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131.
Image potential resonances on the Sn/Ge(1 1 1) α-phase are investigated by two closely related methods: specular electron reflection and so-called selective electron scattering. Electrons from image resonances are detected on this surface at 120 and 300 K, i.e. below and above the phase transition at about 200 K. The dispersion of the image resonances reveals at these two temperatures equivalent effective electron masses, which are characteristic for this type of electronic surface states. The results of the two methods are consistent according to the similarity of the scattering processes. Changes in the loss peak intensity with the annealing temperature are assigned to the surface quality and are reflected by characteristic photoemission intensities.  相似文献   
132.
α-Fe2O3-In2O3 mixed oxide nanoparticles system has been synthesized by hydrothermal supercritical and postannealing route, starting with (1−x)Fe(NO3)3·9H2xIn(NO3)3·5H2O aqueous solution (x=0-1). X-ray diffraction and Mössbauer spectroscopy have been used to study the phase structure and substitutions in the nanosized samples. The concentration regions for the existence of the solid solutions in the α-Fe2O3-In2O3 nanoparticle system together with the solubility limits of In3+ ions in the hematite lattice and of Fe3+ ions in the cubic In2O3 structure have been evidenced. In general, the substitution level is considerably lower than the nominal concentration x. A justification of the processes leading to the formation of iron and indium phases in the investigated supercritical hydrothermal system has been given.  相似文献   
133.
X射线衍射摇摆曲线的计算机模拟是一种获得材料晶体质量参量的有效方法,其中材料本征摇摆曲线的计算是计算机模拟的基础。用X射线动力学理论计算了Hg1-xCdxTe和Cd1-zZnzTe本征反射率曲线,并研究了组分、膜厚分别对本征反射率和半峰全宽的影响。结果表明Hg1-xCdxTe和Cd1-zZnzTe的本征反射率和半峰全宽与材料组分和厚度有明显的依赖关系,且该依赖关系取决于X射线在材料中的散射和吸收的相对强弱。薄膜的厚度也是直接影响本征摇摆曲线峰形、半峰全宽和反射率的重要因素,当薄膜厚度小于穿透深度时,表征本征反射率曲线的各个参量均与薄膜厚度有直接的关系。对于(333)衍射面,碲镉汞材料厚度大于7μm后,本征反射率和半峰全宽将不再发生明显变化。  相似文献   
134.
N[a,b]类中边界Nevanlinna-Pick插值(I)   总被引:1,自引:1,他引:0  
用所谓的Hankel向量方法求解N[a,b]函数类中带边界插值数据的Nevanlina-Pick插值(BNP(N[a,b]))问题,并建立BNP(N[a,b])问题与[a,b]上的某种带约束条件的Hausdorff矩量问题之间等价的可解条件以及解之间明确的一一对应关系.这使得当BNP(N[a,b])问题有多解时,能通过带约束条件的矩量问题的可解性准则和解获得BNP(N[a,b])问题的可解性准则和解的参数化描述,而在唯一解的情况下,通过BNP(N[a,b])问题解的存在唯一性准则和唯一解来获得带约束条件的  相似文献   
135.
Thin Eu-In solid solution oxide films (SS) were grown on Si (P) substrates to form MOS devices. The samples were characterised by X-ray fluorescence and X-ray diffraction techniques. The ac-conductance and capacitance of the devices were studied as a function of frequency in the range 500 Hz to 100 kHz, temperature in the range 293-400 K and gate voltage. The investigation established that: (1) the prepared SS exhibit a sudden reversible structural change at about 370 K, (2) the frequency dependence for f>10 kHz of the ac-conductivity and capacitance of the insulator at room temperature is controlled by the ‘corrected barrier hopping’ CBH model, (3) the temperature dependence of the ac-conductance which shows a small activation energy characterises the hopping process of current carriers between equilibrium sites, and (4) the prepared transparent SS have a sufficiently high relative permittivity ?, around 30, which suggests they are promising candidates for high-? dielectric applications.  相似文献   
136.
Solid state phase equilibria in the ternary Gd-Si-B phase diagram have been proposed at 1270 K using X-ray diffraction, scanning electron microscopy and electron probe microanalysis. Prior to this work, the binary systems Gd-B, Gd-Si and Si-B have also been reinvestigated. The main characteristic of the ternary diagram is the occurrence of two new ternary compounds Gd5Si2B8 and Gd5Si3B0.64. The former crystallizes in tetragonal symmetry, space group P4/mbm with unit cell parameters a=7.2665(3), c=8.2229(7) Å, the second one presents hexagonal symmetry, space group P63/mcm with unit cell parameters a=8.5080(4),c=6.4141(2) Å. The X-ray structures of the two structurally related phases Gd5Si3B0.64 and host binary Gd5Si3 have been refined from three-dimensional single-crystal intensity data to the final R values of 0.036 (Rw=0.046) and 0.046 (Rw=0.055) for 457 and 401 reflections, respectively with [F>4σ(F)]. Both structures exhibit the Mn5Si3-type structure, with in addition for Gd5Si3B0.64 a partial occupancy by boron of the normally vacant interstitial site at the center of the Gd6 octahedron, which corresponds to the origin of the unit cell. Bonding between the interstitial boron atoms and the gadolinium ones forming the Gd6B polyhedra is indicated by the decrease in the corresponding Gd-Gd distances and consequently in the unit cell volume. Finally, the Gd-Si-B phase diagram is compared with the previously reported Er-Si-B, at 1070 K.  相似文献   
137.
It is of engineering importance to locate low altitude moving targets with acoustic methods due to the blindness of the traditional radar detecting. In this paper, an algorithm for locating low altitude moving targets is put forward based on a five-element planar acoustic sensor array. The method is realized through estimations of the sensor-to-sensor time delays of the source signal generated by the low altitude moving target. The angle and range estimation performance of the proposed method are analyzed, respectively, both in theoretical and numerical sense.  相似文献   
138.
本文从速率方程出发,讨论了类锂铝复合等离子体的激发态结构,衰减常数,反转率和小信号增益等表征介质增益特性的物理量以及它们随电子温度,电子密度和光子逃逸几率的变化。找到了进行类锂铝离子通过复合机制产生X光激光设计应创造的等离子体状态目标区域。还讨论了这些物理量随原子序数变化的定标律。  相似文献   
139.
 采用同步辐射X光源和能散法,对CsBr粉末样品进行高压原位X光衍射实验。由金刚石对顶压砧高压装置(DAC)产生高压,用已知状态方程的Pt粉末作内标,由Pt的衍射数据确定样品压力,最高压力达64.4 GPa。实验结果表明:室温常压下原始CsBr样品是具有简单立方结构的晶体,其晶格常数α=0.428 5 nm。高压下CsBr的结构有所变化,在51.3~58.4 GPa的压力范围内,(110)线和(211)线发生劈裂,从而形成了四方相。  相似文献   
140.
注入控制铜蒸气激光方向性时间过程测量   总被引:1,自引:0,他引:1  
张勇  梁培辉 《光学学报》1998,18(4):08-411
实验研究了注入控制对铜蒸气激光非稳腔输出光束质量的影响,从输出光发散角时间分辨过程的测量结果说明注入加速被注入腔内激光发散角的减小过程。由于被注入腔内放大自发辐射的存在,为得到较好的注入控制效果,注入光的脉宽和进入被注入腔的延时必须恰当。  相似文献   
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