发射光谱法测定ITO透明导电膜的Sn／In

本文采用运动电极，火花激发，讨论了膜样品分析中标样和分析样品的一致性，介绍了选用多个样品叠加摄谱对ＩＴＯ膜中Ｓｎ／Ｉｎ浓度比的测量。结果表明分析方法的精密度和准确度满足分析要求。     

Interface Properties of InAs／AlSb Superlattices Characterized by Grazing Incidence X-Ray Reflectivity

Two kinds of superlattice interfaces of InAs/AlSb superlattices are realized in an optimized interface growth process, where one is AlAs-like and the other is InSb-like grown on a relaxed AlSb buffer layer. The superlattice properties such as interface roughness and layer thickness are studied by grazing incidence x-ray reflectivity. The reflectivity curves are simulated by standard software till the simulation curves match well with the experimental curves. The simulation indicates that AlAs-like interfaces are much rougher than InSb-like interfaces. Grazing incidence x-ray reflectivity is also discussed as a powerful tool to assessing the structure properties of superlattices.     

Enhancement of H2 Sensing Properties of In2O3-based Gas Sensor by Chemical Modification with SiO2

The sensitivity and selectivity to H2 of a new In203-based gas sensor were improved significantly by surface chemical modification. A dense layer of SiO2 near the surface of the porous In2O3 bead was formed by chemical vapor deposition (CVD) of diethoxydimethysilane (DEMS). The dense layer functioned as a molecular sieve, thereby the diffusion of gases with large molecular diameters, except for 1-12, was effectively controlled, resulting in a prominent selectivity and high sensitivity for H2. The working mechanism of the sensor was also presented.     

MP—1溶出分析仪的联机卡尔曼滤波分辨重叠极谱波

利用ＰＣ微机的并行打印口和ＭＰ－１溶出分析仪的绘图仪端，通过接口电路实现微机对ＭＰ－１仪的数据采集，在对读入微机的极谱信号进行预处理后，用联机卡尔曼滤波方法实现了Ｉｎ，Ｃｄ重叠极谱波的分辨，结果表明，当Ｉｎ，Ｃｄ两组相对浓度比为１：１６～１３：１时，在本联机系统上可满意地用卡尔曼滤波法实现双组分同时测定。     

三乙基铟中杂质元素的ICP—AES测定

研究了基体铟对１５种杂质分析元素谱线的背景影响和光谱谱线干扰。采用基体匹配－电感耦合等离子体发射光谱法测定了三乙基铟中的１５种杂质元素。样品分析方法检出限大部分低于１μｇ／ｇ，相对标准偏差均小于２％。     

Self-Organized InAs Quantum Wires on GaAs （331）A Substrates

Self-organized InAs quantum wires (QWRs) were fabricated on the step edges of the GaAs (331)A surface by molecular beam epitaxy. The lateral size of InAs QWRs was saturated by the terrace width (i.e., 9Ohm) while the size along the step lines increased with the increasing thicknesses of the InAs layers, up to 1100nm. The height of InAs QWRs varied from 7.9nm to 13nm. The evolution of the morphology of InAs QWRs was attributed to the diffusion .andsotropy of In adatoms.