Effects of SiNx on two-dimensional electron gas and current collapse of A1GaN/GaN high electron mobility transistors

SiNx is commonly used as a passivation material for AlGaN/GaN high electron mobility transistors (HEMTs). In this paper, the effects of SiN x passivation film on both two-dimensional electron gas characteristics and current collapse of AlGaN/GaN HEMTs are investigated. The SiNx films are deposited by high- and low-frequency plasma-enhanced chemical vapour deposition, and they display different strains on the AlGaN/GaN heterostructure, which can explain the experiment results.     

Effects of Ⅴ/Ⅲ ratio on species diffusion anisotropy inthe MOCVD growth of non-polar a-plane GaN films

Non-polar a-plane (110) GaN films have been grown on r-plane (102) sapphire substrates by metal organic chemical vapour deposition. The influences of Ⅴ/Ⅲ ratio on the species diffusion anisotropy of a-plane GaN films were investigated by scanning electron microscopy, cathodoluminescence and high-resolution x-ray diffraction measurements. The anisotropy of a-plane GaN films may result from the different migration length of adatoms along two in-plane directions. Ⅴ/Ⅲ ratio has an effect on the growth rates of different facets and crystal quality. The stripe feature morphology was obviously observed in the film with a high V/III ratio because of the slow growth rate along the [100] direction. When the Ⅴ/Ⅲ ratio increased from 1000 to 6000, the in-plane crystal quality anisotropy was decreased due to the weakened predominance in migration length of gallium adatoms.     

Simulation of current spreading for GaN-based light-emitting diodes

Uniform current spreading is crucial for the performance of light-emitting diodes (LEDs). It has been reported that the reliability and light distribution are affected by non-uniform current spreading. In this paper, the impact of different electrode patterns on the performance of LED chips is investigated. A hybrid modeling method is employed to analyze the electrical and thermal characteristics of LEDs with two different electrode mesa structures. Corresponding experiments are also carried out to validate the calculation results. It is found that increasing amount of p-electrodes in interdigitated electrode patterns is effective in improving the performance of LEDs.     

GaN基蓝绿光LED电应力老化分析

对InGaN/GaN多量子阱蓝光和绿光LED进行了室温20,40,60 mA加速电流下的电应力老化研究,发现蓝光与绿光样品经过60 mA电流老化424 h后,其电学性能表现出一定的共性与差异性:在小测量电流下,绿光样品的光衰减幅度较蓝光样品大~9%;而在较大测量电流 (20 mA)下,两者的光衰减幅度基本相同 (18%)。同时,蓝绿光样品的正向电学性能随老化时间的变化幅度基本一致,反映出它们具有相似的退化机制,绿光样品老化后增多的缺陷大部分体现为简单的漏电行为,而并非贡献于非辐射复合中心。在此基础上对GaN基外延结构进行了优化,优化后的LED长期老化的光衰减幅度较参考样品降低了3%。     

GaN薄膜中的马赛克结构随厚度发生的变化

利用高分辨率X射线衍射(HRXRD)对MOCVD系统中生长在c面Al₂O₃上的不 同厚度的GaN薄膜内马赛克结构进行了研究. 在对称面的三轴X射线衍射曲线中, 用两种方法计算得到晶粒的垂直关联长度和水平关联长度, 两者均随着薄膜厚度的增加而增加, 并且垂直关联长度近似膜厚从倒易空间图中得出的横向关联长度也有相同的趋势, 结合非对称面的衍射曲线用Williamson-Hall方法和外推法分 别拟合出晶粒的面外倾斜角和面内扭转角, 他们随着薄膜厚度的增加显著减少, 这一切都表明厚度的增加, 晶粒的单向有序排列越来越整齐, 外延片的质量越来越高. 关键词： GaN薄膜马赛克结构 厚度 HRXRD     

GaN垒层厚度渐变的双蓝光波长发光二极管

针对单蓝光波长芯片与Y3Al5O12∶Ce3+黄光荧光粉封装白光发光二极管存在显色性不足的问题,提出了采用双蓝光波长芯片激发Y3Al5O12∶Ce3+黄光荧光粉实现高显色性白光发射法,并分析了其可行性.利用金属有机化学气相沉积系统在(0001)蓝宝石衬底上顺序生长两个In0.18Ga0.82N/GaN量子阱和两个In0.12Ga0.88N/GaN量子阱的双蓝光波长发光二极管,并对不同GaN垒层厚度的双蓝光波长发光二极管的光电性能进行分析,结果表明沿n-GaN到p-GaN方向减小GaN垒层厚度能实现双蓝光发射,并有较好的发光效率.交流阻抗谱结果显示相关双蓝光波长发光二极管可以用一个电阻Rp与电容Cp并联后与一个Rs串联电路来模拟,GaN垒层变化能调节并联电阻和电容,对串联电阻没有影响.此外,基于垒层减小的双蓝光波长芯片激发Y3Al5O12∶Ce3+荧光粉实现了高显色指数的白光发射.     

