Erratum: Yan Guo. Boltzmann diffusive limit beyond the Navier‐Stokes approximation,Communications on Pure and Applied Mathematics (2006) 59(5) 626‐687

The original article to which this erratum refers was published in Communications on Pure and Applied Mathematics Comm Pure Appl Math(2006)59(5) 626 .     

纳米累托石-TiO2光催化剂的制备及表征

以TiCl4和累托石为主要原料，制备出纳米累托石-TiO2粉末，并用X-衍射、透射电镜等对其进行表征．结果表明：纳米累托石-TiO2粉末平均直径为17．5nm当焙烧温度从500℃升至800℃时，累托石-TiO2粉末的比表面积从65．7m^2／g下降至3．3m^2／g，单位质量吸附剂的孔体积从0．1430cm。／u降到0．0213cm^3／g；当焙烧温度从300℃上升至500℃时，孔径变化不大，属中孔范围；当焙烧温度升至800℃时，一些孔道出现坍塌，不利于纳米累托石-TiO2粉末的光催化活性．     

Magnetically rotational reactor for absorbing benzene emissions by ionic liquids

A magnetically rotational reactor （MRR） has been developed and used in absorbing benzene emissions. The MRR has a permanent magnet core and uses magnetic ionic liquid [bmim]FeCl4 as absorbent. Benzene emissions were carried by N2 into the MRR and were absorbed by the magnetic ionic liquid. The rotation of the permanent magnet core provided impetus for the agitation of the magnetic ionic liquid, enhancing mass transfer and making benzene better dispersed in the absorbent. 0.68 g benzene emissions could be absorbed by a gram of [bmim]FeCl4, 0.27 and 0.40 g/g higher than that by [bmim]PF6 and [bmim]BF4, respectively. The absorption rate increased with increasing rotation rate of the permanent magnet.     

Electronic structure of CeAl2 thin films studied by X-ray absorption spectroscopy

We report X-ray absorption near edge structures (XANES) study of CeAl₂ thin films of various thicknesses, 40-120 nm, at Al K- and Ce L₃-edges. The threshold of the absorption features at the Al K-edge shifts to the higher photon energy side as film thickness decreases, implying a decreased in Al p-orbital charges. On the other hand, from Ce L₃-edge spectra, we observed a decrease in the 5d4f occupancy as the surface-to-bulk ratio increases. The valence of Ce in these thin films, as revealed by the Ce L₃-edge spectral results, is mainly trivalent. From a more detailed analysis we found a small amount of Ce⁴⁺ contribution, which increases with decreasing film thickness. Our results indicate that the surface-to-bulk ratio is the key factor which affects the electronic structure of CeAl₂ thin films. The above observations also suggest that charge transfer from Al to Ce is associated with the decrease of the film thickness.     

The Second Law of Thermodynamic in Quantum System

The second law of thermodynamics is one of the most fundamental and for-reaching laws of physics. It teaches us that when a closed system undergoes a thermodynamic process the entropy of the system never decreases; it increases, or at least remains constant. If the entropy increases the thermodynamic process is irreversible, otherwise it is reversible. Only ideal thermal process is reversible. In classical world a great number of facts have proved the second law is true. But in quantum world since the quantum coherence and correlations exist we are not sure the second law is still true, at least in principle. This is because that： 1. on the microscopic level the irreversibility is conflict with the reversibility of all fundamental physical laws ; 2. there are not enough evidences to show it is true in quantum world.     

Mn位W掺杂对La0.3Ca0.7MnO3体系磁结构的影响

通过对La0.3Ca0.7Mn1-xWxO3(x=0.00,0.04,0.08,0.12,0.15)多晶样品M-T曲线、M-H曲线及ESR谱的测量,研究了Mn位W掺杂对电荷有序体系La0.3Ca0.7MnO3磁结构的影响.结果表明,当掺杂量为0.00≤x≤0.08时,体系存在电荷有序(CO)相,AFM/CO态共存于相变温度以下,电荷有序温度TCO随着W掺杂量的增加而增加;x=0.04时,样品在低温下为FM相与AFM/CO相共存,在CO相建立前、后均有FM从PM中分离出来;当x≥0.12时,CO态融化,在极低温度下存在顺磁-铁磁(PM-FM)相变.     

Some Results behind Dividend Problems

We consider the basic dividend problem of the compound Poisson model with constant barrierstrategy.Some results concealed behind the dividend problem are made explicit in the present work.Differentmethods and some of which are firstly given in this paper.All these results presented certain direct relationshipbetween some important actuary variables in classical risk theory is also revealed.     

Pad effects on material-removal rate in chemical-mechanical planarization

The role of a porous pad in controlling material-removal rate (MRR) during the chemical-mechanical planarization (CMP) process has been studied numerically. The numerical results are used to develop a phenomenological model that correlates the forces on each individual abrasive particle to the applied nominal pressure. The model provides a physical explanation for the experimentally observed domains of pressure-dependent MRR, where the pad deformation controls the load sharing between active-abrasive particles and direct pad-wafer contact. The predicted correlations between MRR and slurry characteristics, i.e., particle size and concentration, are in agreement with experimentally measured trends reported by Ouma¹ and Izumitani.²     

只读式超分辨光盘的膜层设计和分析

超分辨技术是一种无需减小记录波长或增大数值孔径而提高存储密度的方法。Ge Sb Te是一种良好的相变光存储材料 ,在超分辨光盘中可作为掩膜。利用多层膜反射率的矩阵法计算了掩膜为Ge2 Sb2 Te5薄膜的超分辨只读式光盘的光学参数与各膜层厚度之间的关系 ,最后得到了较为理想的膜层厚度匹配。采用磁控溅射法制备了只读式超分辨光盘 ,测量了光盘的光学性质。     

求幂级数收敛半径的方法

指出了文 [1 ]中一个考研题的错误解法 ,并给出求幂级数收敛半径的几种方法