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971.
Pole-Shang Lin Ching-Yuan Wu 《Electron Devices, IEEE Transactions on》1991,38(6):1376-1383
A new simplified two-dimensional model for the threshold voltage of MOSFETs is derived in terms of simple characteristic functions. These characteristic functions are transformed from the exact series solution of the two-dimensional Poisson's equation, in which the effects of a nonuniformly doped substrate and a finite graded source-drain junction depth are included. In this model, charge-screening effects are proposed to account for the weak dependence of the threshold voltage on the substrate bias for short-channel MOSFETs, and exact source and drain boundary potentials can be approximated by their equivalent power functions. The accuracy of the simplified 2-D model is verified by 2-D numerical analysis. Moreover, comparisons between the simplified 2-D model and the experimental results are made, and good agreement is obtained for wide ranges of channel lengths, applied substrate, and drain biases 相似文献
972.
973.
图书馆网站设计的探讨 总被引:8,自引:0,他引:8
介绍了当今信息时代建设图书馆网站的重要性和作用 ,以及在网站设计评估中应着重注意的包括网站内容、页面设计及安全性能等三方面的问题 ,同时提出 ,图书馆网站建设中如何在这几方面进行改进和完善。 相似文献
974.
Yuanning Chen Myricks R. Decker M. Liu J. Higashi G.S. 《Electron Device Letters, IEEE》2003,24(5):295-297
As CMOS device dimensions scale down to 100 nm and beyond, the interface roughness between Si and SiO/sub 2/ has become critical to device performance and reliability. Si/SiO/sub 2/ interface roughness degrades channel mobility decreasing drive currents. The authors have used atomic force microscopy to study surface roughness in the processing of 0.16 /spl mu/m CMOS integrated circuits. All of the process steps that could potentially affect the interface roughness have been studied. The results show that oxidation is the major contributor to the interface roughness. The rms roughness is found to be linearly dependent on oxide thickness. Transistors with Si/SiO/sub 2/ interface rms roughness that has been reduced from 1.6 to 1.1 /spl Aring/ by reducing oxide thicknesses show improved device drive currents. This technique for interfacial smoothing and device performance improvement has the advantage of being easily implemented in today's technology. 相似文献
975.
976.
He G.S. Helgeson R. Lin T.-C. Qingdong Zheng Wudl F. Prasad P.N. 《Quantum Electronics, IEEE Journal of》2003,39(8):1003-1008
We report the observation of one-, two-, and three-photon pumped lasing in the same medium, a novel liquid dye salt system when excited by pulsed 0.532-, 1.06-, and /spl sim/1.49-/spl mu/m coherent radiation pulses, respectively. Since the gain medium is a liquid and not a solution, it contains a significantly higher effective dye concentration and, therefore, is highly suitable for multiphoton pumped lasing and optical power limiting applications. The lasing spectra, temporal waveforms, near- and far-field intensity distributions, and output/input efficiency were measured under the conditions of one-, two-, and three-photon pump configurations. 相似文献
977.
The microstructure and thermal behavior of the Sn-Zn-Ag solder were investigated for 8.73–9% Zn and 0–3.0% Ag. The scanning
electron microscopy (SEM) analysis shows the Ag-Zn compound when the solder contains 0.1% Ag. X-ray diffraction (XRD) analysis
results indicate that Ag5Zn8 and AgZn3 become prominent when the Ag content is 0.3% and above. Meanwhile, the Zn-rich phase is refined, and the Zn orientations
gradually diminish upon increase in Ag content. The morphology of the Ag-Zn compound varies from nodular to dendrite structure
when the Ag content increases. The growth of the Ag-Zn compounds is accompanied by the diminishing of the eutectic structure
of the Sn-9Zn solder. Differential scanning calorimetry (DSC) investigation reveals that the solidus temperature of these
solders exists at around 198°C. A single, sharp exothermic peak was found for the solders with Ag content less than 0.5%.
Liquidus temperatures were identified with the DSC analysis to vary from 206°C to 215°C when the Ag content ranges from 1.0%
to 3.0% 相似文献
978.
979.
P. Kundu K.R. Justin Thomas J.T. Lin Y.‐T. Tao C.‐H. Chien 《Advanced functional materials》2003,13(6):445-452
A series of dicarbazolyl derivatives bridged by various aromatic spacers and decorated with peripheral diarylamines were synthesized using Ullmann and Pd‐catalyzed C–N coupling procedures. These derivatives emit blue light in solution. In general, they possess high glass‐transition temperatures (Tg > 125 °C) which vary with the bridging segment and methyl substitution on the peripheral amine. Double‐layer organic light‐emitting devices were successfully fabricated using these molecules as hole‐transporting and emitting materials. Devices of the configuration ITO/HTL/TPBI/Mg:Ag (ITO: indium tin oxide; HTL: hole‐transporting layer; TPBI: 1,3,5‐tris(N‐phenylbenzimidazol‐2‐yl)benzene) display blue emission from the HTL layer. The EL spectra of these devices appear slightly distorted due to the exciplex formation at the interfaces. However, for the devices of the configuration ITO/HTL/Alq3/Mg:Ag (Alq3 = tris(8‐hydroxyquinoline)aluminum) a bright green light from the Alq3 layer was observed. This clearly demonstrates the facile hole‐transporting property of the materials described here. 相似文献
980.
用新的电路形式提高HBT光调制器驱动电路的传输速率及性能 总被引:1,自引:1,他引:0
在传统光调制器驱动电路中,所用HBT截止频率的大小要达到驱动电路传输速率的4倍以上.文中在输出级采用共射共基HBT形式后,其器件的截止频率只需大于电路传输速率的2倍即可,从电路设计的角度降低了对所用器件的要求.文中分析了新的电路结构提高传输速率的原因并给出了模拟结果.同时新的电路结构也具有良好的热稳定性. 相似文献