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61.
62.
The orientation-selective growth of LaNiO3 films on Si(100) by pulsed laser deposition using a MgO buffer 总被引:4,自引:0,他引:4
X.Y. Chen K.H. Wong C.L. Mak J.M. Liu X.B. Yin M. Wang Z.G. Liu 《Applied Physics A: Materials Science & Processing》2002,75(4):545-549
Highly (100)-oriented, (110)-oriented and polycrystalline LaNiO3 (LNO) films were successfully prepared on Si(100) using an oriented MgO film as a buffer. It was somewhat surprising to find
that that the orientation relation between the LNO film and the corresponding MgO buffer was: LNO(100)\MgO(110), LNO(110)\MgO(111)
and LNO(polycrystalline)\MgO(100). The crystalline quality of the LNO films was shown to be sensitive to the preparation conditions
of the MgO buffer. The film surface was very smooth, without micrometer-sized droplets being observed. All LNO films were
of metallic conductivity, with a room-temperature resistivities of approximately 250, 280 and 420 μΩ cm for the (110)-oriented,
(100)-oriented and polycrystalline LNO, respectively.
Received: 2 April 2001 / Accepted: 23 October 2001 / Published online: 3 June 2002 相似文献
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随着计算机网络的迅速发展,网络安全问题正变得日益重要。文章介绍了计算机网络系统IP层安全概况和入侵者对IP层常采用的入侵手段,以及为防止这种入侵所采取的措施。 相似文献
65.
A planar double-gate SOI MOSFET (DG-SOI) with thin channel and thick source/drain (S/D) was successfully fabricated. Using both experimental data and simulation results, the S/D asymmetric effect induced by gate misalignment was studied. For a misaligned DG-SOI, there is gate nonoverlapped region on one side and extra gate overlapped region on the other side. The nonoverlapped region introduces extra series resistance and weakly controlled channel, while the extra overlapped region introduces additional overlap capacitance and gate leakage current. We compared two cases: bottom gate shift to source side (DG/spl I.bar/S) and bottom gate shift to drain side (DG/spl I.bar/D). At the same gate misalignment value, DG/spl I.bar/S resulted in a larger drain-induced barrier lowering effect and smaller overlap capacitance at drain side than DG/spl I.bar/D. Because of reduced drain-side capacitance, the speed of three-stage ring oscillator of DG/spl I.bar/S, with 20% gate misalignment length (L/sub mis/) over gate length (L/sub g/), or L/sub mis//L/sub g/=20%, was faster than that of two-gate aligned DG-SOI. 相似文献
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随着电容测量技术的迅速发展,电容传感器在非电量测量和自动检测中得到广泛应用,但它在使用过程中也存在一些问题,针对在使用电容传感器过程中存在的几个问题,从电容传感器的原理和工作过程两个方面进行了讨论,并提出行之有效的处理方法。 相似文献
70.
J. Chen J. B. Xu K. Xue J. An N. Ke W. Cao H. B. Xia J. Shi D. C. Tian 《Microelectronics Reliability》2005,45(1):137-142
Transition-metal compound TiC60 thin films were grown by co-deposition from two separated sources of fullerene C60 powder and titanium. Study of structural properties of the films, by Raman spectroscopy, atomic force microscopy, and scanning tunneling spectroscopy reveals that the films have a deformed C60 structure with certain amount of sp3 bonds and a rough surface with a large number of nanoclusters. z–V tunnelling spectroscopic measurements suggest that several charge transport mechanisms are involved in as the tip penetrates into the thin film. Conventional field electron emission (FEE) measurements show a high emission current density of 10 mA/cm2 and a low turn-on field less than 8 V/μm, with the field enhancement factors being 659 and 1947 for low-field region and high-field region, respectively. By exploiting STM tunneling spectroscopy, local FEE on nanometer scale has also been characterized in comparison with the conventional FEE. The respective field enhancement factors are estimated to be 99–355 for a gap varying from 36 to 6 nm. The enhanced FEE of TiC60 thin films can be ascribed to structural variation of C60 in the films and the electrical conducting paths formed by titanium nanocrystallites embedded in C60 matrix. 相似文献