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181.
A. Ivanov 《Journal of Electronic Testing》2002,18(4-5):361-362
182.
Generation of Technology-Independent Retargetable Analog Blocks 总被引:1,自引:0,他引:1
R. Castro-López F. V. Fernández F. Medeiro A. Rodríguez-Vázquez 《Analog Integrated Circuits and Signal Processing》2002,33(2):157-170
This paper introduces a complete methodology for retargeting of analog cells to different sets of specifications. This methodology is technology-independent, thus allowing the migration, from one technology to another, of the circuit under retargeting. Careful integration of the device sizing and layout generation tasks via the incorporation of layout constraints during the sizing process allows to generate fully functional designs in a few minutes. The methodology is illustrated via the retargeting of a fully-differential Miller-compensated two-stage operational amplifier for a new set of specifications and two different technological processes.An erratum to this article can be found at 相似文献
183.
184.
The microstructures of Cu films deposited by the self-ion assisted, partially ionized beam (PIB) deposition technique under
two different accelerating potentials, 0 KeV and 6 KeV, are compared. The 6 KeV film shows a bimodal (111) fiber and (100)
fiber texture with an abundance of twin boundaries and a relatively large average grain size with a typical lognormal distribution.
The 0 KeV film consists of small, mostly (111) oriented grains with islands of abnormally large (100) grains. The controlling
factors for the abnormal growth of the (100) grains are discussed in relation to the observed microstructures, showing that
all factors necessary for abnormal (100) growth are present in the films. 相似文献
185.
Reliability prediction models to support conceptual design 总被引:1,自引:0,他引:1
During the early stages of conceptual design, the ability to predict reliability is very limited. Without a prototype to test in a lab environment or without field data, component failure rates and system reliability performance are usually unknown. A popular method for early reliability prediction is to develop a computer model for the system. However, most of these models are extremely specific to an individual system or industry. This paper presents three general procedures (using both simulation and analytic solution techniques) for predicting system reliability and average mission cost. The procedures consider both known and unknown failure rates and component-level and subsystem-level analyzes. The estimates are based on the number of series subsystems and redundant (active or stand-by) components for each subsystem. The result is a set of approaches that engineers can use to predict system reliability early in the system-design process. Software was developed (and is discussed in this paper) that facilitates the application of the simulation-based techniques. For the specific type of system and mission addressed in this paper, the analytic approach is superior to the simulation-based prediction models. However, all three approaches are presented for two reasons: (1) to convey the development process involved with building these prediction tools; and (2) the simulation-based approaches are of greater value as the research is extended to consider more complex systems and scenarios 相似文献
186.
Integrated chaos generators 总被引:4,自引:0,他引:4
Delgado-Restituto M. Rodriguez-Vazquez A. 《Proceedings of the IEEE. Institute of Electrical and Electronics Engineers》2002,90(5):747-767
This paper surveys the different design issues, from mathematical model to silicon, involved in the design of analog CMOS integrated circuits for the generation of chaotic behavior 相似文献
187.
E. P. Gordov 《Russian Physics Journal》1981,24(11):1039-1041
An evolution operatior is described, which acts on the operators of a problem to take it into the solutions of the corresponding problem of semiclassical electrodynamics.Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 12, pp. 66–69, November, 1981. 相似文献
188.
Ahn Jaeshin Stromsmoe Keith A. Lawson Ronald P. W. 《Industrial Electronics, IEEE Transactions on》1985,(4):405-409
A microprocessor-based system with 32 A/D, 24 D/A, and 16 ac load controllers, has been designed and built to monitor and control an ion beam thin-film deposition system. The A/D and D/A channels have electrical isolation of 7.5 kV between channels and between input and output. The microprocessor system keeps the ion beam deposition parameters stable for extended periods of operation and it is proposed as a means to greatly simplify switching from one deposition species to another to grow thin multilayer or alloy films. 相似文献
189.
A. R. Volkov B. V. Shul'gin T. I. Polupanova V. N. Lebedev A. A. Nagornyi V. L. Petrov Yu. F. Kargin 《Journal of Applied Spectroscopy》1991,54(6):585-590
Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 54, No. 6, pp. 970–975, June, 1991. 相似文献
190.
Dominant nonlinear electric dipole polarizations at the interaction of fundamental and second harmonic waves in centrosymmetric media without and with memory are treated in this paper. The process of forming a permanent spatially periodic quadratic susceptibility grating in the medium with memory is described from the phenomenological point of view.Dedicated to the Czechoslovak Student Movement '89. 相似文献