纳米β-Ni(OH)2与球型Ni(OH)2的热性能比较研究

用配位沉淀法合成出纳米级Ni（OH）2，并对其进行XRD，TEM，DSC分析，分析结果表明，所得纳米β-Ni（OH）2为可用作电极材料的β-Ni（OH）2，粒径为30－40nm，且热分解温度比普通球镍低10℃左右，摩尔分解热比普通球镍低4－7kJ，从理论上分析了产生此现象的原因。     

Recent Developments in Synchrotron Mössbauer Reflectometry

Hyperfine Interactions - Synchrotron Mössbauer Reflectometry (SMR), the grazing incidence nuclear resonant scattering of synchrotron radiation, can be applied to perform depth-selective phase...     

复Finsler流形上的Koppelman-Leray-Norguet公式

利用不变积分核(Berndtsson核),复Finsler度量和联系于Chern-Finsler联络的非线性联络,研究复Finsler流形上具有逐块光滑C~((1))边界的有界域上(p,q)型微分形式的积分表示,得到了(p,q)型微分形式的Koppelman-Leray-Norguet公式和■-方程的解．作为应用,利用复Finsler度量和联系于Chern-Finsler联络的非线性联络,给出了Stein流形上具有逐块光滑C~((1))边界的有界域上(p,q)型微分形式的Koppelman- Leray-Norguet公式以及■-方程的解,并且得到了Stein流形上实非退化强拟凸多面体上(p,q)型微分形式的积分表示式和■-方程的解．     

Anisotropic alpha-emission in the223Ra decay chain

Anisotropic α-emission from nuclei in the decay chain from²²³Ra to²⁰⁷Tl has been observed using low temperature nuclear orientation in combination with high resolution α-detection at 4.2 K. Information on partial wave amplitudes as well as hyperfine interactions has been extracted.     

Parallel feedforward class-AB control circuits for low-voltage bipolar rail-to-rail output stages of operational amplifiers

A new family of class-AB control circuits for bipolar rail-to-rail output stages of operational amplifiers is presented. Step by step, we report the development of five simple class-AB control circuits showing the advantages of using parallel feedforward. The circuits have been designed in such a way that temperature, supply voltage and process parameters have little influence. To test the output stages, one of them has been implemented in a very simple two-stage operational amplifier on a semi-custom chip. Measurements show a bandwidth of 2.5 MHz, a gain of 40 dB, a quiescent current of 23µA and a maximum output current of 250µA. Simulation results of three other simple operational amplifiers with the new class-AB control circuits are shown, which have a higher gain and maximum output current.     

Electromigration testing of integrated circuit interconnections

The electromigration phenomenon has been one of the most intriguing physical problems in the semiconductor device reliability. The models to explain the phenomenon are here revised, together with the influence of materials and their microstructure. The various measuring techniques are described, including the design of special test patterns, and statistical data analysis is briefly reviewed.     

Turbulence modelling of the shear layers in the trailing edge region of a modern rear-loaded airfoil at incidence

After carefull analysis in a turbulent zero-pressure gradient flow, various simple algebraic turbulence models were applied to the almost separated flow on the upperside of an airfoil at incidence. The Johnson-King and Horton non-equilibrium (or rate equation) models give clearly improved results.     

Lifetime study of high-spin states in 104,105In

In the neutron deficient isotopes _104,105In lifetimes of high spin states in the range from 0.5 ps to 600 ps have been measured in a coincidence recoil distance Doppler shift (RDDS) experiment. By combining the Doppler shift attenuation (DSA) and RDDS methods at few μm flight distances, the problem of delayed feeding has been avoided and very short lifetimes in the range 0.5–0.8 ps have been determined. Shell model calculations with strong restrictions for the neutron orbitals reveal good agreement with experimental level energies and still fair agreement for most measured B(M1) and B(E2) values. Received: 30 June 1998