云计算网络中边界节点识别方法改进研究

目前,云计算网络为人们的生产和生活提供了各种应用和服务,网络边界节点的识别问题一直较难解决。传统的网络中边界节点类型复杂,边界部署成本高,较多感知模型和静态场景难以实现。为此,提出一种改进的云计算网络中边界节点识别方法,通过制定边界部署规则确定边界节点部署数量及要求,对边界节点感知漏洞进行修补,保证边界节点对网络区域内的全覆盖识别,最后设计出云计算网络识别模型,实现了云计算网络中边界节点正确识别。仿真实验表明,提出的边界节点识别方法在稳定性、识别率和识别数量上都比传统方法有优越性,具有应用价值。     

Study of nanocrystalline VO2 thin films prepared by magnetron sputtering and post-oxidation

Nanocrystalline VO2 thin films were deposited onto glass slides by direct current magnetron sputtering and postoxidation. These films undergo semiconductor-metal transition at 70°C, accompanied by a resistance drop of two magnitude orders. The crystal structures and surface morphologies of the VO2 films were characterized by x-ray diffraction (XRD) and atomic force microscope (AFM), respectively. Results reveal that the average grain size of VO2 nanograins measured by XRD is smaller than those measured by AFM. In addition, Raman characterization indicates that stoichiometric VO2 and oxygen-rich VO2 phases coexist in the films, which is supported by x-ray photoelectron spectroscopy (XPS) results. Finally, the optical properties of the VO2 films in UV-visible range were also evaluated. The optical band gap corresponding to 2p-3d inter-band transition was deduced according to the transmission and reflection spectra. And the deduced value, E opt2p-3d = 1.81 eV, is in good agreement with that previously obtained by theoretical calculation.     

基于摩擦声发射信号的磨削表面粗糙度在线检测方法研究

利用摩擦产生的声发射(AE)信号的功率谱密度对磨削表面粗糙度进行在线评价．实测结果表明，AE信号的功率谱密度与外圆磨削表面粗糙度之间存在很好的映射关系，利用随机信号分析的经典估计理论建立的这种映射关系可用于外圆磨削表面粗糙度的在线检测．     

Structural Variation and Its Influence on the 1/f Noise of a-Si_(1-x)Ru_x Thin Films Embedded with Nanocrystals

The structural variation and its influence on the 1/f noise of a-Si_(1-x)Ru_x thin films are investigated by Raman spectroscopy,transmission electron microscopy, and low frequency noise measurement. The Ru atoms are introduced into the amorphous silicon thin films by rf magnetron co-sputtering. Ru2 Si nanocrystals are found in the as-deposited samples. It is shown that the 1/f noise of the films can be reduced by a slight doping with Ru atoms. Moreover, both the microstructure and the 1/f noise performance of a-Si_(1-x)Ru_x thin films could be improved through a high-temperature annealing treatment.     

Properties of One-Dimensional Highly Polarized Fermi Gases

Using both the exact Bethe ansatz method and the variational method, we study properties of the one-dimensional Fermi polaron. We focus on the binding energy, effective mass, momentum distributions, Tan contact and correlation functions. As the attraction increases, the impurity is more tightly bound and correlated with the surrounding particles, and the size of formed polaron decreases. In addition, compared with the Bethe ansatz method, the variational method is totally qualified to study the one-dimensional Fermi polaron. The intrinsic reason is that the number of particle-hole excitations in a Fermi sea, caused by a single impurity, is always rather small. The variational method can be well extended to other impurity systems.     

CdZnTe晶体热激电流谱分析

热激电流谱测试技术(TSC)是宽禁带半导体深能级缺陷非常有效的测试方法,能够精准获得缺陷类型,深度(E_a,i),浓度(N_ｉ)以及俘获截面(σ_ｉ)等重要物理信息。研究了基于变升温速率的Arrhenius公式作图法和同步多峰分析法(SIMPA)对热激电流谱数据处理的差异及影响规律。结果表明,Arrhenius公式作图法在陷阱能级深度确认方面较为准确,但需要通过多次变升温速率提高其准确性,实验操作周期较长,并且无法分解热激电流谱峰重叠的情况。相比之下,同步多峰分析法能够通过单次温度扫描的数据处理得到E_a,i,N_i及σ_i等陷阱参数,所需实验周期较短。但β,E_a,i,σ_i和载流子迁移率寿命积(μt)等参数的选择对谱峰的位置,幅值及峰宽影响较大。初值的设定对拟合结果和数据吻合程度影响显著。此外,红外透过成像结果表明,头部样品Te夹杂相的浓度较低且呈现明显的带状分布,而尾部样品夹杂相浓度呈均匀分布。通过对比不同样品的热激电流谱测试结果发现,尾部样品浅能级陷阱浓度远高于头部样品,且其低温光电导弛豫过程呈现明显的曲线变化规律。这一研究结果表明,Te夹杂相的分布及浓度可能会导致晶体内部浅能级缺陷的浓度变化,并且浅能级缺陷对光激发载流子的俘获时间更长,去俘获时间更短。     

