德鲁德分布非均匀膜的光学特性模拟分析

从德鲁德理论出发,对多元共蒸法镀制的非均匀膜的折射率分布与沉积速率的关系进行了探讨;然后利用计算机辅助模拟,对德鲁德分布非均匀光学薄膜,从单周期和多周期、正变和负变、完整周期和存在半周期几个方面对其光学特性进行了系统分析.研究发现：其透射率的极小值和周期数的关系遵从周期数的三次多项式衰减规律,不同规律的德鲁德分布非均匀膜可用来设计不同功能的滤光片.     

Effect of Microstructure of TiO2 Thin Films on Optical Band Gap Energy

TiO2 coatings are prepared on fused silica with conventional electron beam evaporation deposition. After annealed at different temperatures for four hours, the spectra and XRD patterns of TiO2 thin film are obtained. XRD patterns reveal that only anatase phase can be observed in TiO2 coatings regardless of the different annealing temperatures, and with the increasing annealing temperature, the grain size gradually increases. The relationship between the energy gap and microstructure of anatase is determined and discussed. The quantum confinement effect is observed that with the increasing grain size of TiO2 thin film, the band gap energy shifts from 3.4 eV to3.21 eV. Moreover, other possible influence of the TiO2 thin-film microstructure, such as surface roughness and thin film absorption, on band gap energy is also expected.     

单晶Cu(001)薄膜塑性变形的分子动力学模拟

使用分子动力学方法,模拟研究了单晶Cu(001)薄膜在双向等轴拉伸应变下的塑性变形行为.当应变超过一定值时,样品通过产生位错、层错及孪晶而发生塑性变形.当应变相对较低时,不全位错首先在薄膜表面形核并在密排面上滑移,留下堆积层错;当应变增加时,位错在表面与内部同时成核生长,层错数量也随之增加.分析了相邻滑移面上的位错之间相互作用形成孪晶的微观过程.材料内部形成大量堆积层错及孪晶后,较大孪晶的密排面上的原子也会发生滑移,形成孪晶内部的层错结构以释放残余应力.     

Improving the precision of fluorescence lifetime measurement using a streak camera

Streak camera has high temporal resolution and high sensitivity, and is a powerful tool in biomedical study to measure fluorescence lifetime and perform fluorescence lifetime imaging. However, nonuniformity of the gain in the streak tube and nonlinearity of the sweeping speed limit the precision of fluorescence lifetime measurement, particularly when fluorescence lifetimes are short. We have constructed a two-photon excitation fluorescence lifetime measurement system that is based on a synchroscan streak camera and have developed accordingly a method to correct the effect of gain nonuniformity and nonlinearity of sweeping speed on the measurement precision. A continuous-wave laser of high stability is used to calibrate the gain of the streak camera, and a Fabry-Perot etalon is used to calibrate the nonlinearity of the sweeping speed. Fitting algorithms are used to correct the gain of the streak camera and nonlinearity of the sweeping speed respectively, which significantly improves the measurement precision of the system, as characterized through the fluorescence lifetime of the short-lived fluorescence dye, Rose Bengal. Experimental results show that the measurement fluctuation of the lifetime has been improved from more than 10% to 2% after correcting the effects of gain nonuniformity and sweeping speed nonlinearity.     

制备软X光多层膜的转速控厚法

本文提出了一种新的监控软X光多层膜膜厚的方法——转速控厚法,利用这种方法镀制的设计周期厚度分别为8.4和10nm,周期数达50对和30对的W/C多层膜,经小角X光衍射测试,结果表明周期厚度随机误差在0.1nm左右。     

不同工艺条件下TiO2单层膜的吸收和损伤阈值测试

利用电子束热蒸发技术在不同氧分压和烘烤温度下镀制了一系列TiO2单层膜,采用表面热透镜技术测量了样品在1064nm处的弱吸收值,并用激光损伤测试平台测量了样品的抗激光损伤阈值(LIDT)特性。实验结果表明较高的氧分压和较低的烘烤温度能显著减小薄膜的吸收值。不过薄膜在基频下的损伤阈值除了受到薄膜吸收值的影响外,还取决于基底表面的杂质密度,当薄膜吸收较大时,本征吸收对损伤破坏起到主要作用;随着薄膜的吸收逐渐减小,基底表面处的缺陷吸收逐渐取代本征吸收成为影响薄膜损伤阈值的主导因素。     

CMFB-DWMT多载波系统与DMT多载波系统的比较

本文首先讨论了基于余弦调制滤波器组（cosine modulation filter-banks-CMFB)的多载波调制解调结构的快速实现。然后在性能和抗噪方面对CMFB多载波结构与DMT（discretemulti-tone)作了分析和比较。计算机仿真结果显示，CMFB－DWMT(discrete wavelet multi-tone）在左频域特性、抑制噪声和抑制突发错误方面比DMT有较大的优势。     

光波在具有柱状结构的双折射薄膜中的传输特性

根据电磁场理论的矩阵分析方法推导了光波在具有柱状结构的双轴薄膜中的反射系数、透射系数和相位关系等光学特性.这些关系包含了界面处的多点反射,可以推广到一般的各向异性的多层膜系统.给出了各向同性入射媒质-双轴各向异性膜层-各向同性基底薄膜系统的计算结果,验证了该计算方法的可行性,为双折射多层膜结构及其器件的理论分析和设计提供了理论参考.     

软件无线电发射机的FPGA实现

本文以软件无线电理论为指导,以π/4DQPSK调制为特例,重点介绍了软件无线电发射机数字信号处理部分在FPGA上的实现,主要包括数据映射、成形滤波、CIC插值滤波和NCO等。在设计上使用了基于多相滤波和单MAC的成形滤波器及高效CIC插值滤波器,使性能和资源占用率获得了较好的突破。与专用芯片相比,用FPGA实现的软件无线电发射机更具灵活性。     

Preparation of high performance thin-film polarizers

<正>The optical performance of thin film polarizers is highly sensitive to the layer thicknesses of thin film.The thicknesses of the sensitive layers are optimized in order to gain broader polarizing zone in such case when the total layer thickness does not increase.An automatic layer thickness control system is established,and errors caused by different monitoring methods are analyzed.With this thickness control system,thin-film polarizers with T_p higher than 98%and T_p/T_s higher than 200:1(T_p and T_s are transmissions for p- and s-polarizations,respectively) with the bandwidth of 11 nm are prepared.Using the system allows for optimum repeatability of three successive runs.