关于一类单叶函数

A sharp coefficient estimate,distortion theorem and the radius of convexityare determined for the class R(α,β,A,B) of function f(z)=z+(?)a_nzⁿ satisfyingthe condition |(f′(z)-1)/(Bf′(z)-[B+(A-B)(1-α)])|<β for some α,β(0≤α<1,0<β≤1) and -1≤A相似文献   

12-Ring Network Coordination Polymer——{[Cu(C_4N_2H_(10))_4]_2·H_4V_4O_(14)}_n Formed by Linking cyclo-[H_4V_4O_(14)]~(4-) with Cu(C_4N_2H_(10))~(2+)_4 Cation Clusters

IntroductionThe interest in polyoxometalates that are widelyused in medical chemistry, catalyst reactions, and ma-terial sciences stems from their complicated aggregatesformed by means of corner-, edge- and face-sha-ring[1—4]. The exploitation of new str…     

INERTIAL MANIFOLDS FOR NONAUTONOMOUS SEMILINEAR PARABOLIC PARTIAL DIFFERENTIAL EQUATIONS WITH TIME DELAYS

The present paper deals with the long-time behavior of a class of nonautonomous retarded semilinear parabolic differential equations. When the time delays are small enough and the spectral gap conditions hold, the inertial manifolds of the nonautonomous retard parabolic equations are constructed by using the Lyapunov-Perron method.     

A Novel Contactless Method for Characterization of Semiconductors：Surface Electron Bean Induced Voltage in Scanning Electron Microscopy

We present a novel contactless and nondestructive method called the surface electron beam induced voltage (SEBIV) method for characterizing semiconductor materials and devices.The SEBIV method is based on the detection of the surface potential induced by electron beams of scanning electron microscopy (SEM).The core part of the SEBIV detection set-up is a circular metal detector placed above the sample surface.The capacitance between the circular detector and whole surface of the sample is estimated to be about 0.64pf.It is large enough for the detection of the induced surface potential.The irradiation mode of electron beam (e-beam) influences the signal generation When the e-beam irradiates on the surface of semiconductors continuously,a differential signal is obtained.The real distribution of surface potentials can be obtained when a pulsed e-beam with a fixed frequency is used for irradiation and a lock-in amplifier is employed for detection.The polarity of induced potential depends on the structure of potential barriers and surface states of samples.The contrast of SEBIV images in SEM changes with irradiation time and e-beam intensity.     

Fractional-Linear Transformations of Operator Balls; Applications to Dynamical Systems

The operator sets, which are the subject of this paper, have been studied in many papers where, under different restrictions on the generating operators, convexity, compactness in the weak operator topology, and nonemptiness were proved for sets of different classes under study. Then the results obtained were used in these papers to solve several applied problems. Namely, they played the key role in establishing the dichotomy of nonautonomous dynamical systems, with either continuous or discrete time. In the present paper, we generalize and sharpen the already known criteria and obtain several new criteria for convexity, compactness, and nonemptiness of several special operator sets. Then, using the assertions obtained, we construct examples of sets of the form under study which are nonconvex, noncompact in the weak operator topology, as well as empty, and are generated by ＂smooth＂ operators of a special class. The existence problem for such sets remained open until the authors of this paper announced some of its results.     

高压热处理对氧沉淀低温形核的影响

研究了外加高压(1GPa)下对450℃热处理硅片中氧沉淀行为的影响.透射电镜观察表明相对于大气压下热处理的样品,高压处理的样品会产生密度更高、尺寸更小的氧沉淀,表明高压有利于小直径氧沉淀的生成.电学性能测试表明,高压下处理的样品其热施主生成浓度和生成速率远远高于常压下处理的样品,这表明热施主与低温热处理过程中生成的高浓度氧沉淀核心有密切的关系.     

NetWare网连接Internet/Intranet的捷径——Novell IntranetWare IPX/IP网关介绍

当前,与Intenert相连的网络数量的增长速度十分迅猛。预计,在专用局域网或“内部网”中,In-ternet技术的应用增长规模会更大。据估计,三分之二的现有LAN正在使用Novell NetWare,而且有越来越多的LAN将与Internet或企业内部网相连接。为了帮助用户在保护其在NetWare上的投资的同时,能够利用Internet/Intra-     

Signal generation and spatial resolution in scanning electron acoustic microscopy

The thermal conduction and Navier-Stokes equations are usedto obtain the stress field generated by a chopped electron beam incident ona disk sample.The piezoelectric equation is then used to obtain the out-put signal of the transducer coupled to the sample.The results lead to aconsideration of the signal generation mechanism and spatial resolution inscanning electron acoustic microscopy(SEAM).It is shown that atime-variant heat source generated both a thermal wave and an acousticwave simultaneously,and thermal-to-acoustic wave mode conversion oc-cured on the boundary surfaces depends on the amplitudes and the gra-dients at boundary surfaces of both heat source and thermal waves.It isargued that the spatial resolution of a imaging system operated in thenear field,such as SEAM and thermal wave microscope,is dependent onthe distance between the heat source and scatterer and,at best,the lateralresolution in SEAM is of the order of the diameter of the focal spot ofthe electron beam.     

Theoretical Discussion of Couple-Mode Using Chirped Fiber Grating for Dispersion Compensation

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