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101.
Zygmunt Bak 《Czechoslovak Journal of Physics》2002,52(1):A25-A28
We consider RKKY interaction in a quasi 2D system with nonparabolic dispersion. In our paper we calculate the RKKY range function assuming the in-layer confinement via effective dimensionality approach. We show, that indirect magnetic exchange in our system can be modelled by the effective spectral dimension which equals one. 相似文献
102.
103.
104.
In this paper, by using qualitative analysis, we investigate the number of limit cycles of perturbed cubic Hamiltonian system with perturbation in the form of (2n+2m) or (2n+2m+1)th degree polynomials . We show that the perturbed systems has at most (n+m) limit cycles, and has at most n limit cycles if m=1. If m=1, n=1 and m=1, n=2, the general conditions for the number of existing limit cycles and the stability of the limit cycles will be established, respectively. Such conditions depend on the coefficients of the perturbed terms. In order to illustrate our results, two numerical examples on the location and stability of the limit cycles are given. 相似文献
105.
纵观今年全国及各省市高考命制的试题中,与物理相关的7套理科综合试卷和3套单科试卷,发现在课改理念指导下,具有许多共同特点,集中体现了注重基础知识、注重过程方法、重视五种能力考查等特点.《物理通报》从第6期开始,对每套物理试题的评析文章已作了详细讨论.本文则面向各套试题中的物理实验试题,进行横向系统分析,试图从总体上勾画出2006年高考命题在物理实验内容方面的基本思路,以期引起广大物理教师对此思考和研究. 相似文献
106.
In this work, a quantitative analysis is applied to resolve the newly reported polarity-dependent charge-to-breakdown (Q/sub BD/) data from thick oxides of 6.8 nm down to ultrathin oxides of 1.9 nm. Three independent sets of Q/sub BD/ data, i.e., n/sup +/poly/NFET stressed under inversion and accumulation, and p/sup +/ poly/PFET under accumulation are carefully investigated. The Q/sub BD/ degradation observed for p-type anodes, either poly-Si or Si-substrate, can be nicely understood with the framework of maximum energy released by injected electrons. Thus, this work provides a universal and quantitative account for a variety of experimental observations in the time-to-breakdown (T/sub BD/) and Q/sub BD/ polarity-dependence of oxide breakdown. 相似文献
107.
108.
Chih-Wea Wang Chi-Feng Wu Jin-Fu Li Cheng-Wen Wu Tony Teng Kevin Chiu Hsiao-Ping Lin 《Journal of Electronic Testing》2002,18(6):637-647
In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure analysis. In addition, our design provides programmability for custom March algorithms with lower hardware cost. The combination of the on-line programming mode and diagnostic system dramatically reduces the effort in design debugging and yield enhancement. We have designed and implemented test chips with our BIST design. Experimental results show that the area overhead of the proposed BIST design is only 2.4% for a 128 KB SRAM, and 0.65% for a 2 MB one. 相似文献
109.
The low-frequency noise in the devices often appears to be a superposition of 1/f noise and white noise, which are induced by different physical mechanisms or microscopic defects. The separation of the two noises is necessary especially in the characterization of quality and reliability by means of noise measurement. The traditional separation method is usually used in frequency domain with limited frequency range, and the estimated value of exponent index γ for 1/fγ noise has considerable error when the ratio of 1/f noise and white noise is smaller than 20 dB. In this paper, based on wavelet denoising theory, a new method is proposed to separate 1/fγ noise from white noise in time domain and can be used to estimate γ values with much better accuracy even if the ratio of 1/f noise to white noise in low enough. 相似文献
110.