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排序方式: 共有708条查询结果,搜索用时 876 毫秒
71.
A search for Z bosons in the μ(+)μ(-) decay channel has been performed in PbPb collisions at √S(NN)=2.76 TeV with the CMS detector at the LHC, in a 7.2 μb(-1) data sample. The number of opposite-sign muon pairs observed in the 60-120 GeV/c(2) invariant mass range is 39, corresponding to a yield per unit of rapidity (y) and per minimum bias event of [33.8±5.5(stat)±4.4(syst)]×10(-8), in the |y|<2.0 range. Rapidity, transverse momentum, and centrality dependencies are also measured. The results agree with next-to-leading order QCD calculations, scaled by the number of incoherent nucleon-nucleon collisions.  相似文献   
72.
A search for three-jet hadronic resonance production in pp collisions at a center-of-mass energy of 7 TeV has been conducted by the CMS Collaboration at the LHC, using a data sample corresponding to an integrated luminosity of 35 pb(-1). Events with high jet multiplicity and a large scalar sum of jet transverse momenta are analyzed using a signature-based approach. The number of expected standard model background events is found to be in good agreement with the observed events. Limits on the cross section times branching ratio are set in a model of gluino pair production with an R-parity-violating decay to three quarks, and the data rule out such particles within the mass range of 200 to 280 GeV/c2.  相似文献   
73.
A search for events with jets and missing transverse energy is performed in a data sample of pp collisions collected at √s=7 TeV by the CMS experiment at the LHC. The analyzed data sample corresponds to an integrated luminosity of 1.14 fb(-1). In this search, a kinematic variable α(T) is used as the main discriminator between events with genuine and misreconstructed missing transverse energy. No excess of events over the standard model expectation is found. Exclusion limits in the parameter space of the constrained minimal supersymmetric extension of the standard model are set. In this model, squark masses below 1.1 TeV are excluded at 95% C.L. Gluino masses below 1.1 TeV are also ruled out at 95% C.L. for values of the universal scalar mass parameter below 500 GeV.  相似文献   
74.
75.
At the LHC and Tevatron strong initial-state radiation (ISR) plays an important role. It can significantly affect the partonic luminosity available to the hard interaction or contaminate a signal with additional jets and soft radiation. An ideal process to study ISR is isolated Drell-Yan production, pp → X?+ ?- without central jets, where the jet veto is provided by the hadronic event shape beam thrust τB. Most hadron collider event shapes are designed to study central jets. In contrast, requiring τ B < 1 provides an inclusive veto of central jets and measures the spectrum of ISR. For τ B < 1 we carry out a resummation of α s(n)ln(m)τ B corrections at next-to-next-to-leading-logarithmic order. This is the first resummation at this order for a hadron-hadron collider event shape. Measurements of τ B at the Tevatron and LHC can provide crucial tests of our understanding of ISR and of τ B's utility as a central jet veto.  相似文献   
76.
Shape optimization methods, as commonly applied in aerodynamic design applications, have recently been adapted for use in nuclear fusion divertor target design. The resulting algorithms are very efficient compared to the standard use of numerical edge plasma simulations as analysis tools only. In this paper, we highlight some numerical aspects of the underlying algorithm, focusing on a correct, nine-point discretization of the fluxes and the need for an adjoint pressure correction equation. (© 2014 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim)  相似文献   
77.
Measurement strategies for exposure to nano-sized particles differ from traditional integrated sampling methods for exposure assessment by the use of real-time instruments. The resulting measurement series is a time series, where typically the sequential measurements are not independent from each other but show a pattern of autocorrelation. This article addresses the statistical difficulties when analyzing real-time measurements for exposure assessment to manufactured nano objects. To account for autocorrelation patterns, Autoregressive Integrated Moving Average (ARIMA) models are proposed. A simulation study shows the pitfalls of using a standard t-test and the application of ARIMA models is illustrated with three real-data examples. Some practical suggestions for the data analysis of real-time exposure measurements conclude this article.  相似文献   
78.
We have studied the photoluminescence from GaInP2 grown by molecular beam epitaxy as a function of laser power, magnetic field and temperature. We show that the single luminescence peak observed in such samples arises from weakly bound (type-II) excitons in which the electrons are localised and the holes are free, and that it is the same as the additional low-energy peak typically observed in strongly CuPt-ordered GaInP2 grown by chemical vapour deposition techniques. We propose that the electron is confined in In-rich regions of the sample and the hole is delocalised by coupling between heavy- and light-hole bands.  相似文献   
79.
We studied two InAs/InP quantum wire samples with different growth conditions. The photoluminescence of the first sample reveals up to six distinct peaks, while the second has only two pronounced photoluminescence peaks that are attributed to flat wires with heights that differ by exactly one monolayer. Despite the large band offsets in this system, the photoluminescence energy shift of these peaks with a magnetic field applied in the plane of the wires shows that the extent of the exciton wave function in the growth direction is much larger than the wire height, i.e. the wave function spills over into the InP. Moreover, the exciton wave function shrinks for increasing wire height. The wave function spill-over is qualitatively confirmed in the first quantum wire sample.  相似文献   
80.
In this paper, we report on several different approaches that were implemented on both capacitor and scaled planar MOS transistor devices in order to prevent or undo the commonly observed VT/Vfb-shift and –instability for Hf-based high-κ gate stacks in conjunction with a poly-Si electrode. While the latter issue can eventually be mitigated, the VT-shift problem jeopardizes initial high-κ integration with poly-Si for the 65 nm and also for the 45 nm node. The different attempts to circumvent this problem include (1) bulk modifications of the high-κ stack/process, (2) the use of various thin capping layers at the poly/high-κ interface and (3) chemical and process modifications of the gate electrode deposition. We have observed that, although considerable improvements have been made in terms of e.g. yield, performance and instability, none of these techniques succeeded in obtaining VT-values in line with the ITRS device specifications, i.e. avoiding Fermi Level Pinning to occur for poly-Si/Hf(Si)O(N) stacks.  相似文献   
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