The effect of thermal reactor neutron irradiation on semi-insulating GaN

Semi-insulating Gallium nitride was irradiated by fast and thermal neutrons with fluences from 10¹⁴ to 10¹⁶ n/cm². Depth-resolved cathodoluminescence spectroscopy was used to determine defects changes before and after irradiation. The results revealed two kinds of defects affected near-band emission recombination from two opposite directions. One was attributed to irradiation-induced N vacancies that contribute to near-band emission recombination. Another was attributed to irradiation-induced deep level defects that contribute to sub-band gap recombination and thus decrease the near-band emission recombination.     

Theoretical calculations of spin-Hamiltonian parameters and defect structures for Cu2+ in trigonally-distorted tetrahedral sites of ZnO and GaN crystals

The spin-Hamiltonian (SH) parameters (g factors g _//, g ⊥ and hyperfine structure constants ⁶³ A _//, ⁶³ A ⊥, ⁶⁵ A _//, ⁶⁵ A ⊥) for Cu²⁺ ions in the trigonally-distorted tetrahedral sites of ZnO and GaN crystals are calculated from a complete diagonalization (of energy matrix) method (CDM) based on a two spin-orbit parameter model for d ⁹ ions in trigonal symmetry. In the method, the Zeeman and hyperfine interaction terms are added to the Hamiltonian in the conventional CDM. The calculated results are in good agreement with the experimental values. The calculated SH parameters are also compared with those using the traditional diagonalization method or perturbation method only within the ² T ₂ term. It appears that, for exact calculations of SH parameters of d ⁹ ions in trigonal tetrahedral clusters in crystals, the present CDM is preferable to the traditional diagonalization method or perturbation method within the ² T ₂ term. The local structures of Cu²⁺ centers (which differ from the corresponding structure in the host crystal) in ZnO : Cu²⁺ and GaN : Cu²⁺ are obtained from the calculations. The results are discussed.     

Performance enhancement of an InGaN light-emitting diode with an AIGaN/InGaN superlattice electron-blocking layer

The efficiency enhancement of an InGaN light-emitting diode （LED） with an A1GaN/InGaN superlattice （SL） electron-blocking layer （EBL） is studied numerically, which involves the light-current performance curve, internal quan- tum efficiency electrostatic field band wavefunction, energy band diagram carrier concentration, electron current density, and radiative recombination rate. The simulation results indicate that the LED with an A1GaN/InGaN SL EBL has better optical performance than the LED with a conventional rectangular A1GaN EBL or a normal A1GaN/GaN SL EBL because of the appropriately modified energy band diagram, which is favorable ibr the injection of holes and confinement of elec- trons. Additionally, the efficiency droop of the LED with an AIGaN/InGaN SL EBL is markedly improved by reducing the polarization field in the active region.     

Comparison between blue lasers and light‐emitting diodes for future solid‐state lighting

Solid‐state lighting (SSL) is now the most efficient source of high color quality white light ever created. Nevertheless, the blue InGaN light‐emitting diodes (LEDs) that are the light engine of SSL still have significant performance limitations. Foremost among these is the decrease in efficiency at high input current densities widely known as “efficiency droop.” Efficiency droop limits input power densities, contrary to the desire to produce more photons per unit LED chip area and to make SSL more affordable. Pending a solution to efficiency droop, an alternative device could be a blue laser diode (LD). LDs, operated in stimulated emission, can have high efficiencies at much higher input power densities than LEDs can. In this article, LEDs and LDs for future SSL are explored by comparing: their current state‐of‐the‐art input‐power‐density‐dependent power‐conversion efficiencies; potential improvements both in their peak power‐conversion efficiencies and in the input power densities at which those efficiencies peak; and their economics for practical SSL.