利用水平热壁CVD法生长的3C-SiC/Si的均匀性

利用新改进的水平低压热壁CVD设备,改变生长时的压力和H2流速,在50mm的Si(100)和(111)衬底上获得了3C-SiC外延膜,并对外延膜的结构均匀性、电学均匀性和厚度均匀性进行了分析.X射线衍射图中出现了强的3C-SiC的特征峰,其中3C-SiC的(200)和(111)峰的半高宽分别为0.41°和0.21°.3C-SiC外延膜方块电阻的均匀性最好可达2.15%.厚度均匀性可达±5.7%(σ/mean值).     

一种基于RTD和HEMT的单片集成逻辑电路

介绍了一种基于共振隧穿二极管(RTD)和高电子迁移率晶体管(HEMT)的单片集成电路.采用分子束外延技术在GaAs底层上重叠生长了RTD和HEMT结构.RTD室温下的峰谷电流比为5.2∶1,峰值电流密度为22.5kA/cm2.HEMT采用1μm栅长,阈值电压为-1V.设计电路称为单稳态-双稳态转换逻辑单元(MOBILE).实验结果显示了该电路逻辑运行成功,运行频率可达2GHz以上.     

Stackable luminescent device integrating blue light emitting diode with red organic light emitting diode

We present a novel stackable luminescent device integrating a blue light emitting diode(LED)with a red organic LED(OLED)in series.The anode of the OLED is connected with the cathode of the LED through a via in the insulation layer on the LED.The LED–OLED hybrid device is electroluminescent and two electroluminescence(EL)peaks(the blue peak around 454 nm and the red peak around 610 nm)are observed clearly.The effect of the indium tin oxide(ITO)layer on the device performance is analyzed.Compared with the individual LED and OLED,their combination shows great potential applications in the field of white lighting,plant lighting,and display.     

InP基共振遂穿二极管器件（RTD）研究

我们在实验中对InGaAs/AlAs/InP共振遂穿二极管（RTD）材料结构进行了优化设计,并用MBE设备在(100)半绝缘InP单晶片上生长了RTD外延材料。我们采用电子束光刻工艺和空气桥互连技术,制作了InP基RTD器件。并在室温下测试了器件的电学特性：峰值电流密度24.6kA/cm2,峰谷电流比(PVCR)为8.6。     

Period Continuous Tuning of an Efficient Mid-Infrared Optical Parametric Oscillator Based on a Fan-out Periodically Poled MgO-Doped Lithium Niobate

We report a period continuously tunable, efficient, mid-infrared optical parametric oscillator （OPO） based on a fan-out periodically poled MgO-doped congruent lithium niobate （PPMgLN）. The OPO is pumped by a Nd：YAG laser and a maximum idler output average power of 1.65W at 3.93μm is obtained with a pump average power of 10.5W, corresponding to the conversion efficiency of about 16% from the pump to the idler. The output spectral properties of the OPO with the fan-out crystal are analyzed. The OPO is continuously tuned over 3.78-4.58μm （idler） when fan-out periods are changed from 27.0 to 29.4μm. Compared with temperature tuning, fan-out period continuous tuning has faster tuning rate and wider tuning range.     

MBE生长高质量GaAs／AlGaAs量子阱激光器

我们利用分子束外延方法研制了ＧａＡｓ／ＡｌＧａＡｓ缓交折射率分别限制（ＧＲＩＮ－ＳＣＨ）单量子阱和双量子阱激光器．对腔长为６００μｍ的端面不镀膜的宽接触条型Ｆ－Ｐ腔激光器，阈值电流密度（平均值）分别为２９０Ａ／ｃｍ２和２４０Ａ／ｃｍ２．腔长在１２００μｍ的双量子阱激光器的阈电流密度低达１９０Ａ／ｃｍ２．对出光面和背面分别镀以增透膜和高反膜的宽接触条型（８０μｍ）．激光器，线性输出功率高达１．８２Ｗ；出光面的斜率效率达到１．０４Ｗ／Ａ；利用湿法化学腐蚀所制备的脊形波导结构单量子阱激光器阈值电流最低可达８ｍＡ     

自组织量子点的优化生长

在不同生长条件下,生长低组分InGaAs/GaAs自组织量子点并且使用接触式AFM进行测量.通过对生长条件的优化,得到高密度、高均匀性的量子点MBE生长条件,这对于自组织量子点在器件方面的应用,比如量子点红外探测器和量子点激光器,是非常重要的.同时,还与优化的InAs/GaAs生长条件进行了比较.     

Si(100)衬底上n-3C-SiC/p-Si异质结构研究

利用LPCVD方法在Si(100)衬底上获得了3C-SiC外延膜,扫描电子显微镜(SEM)研究表明3C-SiC/p-Si界面平整、光滑,无明显的坑洞形成。研究了以In和Al为接触电极的3C-SiC/p-Si异质结的I-V,C-V特性及I-V特性的温度依赖关系,比较了In电极的3C-SiC/p-Si异质结构和以SiGe作为缓冲层的3C-SiC/SiGe/p-Si异质结构的I-V特性,实验发现引入SiGe缓冲层后,器件的反向击穿电压由40V提高到70V以上。室温下Al电极3C-SiC/p-Si二极管的最大反向击穿电压接近100V,品质因子为1.95。     

Growth and Annealing Study of Mg-Doped AlGaN and GaN/AlGaN Superlattices

Mg-doped AlGaN and GaN/AlGaN superlattices are grown by metalorganic chemical vapour deposition （MOCVD） Rapid thermal annealing （RTA） treatments are carried out on the samples. Hall and high resolution x-ray diffraction measurements are used to characterize the electrical and structural prosperities of the as-grown and annealed samples, respectively. The results of hall measurements show that after annealing, the Mg-doped AIGaN sample can not obtain the distinct hole concentration and can acquire a resistivity of 1.4 ×10^3 Ωcm. However, with the same annealing treatment, the GaN/AlGaN superlattice sample has a hole concentration of 1.7 × 10^17 cm-3 and a resistivity of 5.6Ωcm. The piezoelectric field in the GaN/AlGaN superlattices improves the activation efficiency of Mg acceptors, which leads to higher hole concentration and lower p-type resistivity.     

V／III比和生长温度对RF-MBE InN表面形貌的影响

由于生长InN所需平衡氮气压较高，而且InN分解温度比较低，因此在生长InN时In原子很容易在表面聚集形成In滴，使InN外延膜的表面形貌变差，影响InN外延膜质量的提高. 通过研究V／III比和生长温度对RF-MBE生长InN外延膜表面形貌的影响，发现V／III比和生长温度对InN外延膜表面In滴的量有重要影响. 通过选择合适的V／III比和生长温度，得到了表面平整光亮、无In滴的InN外延膜.