无界区域R1上推广的B-BBM方程的整体吸引子

本文研究了无界区域R^1上推广的B—BBM方程的长时间动力学行为，证明了该方程整体吸引子的存在性．     

Using Automated Negotiation for Grid Services

The popularity of grid services has widened their application to numerous domains and increased the utilization of computational resources. In order to create more incentives for the resources owners to lease their resources and prevent users from wasting the resources, the introduction of a market-oriented grid is inevitable. However, the issues for the negotiation between service provider and consumer over the supply and demand of resources can be complex, with highly interdependent issues. In this research, a simulated automated negotiation mechanism including a co-evolutionary mechanism and a modified game theory approach is proposed, to assist them in reaching an agreement over the conflicting issues. In the proposed architecture, the co-evolution process is able to reduce the multiple dimensional search space into a two-dimension search space and identify the appropriate negotiation strategies for the negotiating agents to form a payoff matrix which can be used for the game theory related stage of their interaction. The multiple stage negotiation process is introduced to improve the negotiation result. In this paper, an application which requires a large amount of computational resources to process the data generated from mobile devises is used to demonstrate that the proposed system is able to resolve the conflicts and obtain a valid solution.     

用地面阵列寻找TeV能区γ点源的方法探讨

文中探讨搜寻TeV能区γ点源的方法.讨论利用student变量t判断来自源区及背景区宇宙线事例的统计差别,并由Bayes定理与MonteCarlo模拟相结合计算源区各能段的信号数,推算蟹状星云在TeV能区的γ射线微分能谱     

多巴酚丁胺的流动注射化学发光法测定

在盐酸介质中 ,高锰酸钾可氧化多巴酚丁胺产生化学发光 ,甲醛对该反应有较强的增敏作用 ,据此 ,建立了流动注射化学发光法测定多巴酚丁胺的方法 ;方法的线性范围为0.1～100mg·L -1,检出限为0.07mg·L -1 ,相对标准偏差为1.2 %(n=11,ρ=1.0mg·L -1) ;该法用于药物中多巴酚丁胺含量的测定 ,结果令人满意。     

光敏电阻基本特性测量实验的设计

介绍了测量CdS光敏电阻的伏安特性和光照特性的实验方法，并给出了相应的实验结果。     

热喷涂技术的现状和发展

介绍了热喷涂工艺的特点，喷涂方法的种类及其技术以及热喷涂技术的应用概况，并对热喷涂技术的发展方向给予了展望。     

Reliability-estimation and stopping-rules for software testing,based on repeated appearances of bugs

Software-testing (debugging) is one of the most important components in software development. An important question in the debugging process is, when to stop. The choice is usually based on one of two decision criteria: (1) when the reliability has reached a given threshold, and (2) when the gain in reliability cannot justify the testing cost. Various stopping rules and software reliability models are compared by their ability to deal with these two criteria. Two new stopping rules, initiated by theoretical study of the optimal stopping rule based on cost, are more stable than other rules for a large variety of bug structures. The 1-step-ahead stopping rules based on the Musa et. al. basic execution and logarithmic Poisson models, as well as the stopping rule by Dalal and Mallows (1990), work well for software with many relatively small bugs (bugs with very low occurrence rates). The comparison was done by simulation     

高阶非线性波动方程的有限差分方法

本文研究一类广泛的高阶非线性波动方程组初边值问题的有限差分格式，用离散泛函分析方法和先验估计的技巧得到了有限差分格式的收敛性。     

New BCN Fibres for Strong Ultraviolet and Visible Light Luminescence

Novel B3CN3 fibres with a special structure have been synthesized by a pyrolysis process. High-resolution TEM analysis shows that the as-prepared B3CN3 fibres can be described as a nanofibre-interweaved network. Strong photoluminescence at 370 nm and 700 nm from the as-prepared B3 CN3 fibres are observed at room temperature, which suggests that B3 CN3 is a promising ultraviolet- and visible-light-emitting material.     

An extraction method to determine interconnect parasitic parameters

Interconnect parasitic parameters in integrated circuits have significant impact on circuit speed. An accurate monitoring of these parameters can help to improve interconnect performance during process development, provide information for circuit design, or give useful reference for circuit failure analysis. Existing extraction methods either are destructive (such as SEM measurement) or can determine only partial parasitic parameters (such as large capacitor measurement). In this paper, we present a new method for extracting interconnect parasitic parameters, which can simultaneously determine the interlayer and intralayer capacitances, line resistance, and effective line width. The method is based on two test patterns of the same structure with different dimensions. The structure consumes less wafer area than existing methods. The method shows good agreement with SEM measurement of dielectric thickness in both nonglobal planarized and chemical-mechanical polished processes, and gives accurate prediction of the process spread of a ring oscillator speed over a wafer