系列类立方烷型Fe4S4簇合物的XPS分析

对7种类立方烷型Fe_4S_4簇合物进行了XPS分析,得到了中心离子Fe的价态,给出了系列Fe_4S_4中骨架硫的结合能,由峰合成结果给出各种S、N的比例与按结构式计算的结果相同。     

热氧化磁控溅射金属锌膜合成一维ZnO纳米棒

利用退火热氧化射频磁控溅射金属锌膜的方法在Si(111)衬底上制备了一维Zn O纳米棒,同时用多种测试手段对样品的晶体结构、表面形貌和光学性能进行了研究.XRD,SEM和TEM的测试结果表明,Zn O纳米棒为单晶相六方纤锌矿结构,呈头簪状向外发散生长,直径在30～60 nm左右,其长度可达几μm.PL 谱测试结果表明:在波长为280 nm光的激发下,在372 nm处有强的近带边紫外光发射和516 nm处的较微弱深能级绿光发射.说明合成的一维Zn O纳米棒的结晶质量和光学性能优良     

基于XML技术数据库优化接入设计

鉴于用户对目前数据库接入技术要求的提高，一种基于XML技术对数据库接入进行优化的技术出现了。这种技术利用了基于XML传输时的可扩展、高度结构化等特性，在JavaBean，JDBC，Apache，Tomcat等设计组件及Linux体系结构的配合使用下．为用户提供了一个安全、高效、可扩展且访问灵活的数据库接入方式。     

布尔“复合函数”的Walsh循环谱和自相关函数

本文利用布尔随机变量联合分布的分解式给出了布尔“复合函数”和某布尔函数符合率的分解算式,由此求得了布尔“复合函数”的 Walsh循环谱和自相关函数的计算公式,公式清楚地表明了“复合”所得布尔函数的 Walsh循环谱与起“复合”作用的函数和被“复合”的各函数所有线性组合的 Walsh循环谱之间的关系、“复合”所得布尔函数的自相关函数与起“复合”作用的函数谱和被“复合”的各函数的谱及相关函数之间的关系,这两个公式在布尔函数的密码学性质研究中会有广泛的应用.     

Bis[μ‐1‐(1,10‐phenanthrolin‐2‐yl)‐2‐pyridone]bis{aqua[1‐(1,10‐phenanthrolin‐2‐yl)‐2‐pyridone]cadmium(II)} tetrakis(perchlorate)

In the title centrosymmetric binuclear complex, [Cd₂(C₁₇H₁₁N₃O)₄(H₂O)₂](ClO₄)₄, the Cd^II ion assumes a distorted octahedral geometry. There are π–π stacking interactions between the pyridine and 1,10‐phenanthroline ring systems of adjacent ligands at the same Cd^II centre. Intermolecular hydrogen bonds between the coordinated aqua ligand and the O atom of a keto group connect adjacent complex cations into extended chains. Hydrogen bonds also exist between the complex cations and the perchlorate anions. Compared with the fluorescence spectrum of the organic ligand, the complex displays strong fluorescent emission and an ipsochromic shift of the emission peaks, which may be attributed to the structural character.     

白光干涉条纹变密的原因探讨

讨论了在测定透明介质折射率的过程中彩色条纹变密的现象，并在其基础上分析其成因：一是由于媒质折射率加大；二是由于平形板介质平行度不好造成楔形的倾角变大，最后在实验中验证了理论结果。     

Pulsed laser deposition of atomically flat La1-xSrxMnO3 thin films using a novel target geometry

A new ablation target geometry is presented that was used to produce thin films of La_1-xSr_xMnO₃ grown heteroepitaxially on SrTiO₃ by pulsed reactive crossed-beam laser ablation. The films were grown in order to perform angle-resolved photoelectron spectroscopy, which demands that the surface be atomically flat. In situ and ex situ analysis shows that this condition was met, even after depositing to a thickness of over 100 nm. PACS 61.10.-i; 61.18.Bn; 68.47.Gh; 71.27.+a; 81.15.Fg     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.     

On Two Theorems of Finite Solvable Groups

For a finite group G, let T（G） denote a set of primes such that a prime p belongs to T（G） if and only if p is a divisor of the index of some maximal subgroup of G. It is proved that if G satisfies any one of the following conditions： （1） G has a p-complement for each p∈T（G）; （2）│T（G）│= 2： （3） the normalizer of a Sylow p-subgroup of G has prime power index for each odd prime p∈T（G）; then G either is solvable or G/Sol（G）≌PSL（2, 7） where Sol（G） is the largest solvable normal subgroup of G.