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51.
Novel applications of the technique of optically detected cyclotron resonance (ODCR) are discussed. This method is an extension of the conventional cyclotron resonance investigations and shows important advantages when applied to characterization of semiconductor materials. These advantages are due to a higher sensitivity and a longer momentum relaxation time caused by photoneutralization of ionized impurities. This in turn enables experiments at lower magnetic fields and lower microwave radiation frequency. Photoexcitation used in ODCR often results in a simultaneous observation of electron and hole cyclotron resonances in the same sample, which is a rare case in a conventional CR study. High magnetic field far infrared ODCR experiments utilize all these advantages of the method. For the most common X-band (10 GHz) microwave setups, the ODCR resolution often is too low to allow accurate CR determination of the band structure parameters of the material studied. In that case, ODCR may be used for high-resolution photoluminescence experiments and for identification of carrier capture and recombination paths at impurities, as was proposed recently. These new and important applications of the ODCR technique are described here, and documented by recent experimental results. The mechanism of ODCR detection for pure and doped semiconductors is discussed, and a prominent role of the impact ionization mechanism is demonstrated. This is followed by a discussion of recent applications of ODCR for identification of recombination mechanisms. Then high spectral resolution ODCR experiments are described, with the example of overlapping free-to-bound and donor-acceptor pair transitions. Some special applications of ODCR are demonstrated. ODCR also can be applied to analyze quantum confinement of carriers in two-dimensional (2D) structures such as heterojunctions and quantum wells. It is shown that useful information can be obtained on the electronic properties of the 2D electron (or hole) gas and the interlayer carrier transfer enhanced by carrier heating at CR absorption in such structures.  相似文献   
52.
The open-circuit voltage of about 600 mV developed by 0.1 ohm-cm silicon solar cells under air mass zero illumination is about 100 mV less than voltages predicted from simple diffusion theory. The lower measured voltages appear to be controlled by junction current transport processes associated with the thin top diffused layer. Mechanisms such as low n+ layer minority carrier lifetime and bandgap narrowing due to heavy doping effects (HDE) have been suggested to explain these results. Experimental determinations of the properties of the diffused layer are required to assess which of these mechanisms predominate. While direct measurement is difficult, an indirect measurement methodology exists by which the lifetime or transit time in the diffused layer can be obtained. Nine p-type, 1×2 cm, 〈111〉 orientation silicon wafers were phosphorus diffused at 880°C for 45 minutes using P0Cl3. Open-circuit voltages of 595-612 mV, typical of all 0.1 ohm-cm cell voltages, were obtained. From the open-circuit voltage and short-circuit current, the diffusion controlled I0 was obtained. In addition to illuminated I-V characteristics, the time constants from the Open-Circuit Voltage Decay method, and the minority carrier diffusion lengths in the base region were measured. The base region charge was determined using the base region diffusion length measured by an X-ray method. The data from these experiments combined with simple theory can imply the minority carrier time constant and the excess charge in the diffused layer. From this, certain conclusions are drawn about the relative roles of bandgap shrinkage and recombination rates in the diffused layer.  相似文献   
53.
The role of interface between molecular material and electrode on currents and photocurrents is considered. Mechanisms of charge carrier injection, electrode recombination and transport are discussed. Particularly thermal, excitonic, photo and tunneling injection of charge carriers, diffusion in presence of image force, interface barrier between electrode and organic materials and two organic materials, non-uniformity of electrodes and other phenomena on charge carrier injection are considered. The data presented in the review which complete theoretical considerations have been taken from previous as well as current literature. The considered phenomena are very important for the analysis of many practical problems for molecular electronic devices such as rectification of current, organic transistors, electroluminescence, photovoltaic effects and some similar problems.  相似文献   
54.
A unified approach to the synthesis of the series of higher acenes up to previously unreported undecacene has been developed through the on‐surface dehydrogenation of partially saturated precursors. These molecules could be converted into the parent acenes by both atomic manipulation with the tip of a scanning tunneling and atomic force microscope (STM/AFM) as well as by on‐surface annealing. The structure of the generated acenes has been visualized by high‐resolution non‐contact AFM imaging and the evolution of the transport gap with the increase of the number of fused benzene rings has been determined on the basis of scanning tunneling spectroscopy (STS) measurements.  相似文献   
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56.
The development of electronics devices based on organic materials presents one of the most exciting challenges in XXI science. Already products based on organic thin films are in the market place, however the initial work in development of molecular-scale electronics has been done. The purpose of this review is to provide a general information about electronics devices incorporating organic materials and organic molecules acting as simple electronics devices.  相似文献   
57.
In this paper, we address the issue of cellular OFDMA network dimensioning. Network design consists of evaluating cell coverage and capacity and may involve many parameters related to environment, system configuration, and quality of service (QoS) requirements. In order to quickly study the impact of each of these parameters, analytical formulas are needed. The key function for network dimensioning is the Signal to Interference Ratio (SIR) distribution. We thus analyze in an original way the traditional issue of deriving outage probabilities in OFDMA cellular networks. Our study takes into account the joint effect of path-loss, shadowing, and fast fading effects. Starting from the Mean Instantaneous Capacity (MIC), we derive the effective SIR distribution as a function of the number of sub-carriers per sub-channel. Our formula, based on a fluid model approach, is easily computable and can be obtained for a mobile station (MS) located at any distance from its serving base station (BS). We validate our approach by comparing all results to Monte Carlo simulations performed in a hexagonal network, and we show how our analytical study can be used to analyze outage capacity, coverage holes, and network densification. The proposed framework is a powerful tool to study performances of cellular OFDMA networks (e.g. WiMAX, LTE).  相似文献   
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59.
Abstract

We study efficiency of autoionization and recombination transitions for europium in CaxCd1-xF2 host lattice depending on the energy level position of Eu2+ 4f65d1(e) excited states in respect to the conduction band (CB) states. From photoluminescence (PL) and absorption measurements we conclude that for x in the range of 1 - 0.65 thermalization within the 4f65d1(e) multiplet is faster than the appropriate autoionization transition. For x > 0.65, when all the excited 4f65d1 states are degenerate with the CB autoionization is immediate, Eu2+ intra-ion emission is quenched and a new Eu-related emission appears, which we tentatively assign to a radiative capture emission of hot nonequilibrium electrons.  相似文献   
60.
We investigate a model of self-interacting field of linear frames on the product manifold M × G, where G is a semisimple Lie group acting freely and transitively on a manifold M. We find two families of solutions of the Euler-Lagrange equations for the field of frames.  相似文献   
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