The number of limit cycles of cubic Hamiltonian system with perturbation

In this paper, by using qualitative analysis, we investigate the number of limit cycles of perturbed cubic Hamiltonian system with perturbation in the form of (2n+2m) or (2n+2m+1)th degree polynomials . We show that the perturbed systems has at most (n+m) limit cycles, and has at most n limit cycles if m=1. If m=1, n=1 and m=1, n=2, the general conditions for the number of existing limit cycles and the stability of the limit cycles will be established, respectively. Such conditions depend on the coefficients of the perturbed terms. In order to illustrate our results, two numerical examples on the location and stability of the limit cycles are given.     

2006年高考物理实验试题特点及其对教学的启示

纵观今年全国及各省市高考命制的试题中，与物理相关的7套理科综合试卷和3套单科试卷，发现在课改理念指导下，具有许多共同特点，集中体现了注重基础知识、注重过程方法、重视五种能力考查等特点．《物理通报》从第6期开始，对每套物理试题的评析文章已作了详细讨论．本文则面向各套试题中的物理实验试题，进行横向系统分析，试图从总体上勾画出2006年高考命题在物理实验内容方面的基本思路，以期引起广大物理教师对此思考和研究．     

New insights in polarity-dependent oxide breakdown for ultrathin gate oxide

In this work, a quantitative analysis is applied to resolve the newly reported polarity-dependent charge-to-breakdown (Q/sub BD/) data from thick oxides of 6.8 nm down to ultrathin oxides of 1.9 nm. Three independent sets of Q/sub BD/ data, i.e., n/sup +/poly/NFET stressed under inversion and accumulation, and p/sup +/ poly/PFET under accumulation are carefully investigated. The Q/sub BD/ degradation observed for p-type anodes, either poly-Si or Si-substrate, can be nicely understood with the framework of maximum energy released by injected electrons. Thus, this work provides a universal and quantitative account for a variety of experimental observations in the time-to-breakdown (T/sub BD/) and Q/sub BD/ polarity-dependence of oxide breakdown.     

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM

In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one.     

1/f Noise separated from white noise with wavelet denoising

The low-frequency noise in the devices often appears to be a superposition of 1/f noise and white noise, which are induced by different physical mechanisms or microscopic defects. The separation of the two noises is necessary especially in the characterization of quality and reliability by means of noise measurement. The traditional separation method is usually used in frequency domain with limited frequency range, and the estimated value of exponent index γ for 1/f^γ noise has considerable error when the ratio of 1/f noise and white noise is smaller than 20 dB. In this paper, based on wavelet denoising theory, a new method is proposed to separate 1/f^γ noise from white noise in time domain and can be used to estimate γ values with much better accuracy even if the ratio of 1/f noise to white noise in low enough.     

基于规则的光学邻近矫正中规则的相关处理

讨论了如何选择适当的规则,如何建立简洁实用的规则库,如何应用规则库.提出了四种主要的光学邻近矫正规则,在实验结果中列举了规则库中的部分数据.利用规则矫正后的版图光刻得到的硅片图形有了明显的改善.规则库的自动建立部分 (OPCL)是基于规则的光学邻近矫正系统的重要组成部分.     

A Language for Teaching Discrete-event Simulation

Courses which teach discrete-event simulation are based on many different simulation languages. The requirements for a language to support teaching simulation are discussed. In particular, it is recommended that such languages separate into distinct modules those aspects of simulation which are taught as separate topics. Implementation of the separation is discussed. The SEESIM language, developed as a teaching aid, is described, and examples of its use are given. Straightforward use of SEESIM can be learned quickly, yet the language provides facilities for a staged introduction to advanced concepts of simulation.     

铝互连线的电迁移问题及超深亚微米技术下的挑战

铝互连线的电迁移问题历来是微电子产业的研究热点，其面临的电迁移可靠性挑战也是芯片制造业最持久和最重要的挑战之一.从20世纪90年代开始，超深亚微米(特征尺寸≤0.18 μm)铝互连技术面临了更加复杂的电迁移可靠性问题.从电迁移理论出发，分析概括了铝互连电迁移问题的研究方法，总结了上世纪至今关于铝互连电迁移问题的主要经验；最后结合已知的结论和目前芯片制造业现状，分析了当前超深亚微米铝互连线电迁移可靠性挑战的原因和表现形式，提出了解决这些问题的总方向. 关键词： 电迁移 铝互连 微结构