ZnCdse-ZnSe多量子阱中的激子发光

在77-300K温度下研究了Zn_1-xCd_xSe-ZnSe多量子阱(MQWs)的光致发光特性.首次在77K,Ar离子激光器的457.9nm激发下,在Zn_0.68Cd_0.32Se-ZnseMQWs中观测到5个发光带,其中三个发光带被归因于不同的激子发射:即n=1重空穴(HH)激子;n=l轻-重空穴(LH)激子和n=IHH激子同时发射两个纵光学声子的复合发光,并且n=1HH激子发光可延续至室温.     

ZnSe－CdZnse多量子阱光双稳器件的研制

本文采用电化学选择性腐蚀工艺对ＧａＡｓ衬底蚀孔，在其上获得了大面积具有光滑表面的Ⅱ－Ⅵ族半导体多量子阱外延膜．通过在其表面蒸镀反射膜，制成了高质量的Ｆ－Ｐ腔，制备出ＺｎＳｅ－ＣｄＺｎＳｅ多量子阱Ｆ－Ｐ腔光双稳器件．     

ZnSe单晶质量对其高密度激发发光的影响

用经多次提纯ZnSe原料生长的ZnSe单晶在77K和高密度光激发下观测到了激子-激子(Ex-Ex)散射的P带,随激发密度增加,P带强度增加较快。而在通常的原生ZnSe单晶中只能观测到一个与激子-载流子(Ex-e)散射的Es''带,观测不到P带。经熔融锌中热处理的ZnSe单晶,在上述激发条件下,也观测到了P带。而且此带强度随热处理时间增加而增强。实验表明,P带的产生不仅与激发密度和温度有关,而且还与单晶质量有关。     

自旋电子学及其器件应用

介绍了近年来自旋电子学研究概况及器件应用，并展望了半导体自旋新器件的研究和发展。     

生长在p-GaAs衬底上的ZnO基异质结二极管电致发光(英文)

利用等离子体辅助分子束外延在p型砷化镓衬底上制备了ZnO异质结发光二极管。实验表明:GaAs与ZnO之间的氧化镁绝缘层能够有效改善器件光电性能,I-V特性的研究表明该器件具有良好的整流特性,开启电压为3 V,电致发光光谱由一个紫外发光峰和一个可见发光带构成,其来源分别为ZnO层中近带边缺陷以及深能级缺陷相关的辐射复合。     

Compositional and Structural Properties of TiO2-xNx Thin Films Deposited by Radio-Frequency Magnetron Sputtering

TiO2-xNx thin films are deposited onto Si（100） and quartz substrates by arf magnetron sputtering method using a titanium metal disc as a target in Ar, N2, and 02 atmospheres. The substrate temperature is kept at 300℃. The O2 and Ar gas flow rates are kept to be constants and the N gas flow rate is varied. TiO2-xNx films with different N contents are characterized by x-ray diffraction and x-ray photoelectron spectroscopy. The results indicate that the TiO2-xNx thin films can be obtained at 13% N and 15% N contents in the film, and the films with mixed TiO2 and TiN crystal can be obtained at 13% N and 15% N contents in the film. In terms of the results of x-ray photoelectron spectroscopy, N ls of β-N （396 eV） is the main component in the TiO2-xNx thin films. Because the energy level of β-N is positioned above the valence-band maximum of TiO2, an effective optical-energy gap decreases from 2.8 eV （for pure TiO2 film deposited by the same rf sputtering system） to 2.3 eV, which is verified by the optical-absorption spectra.     

Temperature－Dependent Photoluminescence of ZnTe Films Grown on Si Substrates

ZnTe films have been prepared on Si substrates by metal-organic chemical vapour deposition (MOCVD), and the temperature-dependent photoluminescence (PL) properties were investigated. The near-band-edge (NBE) emission of the ZnTe sample at 83K shows an asymmetry line shape, which can be decomposed into two Gaus-siam lines labelled by FE and BE. Temperature-dependent PL intensity of the NBE peak shows two variation regions, and an expression with two dissociation channels fits well to the experimental data. The results of the temperature-dependent full width at half maximum (FWHM) and peak energy were well understood under the framework of the two-dissociation-channel model. That is, at low temperature, the emission from bound excitons governs the NBE peak, while above 157K, the free exciton emission becomes dominant gradually. A simple model with three energy levels was employed to describe the variation in emission intensity of BE and FE with temperature.     

光助MOCVD生长p—ZnSe及ZnSep—n结室温蓝色电致发光

用光助低压ＭＯＣＶＤ进行ＺｎＳｅ及ＺｎＳｅ：Ｎ外延层生长，由发光光谱表明，在光助下生长的本征ＺｎＳｅ外延膜具有高质量：ＺｎＳｅ：Ｎ外延层中与Ｎ有关的深中心发射得到有效抑止，其ｐ－ＺｎＳｅ受主载流子深度达３×１０＾１７ｃｍ＾－３。在制备ｎ－ＺｎＳｅ／ＺｎＣｄＳｅ－ＺｎＳｅＱＷ／ｐ－ＺｎＳｅ结构中，在室温下观测到该二极管电脉冲下的蓝色电致发光（ＥＬ）。     

(CdZnTe,ZnSeTe)/ZnTe复合量子阱中的超快速激子衰减

为了研究低维半导体结构中的激子过程，并进一步实现超快速的激子衰减，设计了一种新型的(CdZnTe，ZnSeTe)／ZnTe复合量子阱结构，并用低压金属有机化学气相沉积方法(LPMOCVD)制备出来。用泵浦-探测方法，采用反射式光路测量了该复合结构中CdZnTe／ZnTe量子阱的激子衰减。单指数衰减拟合给690fs的下降沿时间。     

热处理对立方相结构Mg0.57Zn0.43O合金薄膜表面和组成的影响

MgZnO合金具有可覆盖日盲紫外波段的禁带宽度和晶格匹配的单晶衬底,是理想的日盲紫外探测材料.由于MgO和ZnO分属立方相和六角相,分相问题使高质量单一相MgZnO难以获得.热处理是提高薄膜结晶质量的有效手段.利用MOCVD方法制备了单一立方相Mg0.57Zn0.43O合金薄膜,研究了薄膜的退火行为对薄膜结构和光学性能...