Water‐Stable,Magnetic Silica–Cobalt/Cobalt Oxide–Silica Multishell Submicrometer Spheres

A method to produce monodisperse magnetic composite spheres with diameters from less than 100 nm to more than 1 μm in water solution is reported. The spheres consist of a dielectric silica core and a cobalt/cobalt oxide shell which can be protected from further oxidation with an outer shell of silica or, alternatively, they can be covered with the polymer polyvinylpyrrolidone as a stabilizer. The formation of a uniform magnetic shell proceeds with the adsorption of metallic cobalt seeds, produced by the reduction of cobalt chloride with sodium borohydride, on a self‐assembled layer of polyelectrolytes on the silica core. In the second step, an outer silica shell can be formed by the hydrolysis and condensation of (3‐aminopropyl)trimethoxysilane and tetraethoxysilane. The double‐shell composite spheres show excellent sphericity, monodispersity, and a magnetic hysteresis loop at room temperature.     

Matrix extensions and eigenvalue completions, the generic case

In this paper we provide new necessary and sufficient conditions for the so-called eigenvalue completion problem.

     

Quantitative electron probe microanalysis for the characterization of thin carbon-boron layers in fusion devices

Summary The first wall of the fusion device TEXTOR at the Forschungszentrum Jülich has been coated in situ with an amorphous hydrogen rich carbon/boron film (a-C/B:H) which reduces plasma impurities caused by the plasma surface interaction. The results of the coating process of the 35 m² large inner wall surface have been controlled by a recently developed modification of the quantitative electron probe microanalysis, which has been applied to 12 samples from specified positions inside the tokamak. The quantification itself is based on a Monte Carlo simulation of electron trajectories providing very accurate results for X-ray intensities emitted by elements present in the electron bombarded sample. The Monte Carlo results are used in the present work to calibrate the measured X-ray intensities emitted by boron and carbon from the a-C/B:H layers deposited on pure silicon substrates. As a result the total deposited mass of the layer per area unit as well as the composition of the layers (except hydrogen) could be determined very accurately. The relative errors were less than 7%. The limit of detectability were found to be in the range of one monolayer for boron as well as for carbon.     

Analysis of semiconducting materials by high-resolution radiofrequency glow discharge mass spectrometry

The analytical capabilities of a high-resolution mass spectrometer in combination with a 13.56 MHz glow discharge ion source for the analysis of semiconducting materials (silicon carbide and gallium arsenide) were studied. It was shown that single positively charged ions of sample material have about 10 eV higher average energy than the ions of the discharge and residual gas. Therefore effective energy separation of the ions of analyte from the ions of the discharge and residual gas was achieved by adjusting the ion transfer optics (breadth and position of energy slit), which improves the analytical capabilities of the developed method.Some analytical applications are presented to illustrate the performance of r.f. GDMS for the bulk analysis of semiconducting materials. The results of the trace element analysis of gallium arsenide and silicon carbide samples are compared with data of independent methods (LIMS, ICP-AES, SIMS).Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthdayOn leave from the Institute of Inorganic Chemistry, 630090 Novosibirsk, Russia