A New Approach for Built‐in Self‐Test of 4.5 to 5.5 GHz Low‐Noise Amplifiers

This paper presents a low‐cost RF parameter estimation technique using a new RF built‐in self‐test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using 0.18 μm SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.     

Estimating and reducing the memory requirements of signal processing codes for embedded systems

Most embedded systems have limited amount of memory. In contrast, the memory requirements of the digital signal processing (DSP) and video processing codes (in nested loops, in particular) running on embedded systems is significant. This paper addresses the problem of estimating and reducing the amount of memory needed for transfers of data in embedded systems. First, the problem of estimating the region associated with a statement or the set of elements referenced by a statement during the execution of nested loops is analyzed. For a fixed execution ordering, a quantitative analysis of the number of elements referenced is presented; exact expressions for uniformly generated references and a close upper and lower bound for nonuniformly generated references are derived. Second, in addition to presenting an algorithm that computes the total memory required, this paper also discusses the effect of transformations (that change the execution ordering) on the lifetimes of array variables, i.e., the time between the first and last accesses to a given array location. The term maximum window size is introduced, and quantitative expressions are derived to compute the maximum window size. A detailed analysis of the effect of unimodular transformations on data locality, including the calculation of the maximum window size, is presented.     

General expression for pdf of a sum of independent exponential random variables

In order to evaluate exactly the performance of some diversity schemes, the probability density function (pdf) of a sum of independent exponential random variables (r.v.'s) must be known. This paper proposes a simple method to find it by using characteristic function., The resultant pdf is successfully applied to formulate the closed-form BER expression of 2 Tx-J Rx transmit diversity as well as the outage probability of repetition coding.     

网络管理中事件关联检测机制的研究

网络事件的关联检测是网络管理需要解决的一个关键问题,本文根据分布式网络管理的特点,首次明确定义了网络事件的基本关联关系,在此基础上提出了一种基于Petri Net的事件关联检测机制,实现了基于事件内容的细粒度关联检测,并且在事件检测中充分考虑了时间因素,有效地提高了事件关联检测的准确性。     

Enhanced thermal stability of a sputtered titanium-nitride film as a diffusion barrier for capacitor-bottom electrodes

The effect of a thin RuO_x layer formed on the Ru/TiN/doped poly-Si/Si stack structure was compared with that on the RuO_x/TiN/doped poly-Si/Si stack structure over the post-deposition annealing temperature ranges of 450–600°C. The Ru/TiN/poly-Si/Si contact system exhibited linear behavior at forward bias with a small increase in the total resistance up to 600°C. The RuO_x/TiN/poly-Si/Si contact system exhibited nonlinear characteristics under forward bias at 450°C, which is attributed to no formation of a thin RuO_x layer at the RuO_x surface and porous-amorphous microstructure. In the former case, the addition of oxygen at the surface layer of the Ru film by pre-annealing leads to the formation of a thin RuO_x layer and chemically strong Ru-O bonds. This results from the retardation of oxygen diffusion caused by the discontinuity of diffusion paths. In particular, the RuO_x layer in a nonstoichiometric state is changed to the RuO₂-crystalline phase in a stoichiometric state after post-deposition annealing; this phase can act as an oxygen-capture layer. Therefore, it appears that the electrical properties of the Ru/TiN/poly-Si/Si contact system are better than those of the RuO_x/TiN/poly-Si/Si contact system.     

双掺(Tm3+,Tb3+)LiYF4激光器1.5 μm波长激光阈值分析

由速率方程推出了双掺（Tm^3 ,Tb^3 ）离子准四能级系统的激光阈值解析式，讨论了Tm^3 和Tb^3 离子之间的相互作用。分析了1.5μm波长附近的激光阈值和Tm^3 、Tb^3 离子的掺杂原子数分数及晶体长度的关系。结果表明，对于对应Tm^3 离子^3H4→^3F4跃迁的约1.5μm波长的激光，激活离子Tm^3 的掺杂原子数分数过大时，交叉弛豫作用将使系统阈值迅速增加。Tb^3 离子的加入，一方面能抽空激光下能级，起到降低阈值的作用；另一方面亦减少了激光上能级的寿命，使阈值升高。故Tb^3 离子有最佳掺杂原子数分数。对于Tm原子数分数为y=0.01的Tm:LiYF4晶体，Tb^3 离子的最佳掺杂原子数分数为0.002左右，同时表明，激光阈值与晶体长度有关。最佳晶体长度与Tm^3 、Tb^3 离子的掺杂原子数分数以及晶体的衍射损耗和吸收损耗有关。     

采用同心旋转调制盘的红外检测系统

介绍了采用同心旋转调制盘和相应的逻辑门积分计数的积累检测技术的基本原理，并给出采用同心旋转调制盘的红外检测系统的基本结构，介绍了同心旋转调制盘系统的设计方法，通过对实验结果进行分析，表明同心旋转调制盘技术在红外检测系统应用中可以大大地改善系统的性能，提高了探测概率，降低了虚警概率。同时分析了该系统存在的问题，为红外检测技术的进一步发展提供一些经验。     

硅微机械梳齿静电谐振器的建模与分析

基于参数化的计算机辅助设计（CAD）软件，对硅微机械梳齿静电谐振器进行了实体建模，以有限元分析软件为工具，进行了谐振器的模态分析，静态分析和谐响应分析，初步揭示了谐振器的静、动态特性，有助于改善设计效率和质量，展示了计算机辅助工程（CAE）技术在微机电系统（MEMS）研究中的重要作用。     

电路过渡过程的计算机辅助分析

电路过渡过程所列方程是微分方程，本文中采用的是方框图模型分析法，即将微分方程的复杂示解分解成最基本的加（减）、乘（除）、积分（微分）、增益等运算，采用VB设计用户界面产进行计算，并给出了一算例。     

Fast locking delay-locked loop using initial delay measurement

A delay-locked loop (DLL) architecture capable of incorporating fast locking and low jitter features simultaneously is reported. A test chip was fabricated in a 0.6 μm CMOS process to prove its functionality. The proposed DLL can align the internal clock to the external reference clock within two cycles and maintain its locking state with the aid of feedback operation