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稀士元素掺杂单模光纤激光器是一种新颖的有源光纤器件.因其可与常规单模光纤、无源光纤器件(如耦合器、偏振器、滤波器和调制器等)等直接连接,使光源与光纤系统间的耦合损耗减至最小,又可实现全光纤网络.另外,它还可以满足某些光纤传感器在光源性能方面的特殊要求.因此,近年来国内外对这一有源光纤器件的研究工作方兴未艾.本文报道掺钕单模光纤的基础性研究.实验 实验中采用国产掺钕单膜光纤,钦的掺杂浓度为4OOppm,芯径为5.0μm,光纤长度 相似文献
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木材导热系数对木结构建筑能耗精准预测具有重要意义,然而目前文献中的模型难以提供全面而准确的预测工具,且一些机器学习模型所考虑的因素和样本数有限。本文构建1941年至今含多种特征的导热系数数据库,并开发对比神经网络和迁移学习模型的预测精度。结果表明,结合迁移学习后,导热系数预测精度可提升23%以上,且迁移学习性能在0~0.3 W·m-1·K-1上精度提升明显,更适合于木结构等传热应用中。本文通过创新的模型参数微调迁移策略能为小样本、含大量缺失值的数据集和简单网络结构的导热系数预测提供思路。 相似文献
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功率MOS器件在不同温度条件下雪崩特性研究 总被引:1,自引:1,他引:0
本文使用实验和二维器件模拟仿真方法研究了高压功率MOS器件在不同温度条件下的耐雪崩能力。实验研究了国产功率MOS器件在最大额定工作温度范围(-55℃~150℃)发生的雪崩能量烧毁行为。采用包含电热非等温模型的ISE TCAD二维仿真软件模拟分析器件发生雪崩失效的机理。无嵌位电感实验数据及模拟结果证明,由于器件内部寄生效应及热效应影响,功率MOS器件雪崩耐量可靠性随着温度升高而退化,其主要原因与雪崩过程引起器件内部寄生双极管开启相关。 相似文献
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We present a detailed study of a superjunction(SJ) nanoscale partially narrow mesa(PNM) insulated gate bipolar transistor(IGBT) structure. This structure is created by combining the nanoscale PNM structure and the SJ structure together. It demonstrates an ultra-low saturation voltage(V_(ce(sat))) and low turn-off loss(E_(off)) while maintaining other device parameters. Compared with the conventional 1.2 k V trench IGBT, our simulation result shows that the V_(ce(sat))of this structure decreases to 0.94 V, which is close to the theoretical limit of 1.2 k V IGBT. Meanwhile, the fall time decreases from109.7 ns to 12 ns and the E off is down to only 37% of that of the conventional structure. The superior tradeoff characteristic between V_(ce(sat))and E_(off) is presented owing to the nanometer level mesa width and SJ structure. Moreover, the short circuit degeneration phenomenon in the very narrow mesa structure due to the collector-induced barriers lowering(CIBL) effect is not observed in this structure. Thus, enough short circuit ability can be achieved by using wide, floating P-well technique.Based on these structure advantages, the SJ-PNM-IGBT with nanoscale mesa width indicates a potentially superior overall performance towards the IGBT parameter limit. 相似文献
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The ability of high-voltage power MOSFETs and IGBTs to withstand avalanche events under unclamped inductive switching(UIS) conditions is measured.This measurement is to investigate and compare the dynamic avalanche failure behavior of the power MOSFETs and the IGBT,which occur at different current conditions.The UIS measurement results at different current conditions show that the main failure reason of the power MOSFETs is related to the parasitic bipolar transistor,which leads to the deterioration of the avalanche reliability of power MOSFETs.However,the results of the IGBT show two different failure behaviors.At high current mode,the failure behavior is similar to the power MOSFETs situation.But at low current mode,the main failure mechanism is related to the parasitic thyristor activity during the occurrence of the avalanche process and which is in good agreement with the experiment result. 相似文献
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超荧光光纤光源的工作特性 总被引:1,自引:0,他引:1
研制了一种激光二极管泵浦的掺钕超荧光光纤光源,在波长1.08μm处获得了1.0mW的光功率输出,谱线宽度为21.2nm,实验中使用的是掺钕单模光纤,芯径5μm,截止波长1.0μm,其损耗在泵浦波长0.8μm处为1500dB/km,而在输出波长1.08μm处为10dB/km。 相似文献