基于曲线拟合技术位移监测仪的研制

详细介绍了曲线拟合技术在利用霍尔传感器监测位移系统中的应用。主要分析曲线拟合的理论方法,利用Matlab给出了传感器中电压变化与位移的拟合多项式模型。实测出拟合模型在系统中的变化曲线,从而验证曲线拟合技术的可靠性及实用性。     

Band Structures of Ultrathin Bi(110) Films on Black Phosphorus Substrates Using Angle-Resolved Photoemission Spectroscopy

The band structures of two-monolayer Bi(110) films on black phosphorus substrates are studied using angleresolved photoemission spectroscopy. Within the band gap of bulk black phosphorus, the electronic states near the Fermi level are dominated by the Bi(110) film. The band dispersions revealed by our data suggest that the orientation of the Bi(110) film is aligned with the black phosphorus substrate. The electronic structures of the Bi(110) film strongly deviate from the band calculations of the free-standing Bi(110) film, suggesting that the substrate can significantly affect the electronic states in the Bi(110) film. Our data show that there are no non-trivial electronic states in Bi(110) films grown on black phosphorus substrates.     

XRF技术在无铅化工艺产品分析中的应用

介绍了XRF技术对无铅化产品和无铅化工艺中铅的快速无损分析的原理及其在实际检测中的应用. 采用自行研制的XRF-1000X射线荧光仪对无铅焊料及镀层进行快速无损分析, 其过程简单、结果准确、精度高.