Internet中的物理资源

对Internet中的物理资源进行了较系统的介绍，主要内容有：综合物理网站、物理期刊网站和物理教学网站，其中重点介绍了美国和欧洲主要国家的物理网站和物理期刊网站，利用这些物理站点，可以方便的进行文献检索、物理会议查询，物理教学相关资料的查询和世界各大学物理系的查询；可以方便快捷的了解当今世界各国的物理教学学科研的最新进展，文中对各个物理站点的使用方法都一一做了详细的介绍，以方便读者使用。     

Formation of Pd-Ni Based Bulk Metallic Glasses

Bulk metallic glasses are prepared in Pd4o.sNi4o.sSixP19-x （x = 0-14 at.%） alloys by a combination of flux treatment and water quenching technique. It is found that the thermal stability of the Pd4o.sNi4o.sSixP19=x glassy alloys depends on the addition of Si content. Among the Pd4o.sNi4o.sSixP19=x glassy alloys studied, the Pd4o.sNi4o.sSisPls bulk metallic glass exhibits the largest supercooled liquid region （△T = 119 K） and the highest activation energy of crystallization （283.3k J/tool）, showing enhanced glass formation ability and extraordinary glassy thermal stability.     

铅黄铜合金激光诱导击穿谱特性的实验研究

本文系统地研究了靶点位置、激光功率密度以及缓冲气体对铅黄铜样品中激光诱导击穿谱(LIBS)特性的影响;并分析了不同环境气体下LIBS信号的时间分辨特性,确定了将LIBS用于铅黄铜合金样品杂质元素定量分析时的最佳实验条件.     

Depth Dependence of Tetragonal Distortion of a ZnO/Mg0.1Zn0.90/ZnO Heterostructure Studied by Rutherford Backscattering/Channeling

Rutherford backscattering and channeling are used to characterize the structure of a ZnO/Mg0.1Zn0.90/ZnO heterostructare grown on a sapphire （0001） substrate by rf plasma-assisted molecular beam epitaxy. The results show that the Mg0.1Zn0.90 layer has the same hexagonal wurtzite structure as the underlying ZnO layer, and the heterostructure has a good crystalline quality with xmin = 5%, which is the ratio of the backscattering yields of aligned and random spectra in the near-surface region. Using the channeling angular scan around an off-normal （1213） axis in the {1010} plane of both ZnO and MgZnO layer, the tetragonal distortion εT, which is caused by the elastic strain in the epilayer, is determined. The depth dependence of εT is obtained by using this technique. It can clearly be seen that the elastic strain rapidly decreases with the increase in thickness of the ZnO film in the early growth stage and becomes slightly larger in the region of the Mg0.1Zn0.9O layer.     

高温超导磁阻电机的研究

本文针对超导磁阻电机结构并结合临界态模型,利用有限元法计算电机内部磁场和交直轴电抗,借以分析电机稳态工作特性,通过样机构造及其性能测试和分析,证实了HTS磁阻电机较传统电机能够以更小体积和重量实现更大的输出功率、更高的功率因数和效率,此项研究为百kW-MW级HTS磁阻发电/电动机研发奠定了良好的理论和实践基础.     

二维直通道内气固两相流动的实验研究

本文利用频闪激光片光源摄像和图象处理技术，对二维直通道内气固两相流动进行了实验研究，定量测定了固体粒子的运动参数、运动速度、方向．测得了粒子的运动轨迹．并得出一些有价值的结论：在本实验范围内粒子基本上沿直线运动，并处于不断加速的状态；粒子与壁面碰撞的时间极短，反弹角小于碰撞角，反弹速率小于碰撞速率．从而获得了在不同的进口气流速度及不同的通道倾角下固体粒子与固体壁面碰撞的某些规律．得到了粒子与壁面相互作用的关系表达式．为理论计算打下了基础．     

改进Q2–重标度模型与部分子分布函数的核效应

针对原有的Q²-重标度模型中存在的问题,提出了改进的Q²-重标度模型,利用核动量守恒条件,采取对价夸克、海夸克、胶子进行不同的Q²-重标度来描述束缚核子内部分子动量分布. 利用改进的Q²-重标度模型所得到的束缚核子内部分子分布函数,对轻子-核深度非弹性散射过程,核Drell-Yan过程及J/ψ光生过程均给出较满意的解释.     

Comparative Characterization of InGaN/GaN Multiple Quantum Wells by Transmission Electron Microscopy, X-Ray Diffraction and Rutherford Backscattering

The composition, elastic strain and structural defects of InCaN/CaN multiple quantum wells （MQWs） are comparatively investigated by using x-ray diffraction （XRD）, transmission electron microscopy and Rutherford backscattering/channelling. The InGaN well layers are fully strained on CaN, i.e. the degree of relaxation is zero. The multilayered structure has a clear defined periodic thickness and abrupt interfaces. The In composition is deduced by XRD simulation. We show how the periodic structure, the In composition, the strain status and the crystalline quality of the InGaN/GaN MQ, Ws can be determined and cross-checked by various techniques.     

Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance

Dual-channel phase-shifting interferometry for simultaneous phase microscopy is presented. Red and blue light beams are used for microscope illumination. A 45 tilted beamsplitter replicates the object and reference waves in red light together with the object wave in blue light into two parallel beams. The two resulting quadrature phase-shifting interferograms in red light and the object waves in blue light are generated in the two channels. The two interferograms are recorded simultaneously by a color charge-coupled device (CCD) camera, and can be separated via RGB components of the recorded color patterns without crosstalk. As a result, the phase of tested specimen can be retrieved. The feasibility of the proposed method is demonstrated by test performed on a microscopic specimen.     

Measurement and Analysis of Composition and Depth Profile of H in Amorphous Si1-xCx:H Films

Composition in amorphous Si1-xCx：H heteroepitaxial thin films on Si （100） by plasma enhanced chemical vapour deposition （PECVD） is analysed. The unknown x （0.45-3.57） and the depth profile of hydrogen in the thin films are characterized by Rutherford backscattering spectrum （RBS）, resonance-nuclear reaction analysis （R-NRA） and elastic recoil detection （ERD）, respectively. In addition, the depth profile of hydrogen in the unannealed thin films is compared to that of the annealed thin films with rapid thermal annealing （RTA） or laser spike annealing （LSA） in nitrogen atmosphere. The results indicate that the stoichiometric amorphous SiC can be produced by PECVD when the ratio of CH4/SiH4 is approximately equal to 25. The content of hydrogen decreases suddenly from 35% to 1% after 1150℃ annealing. RTA can reduce hydrogen in SiC films effectively than LSA.