Closed solution to electromagnetic scattering of a plane wave by an eccentric cylinder coated with metamaterials

Closed series solution of electromagnetic scattering by an eccentric coated cylinder is achieved in matrix form. Diffracted field patterns are examined for an incident plane transverse magnetic (TM) wave. The solution is found by the classical separation of variables technique and the translational addition theorems. Wave transformation and orthogonality of the complex exponentials are employed to produce an infinite series. Numerical results are then shown by shortening the infinite series to a limited number of terms. Solutions are discussed for a dielectric or a metamaterial coating.     

表面细分技术在二维声辐射和声散射中的应用

把表面细分技术应用于求解边界积分方程，既能把CAD模型直接用于边界元分析，又能精确描述复杂的边界几何形状，实现网格自动加密和形函数自动升阶，满足误差要求。把它应用于简单的二维声辐射和声散射，结果表明对提高边界元方法的计算精度是有效的。     

Scale invariance rule in electromagnetic scattering

The volume integral equation formalism is used to prove the scale invariance rule for an arbitrarily sized scatterer with an arbitrary shape, morphology, and orientation. The only assumptions are that the scatterer is made of optically isotropic linear materials and is embedded in a homogeneous, linear, isotropic, and nonabsorbing infinite medium.     

环境光对PE塑料薄膜近红外激光拉曼光谱的影响

探讨了环境光自然光和室内荧光灯光的存在,对PE透明塑料薄膜的近红外激光拉曼光谱的影响.研究表明不同的环境光,会对近红外拉曼光谱产生不同的明显特征峰.自然光干扰产生的是以倒峰群形式为主,而室内荧光灯光造成的干扰主要以尖锐的脉冲峰形式.虽干扰表现形式不同,但都有严重地影响,在测定时一定要引起重视,不能忽略.建议在进行透明塑料近红外拉曼光谱检测时,须在暗室或暗罩遮光保护中进行,以完全隔离环境光的影响.     

A new technique for fluid velocimetry based on near field scattering

We show that the time evolution of near-field scattering speckles, originated by a fluid suspension of particles, provides information about the velocity field in the fluid. This information can be extracted from a statistical analysis of speckle fields taken at different times, either by measuring their cross-correlation function or by recovering the power spectrum corresponding to the difference between the two speckle fields. Experimental data are in accordance to the expected behaviors. The results are independent of the scatterer's size, allowing one to exploit the technique also with sub-wavelength tracking particles.     

Determination of the boiling point distribution of sulfur compounds in light cycle oil using GC with a flame photometric detector and pyrolyzer

A method has been developed to determine the boiling point distribution of sulfur compounds in light cycle oils (LCO'S). The method chosen for this analysis was GC with a flame photometric detector (FPD) and pyrolyzer. Tests were carried out to evaluate the recovery efficiency, repeatability, and accuracy of the method. Repeatabilities within 2% were obtained. The recovery of benzothiophenes and dibenzothiophenes was close to 100%; this was important because these are the major sulfur components in LCO's. No hydrocarbon or solvent interferences were observed with the use of the pyrolyzer, even for a 95% solvent level. Comparison with results from other techniques showed that the method accurately determined the levels of sulfur compounds in the LCO boiling point range.     

Modification to the Fringe Component of Diffraction Coefficient in TD-EEC Method

A modified formulation for fringe component of diffraction coefficient is implemented to TD-EEC method. An example of diffraction by perfectly conducting plate is used to illustrate our scheme. Comparing with the FDTD results we observe that the improved expression for fringe component is more accurate than that of Michaeli's formulation. This high frequency time domain technique is available for treating the bistatic scattering problems for millimeter waves.     

Courants caractéristiques et analyse de SEREigen currents and RCS analysis

In this Note, we return to the theory of characteristic modes which was introduced 30 years ago for electromagnetic scattering problems. A simple mathematical framework is proposed and complete definitions are given. The potential interest of this theory in terms of Radar Cross Section (RCS) analysis is then discussed, especially in the low frequency case. Finally, a 3-D example is presented to illustrate the efficiency of this decomposition. To cite this article: Y. Morel et al., C. R. Mecanique 332 (2004).     

Resonant-cavity-enhanced photodetectors and LEDs in the mid-infrared

In this paper we outline the use of resonant-cavity enhancement for increasing the exterior coupling efficiency of photodetectors and light-emitting diodes (LEDs) in the mid-infrared (MIR) spectral region. This method is potentially very important in the MIR because encapsulation is not presently feasible due to the lack of suitable materials. Among other potential applications, resonant-cavity-enhanced (RCE) photodetectors and LEDs could be particularly suitable for greenhouse gas detection because of their ‘pre-tunable’ spectrally narrowed resonantly enhanced peaks. We also present the optical characterization of an InAs RCE photodetector aimed at the detection of methane gas (λ≈3.3 μm), and an InAs/InAs_0.91Sb_0.09 resonant-cavity LED (RCLED) aimed at carbon dioxide gas (λ≈4.2 μm). The high peak responsivity of the RCE photodetector was 34.7 A/W at λ=3.14 μm, and the RCLED peaked at λ=3.96 μm. These are among the longest operating wavelengths for III–V RCE photodetectors and RCLEDs reported in the literature.     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.