尖端放电紫外光谱特性仿真分析及验证

尖端放电是物体尖锐处产生的一种放电现象,它属于一种电晕放电,在避雷针、静电除尘等技术中有着广泛应用。目前对尖端放电的研究主要集中在放电强度方面,而对其光谱方面的研究并不多,研究发现尖端放电在紫外波段具有强烈的辐射。利用Comsol软件对尖端放电的电离特性进行仿真,结合数学物理模型分析了放电辐射光谱及辐射强度,发现其辐射强度随时间的变化先增加后减小,并可根据N2+的分布强度估算紫外波段的辐射强度。通过研制一套紫外面阵多光谱成像系统,对尖端放电进行了三个紫外光谱通道的成像,实验结果表明,尖端放电的辐射光谱在240～340 nm波段之间都有分布,且在315～340 nm之间分布最强。同时得到尖端放电的紫外辐射强度随着尖端距离的增加而减小,并与成像积分时间成一定的线性关系。发现在同一通道,线性斜率随尖端距离的增加而减小。通过对尖端放电三个紫外光谱通道的成像码值反演成辐射能量,得到辐射能量与尖端距离,尖端电压以及积分时间之间的关系,验证了尖端放电的数学物理模型,为深入研究尖端放电的紫外特性提供了有力的支撑依据。     

荧光染料超薄层对有机电致发光器件发光光谱的影响

采用在主体材料上蒸镀一层超薄层的方法,研究了三种有机小分子荧光染料dimethylquinacridon(DMQA)、4-(dicyanomethylene)-2-t-butyl-6-(1,1,7,7-tetramethy ljulolidyl-9-enyl)-4-pyran(DCJTB)和5,6,11,12-tetraphenylnaphthacene(Rubrene)的浓度效应对有机电致发光器件(OLED)电致发光光谱的影响。结果表明,与常规掺杂器件相比,染料超薄层器件的光谱中出现了微弱的主体材料的发光峰,浓度猝灭现象更为明显。三种染料的浓度猝灭程度从高到低依次为DMQA、DCJTB和Rubrene。同时,我们使用此三种染料配制了溶液,测试了它们在不同浓度下的光致发光光谱强度,进一步探讨了掺杂剂浓度猝灭强弱与器件的发光光谱特性的关系。     

成像型速度干涉仪

 介绍了应用于超高压条件下的成像型速度干涉仪技术的光路结构和基本原理,该技术在传统速度干涉仪技术的基础上进行了改进,将收光部分改为成像系统,记录系统使用条纹相机,从而能够诊断高速冲击波信号。给出了全系统的光路图,提出了各分系统的参数要求。针对系统硬件,给出了探针光源、成像系统的基本参数,给出了三点支撑干涉仪的设计图,分析了记录系统的基本参数。对于静态实验,拍摄了静态靶的照片,并对静态靶照片进行了初步的分析：发现可以通过条纹对比度的变化初步判断像与靶的对应程度。     

VISAR准零程差调试方法研究

介绍了任意反射面速度干涉仪(VISAR)中马赫-曾德干涉仪必须满足的准零程差条件.根据白光光程差调试精度高但不易相干的特点,提出了先利用激光粗调,再利用白光调试来实现零程差精密调节的方案.详细分析了激光粗调马赫-曾德干涉仪的调试原理、调试精度以及光程差不确定性.针对光程差不确定性,提出了改进的激光粗调方案,将光程差调节精度由毫米量级提高到微米量级,大大减小了白光调试的盲区,使白光精调变得简易可行.干涉仪最终光程差调试精度为1.6 μm.