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361.
Thompson MC Badakov H Cook AM Rosenzweig JB Tikhoplav R Travish G Blumenfeld I Hogan MJ Ischebeck R Kirby N Siemann R Walz D Muggli P Scott A Yoder RB 《Physical review letters》2008,100(21):214801
First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330 fs), 28.5 GeV electron bunches have been made. Fused silica tubes of 100 microm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27 GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8+/-0.7 GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques. 相似文献
362.
Muggli P Blue BE Clayton CE Decker FJ Hogan MJ Huang C Joshi C Katsouleas TC Lu W Mori WB O'Connell CL Siemann RH Walz D Zhou M 《Physical review letters》2008,101(5):055001
An ultrarelativistic 28.5 GeV, 700-microm-long positron bunch is focused near the entrance of a 1.4-m-long plasma with a density n(e) between approximately equal to 10(13) and approximately equal to 5 x 10(14) cm(-3). Partial neutralization of the bunch space charge by the mobile plasma electrons results in a reduction in transverse size by a factor of approximately equal to 3 in the high emittance plane of the beam approximately equal to 1 m downstream from the plasma exit. As n(e) increases, the formation of a beam halo containing approximately 40% of the total charge is observed, indicating that the plasma focusing force is nonlinear. Numerical simulations confirm these observations. The bunch with an incoming transverse size ratio of approximately 3 and emittance ratio of approximately 5 suffers emittance growth and exits the plasma with approximately equal sizes and emittances. 相似文献
363.
Dr. Mowpriya Das Dr. Conor Hogan Robert Zielinski Milan Kubicki Dr. Maximilian Koy Canan Kosbab Simone Brozzesi Ankita Das Mike Thomas Nehring Viktoria Balfanz Juls Brühne Prof. Dr. Mario Dähne Dr. Martin Franz Prof. Dr. Norbert Esser Prof. Dr. Frank Glorius 《Angewandte Chemie (International ed. in English)》2023,62(50):e202314663
The adsorption of N-heterocyclic olefins (NHOs) on silicon is investigated in a combined scanning tunneling microscopy, X-ray photoelectron spectroscopy, and density functional theory study. We find that both of the studied NHOs bind covalently, with ylidic character, to the silicon adatoms of the substrate and exhibit good thermal stability. The adsorption geometry strongly depends on the N-substituents: for large N-substituents, an upright adsorption geometry is favored, while a flat-lying geometry is found for the NHO with smaller wingtips. These different geometries strongly influence the quality and properties of the obtained monolayers. The upright geometry leads to the formation of ordered monolayers, whereas the flat-lying NHOs yield a mostly disordered, but denser, monolayer. The obtained monolayers both show large work function reductions, as the higher density of the flat-lying monolayer is found to compensate for the smaller vertical dipole moments. Our findings offer new prospects in the design of tailor-made ligand structures in organic electronics and optoelectronics, catalysis, and material science. 相似文献
364.