视跟踪系统分辨率数字化测试研究

介绍一种应用计算机技术和数字图像处理技术数字化测试分辨率的方法和系统．此测试方法和系统有别于通常的目测方法和装置，避免了目测方法的主观随意性。经证明，适合评测电视跟踪系统的成像性能．     

CT重构中射线硬化的校正研究

在工业CT(ComputedTomography)重构中,由于射束硬化使得重建图像中出现"杯状"伪影。为了消除这种影响,提出了一种校正方法。该方法基于Beer理论,根据多色射束和数据,首先拟合出等效单色射束和数据,然后进行卷积反投影重构。这种方法不仅较好地消除了射线硬化的影响,同时也使重构图像的信息损失不大。     

光学元件波前梯度的数值计算方法

 惯性约束聚变系统中光学元件的波前梯度均方根是一个关键参数,对其数值计算涉及到的空域处理、频域滤波及梯度算法等关键技术进行了理论分析。分别采用最简单差分算法、中心差分算法、最小二乘拟合算法、“五点法”对实测波前数据进行了梯度均方根值计算。结果表明波前数据的空域处理采用Quad-flip技术较为合适;频域滤波器的选用上应着重考虑滤波的有效性。对于原始波前,4种算法计算梯度均方根值的差别小于0.01 λ/cm(λ=632.8 nm);而对于截止频率为0.0303 线/mm的低通滤波后波前,其差别小于0.001 λ/cm,该差别对计算结果的影响可以忽略。     

ESPI solution for non-contacting MEMS-on-wafer testing

Rapid progress in the field of micro-electro-mechanical systems (MEMS) makes the development of appropriate measuring and testing means timely. Characterizing the mechanical properties of MEMS structures at a very early stage of manufacturing is a challenging task for quality assurance in this field. The paper describes a new solution that is based upon the vibration analysis of the microparts. The nanometer amplitudes are detected by advanced electronic speckle pattern interferometry (ESPI). A specific signal processing technique has been applied to make the solution robust. Comprehensive numerical simulations provide the theoretical base for the HNDT concept. A laboratory system for 4″ wafer has been built, and extensive tests show that such key properties as e.g. the thickness of springs or membranes can be determined exactly. Automated frequency scanning and corresponding digital image processing open the way to reliable and fast industrial systems for MEMS testing on wafer level.     

基于分层光学扫描的三维数字化测量技术

采用切削分层光扫描测量与计算机数据信息合成相结合的方法，有效地解决了具有复杂内外腔结构零件的三维数字化测量。该方法比传统三维测量速度快、自动化程度高，能同时准确测量零件内外腔表面，零件边缘测量误差可控制在CCD两个像素内。利用获取的铝合金精密小箱体三维数据，在计算机上重构了零件的三维模型，并用RP技术制造出了零件物理原形。     

光纤白光干涉法与膜厚纳米测量新技术研究

运用薄膜光学干涉原理、光纤技术和干涉光谱分析技术,用光纤反射式干涉光谱仪(Reflectromic Interference Spectroscopy)直接测试宽带入射光在单晶硅表面超薄SiO₂膜层前后界面反射形成的干涉光谱曲线,并用专业软件对被测光谱信号数据处理后,可直接用公式准确计算出SiO₂氧化膜的厚度和光学折射率通过对单晶硅片表面超薄SiO₂氧化膜的实测,并与成熟的椭圆偏振仪测试结果相比,测试误差≤2nm但该方法测试简单、快速,精度高,不需要制定仪器曲线和数表,可对薄膜任意位置的厚度在线测试经过对不同厚度聚苯乙烯薄膜的厚度测试表明,该方法适合0.5～20μm薄膜厚度的精确在线测量,测量误差小于7nm.     

工业X射线机的射束均匀性检验

在与法国某公司的合作项目中,对射线机的性能做了充分的评估,针对工业X射线机射束均匀性的检验给出了实验内容、过程和结果分析。实验所用射线机分别为ISOVOLT320/13与XYD-225/10,两台设备的实验结果均符合该公司质控文件规定,满足黑度差不超过0.3的要求。定期对射线机进行射束均匀性检验,将有利于监测射线机的工作状态,以保证检测工作的准确性和一致性。     

Wavelet subspace decomposition of thermal infrared images for defect detection in artworks

Health of ancient artworks must be routinely monitored for their adequate preservation. Faults in these artworks may develop over time and must be identified as precisely as possible. The classical acoustic testing techniques, being invasive, risk causing permanent damage during periodic inspections. Infrared thermometry offers a promising solution to map faults in artworks. It involves heating the artwork and recording its thermal response using infrared camera. A novel strategy based on pseudo-random binary excitation principle is used in this work to suppress the risks associated with prolonged heating. The objective of this work is to develop an automatic scheme for detecting faults in the captured images. An efficient scheme based on wavelet based subspace decomposition is developed which favors identification of, the otherwise invisible, weaker faults. Two major problems addressed in this work are the selection of the optimal wavelet basis and the subspace level selection. A novel criterion based on regional mutual information is proposed for the latter. The approach is successfully tested on a laboratory based sample as well as real artworks. A new contrast enhancement metric is developed to demonstrate the quantitative efficiency of the algorithm. The algorithm is successfully deployed for both laboratory based and real artworks.