双异质结单载流子传输光敏晶体管输出电流

详细对比并分析了双异质结单载流子传输光敏晶体管(Uni-travelling-carrier Double Heterojunction Phototransistor,UTC-DHPT)与单异质结光敏晶体管(Single Heterojunction Phototransistor,SHPT)在大的入射光功率范围下集电极输出电流特性.首先,UTC-DHPT仅选取窄带隙重掺杂的基区作为吸收区,与SHPT选取基区和集电区作为吸收区相比,其光吸收区厚度小,在小功率入射光下UTC-DHPT的输出电流小于SHPT的输出电流.其次,由于UTCDHPT的双异质结结构,光生电子和光生空穴产生于基区,减弱了SHPT因光生空穴在集电结界面积累而产生的空间电荷效应,避免了SHPT在小功率入射光下输出电流开始饱和的问题,从而UTC-DHPT获得了比SHPT更大的准线性工作范围.最后,UTC-DHPT的单载流子(电子)传输方式使得基区产生的光生空穴以介电弛豫的方式到达发射结界面,有效降低了发射结势垒,增加了单位时间内由发射区传输到基区的电子数量,提高了其发射结注入效率,在大功率入射光下UTC-DHPT比SHPT能获得更高的输出电流.     

重掺杂P型Si1-xGex层中少数载流子浓度的低温特性

考虑了重掺杂引起的禁带变窄效应,建立起少数载流子室温和低温模型,并进行了定量的计算。研究发现,p-Si1-xGex中的少子浓度(电子)随x的增加而增加。在重掺杂条件下,常温时,少子浓度随杂质浓度的上升而下降;而低温时,少子浓度却随杂质浓度的上升而上升。     

Thermal resistance matrix representation of thermal effects and thermal design in multi-finger power heterojunction bipolar transistors

The thermal resistance matrix including self-heating thermal resistance and thermal coupling resistance is presented to describe the thermal effects of multi-finger power heterojunction bipolar transistors. The dependence of thermal resistance matrix on finger spacing is also investigated. It is shown that both self-heating thermal resistance and thermal coupling resistance are lowered by increasing the finger spacing, in which the downward dissipated heat path is widened and the heat flow from adjacent fingers is effectively suppressed. The decrease of self-heating thermal resistance and thermal coupling resistance is helpful for improving the thermal stability of power devices. Furthermore, with the aid of the thermal resistance matrix, a 10-finger power heterojunction bipolar transistor (HBT) with non-uniform finger spacing is designed for high thermal stability. The optimized structure can effectively lower the peak temperature while maintaining a uniformity of the temperature profile at various biases and thus the device effectively may operate at a higher power level.     

Collector optimization for tradeoff between breakdown voltage and cut-off frequency in SiGe HBT

As is well known, there exists a tradeoff between the breakdown voltage BVCEOand the cut-off frequency fTfor a standard heterojunction bipolar transistor(HBT). In this paper, this tradeoff is alleviated by collector doping engineering in the SiGe HBT by utilizing a novel composite of P+and N-doping layers inside the collector–base(CB) space-charge region(SCR). Compared with the single N-type collector, the introduction of the thin P+layers provides a reverse electric field weakening the electric field near the CB metallurgical junction without changing the field direction, and the thin Nlayer further effectively lowers the electric field near the CB metallurgical junction. As a result, the electron temperature near the CB metallurgical junction is lowered, consequently suppressing the impact ionization, thus BVCEOis improved with a slight degradation in fT. The results show that the product of fT×BVCEOis improved from 309.51 GHz·V to326.35 GHz·V.     

一款应用于多频带的基于新型Cascode有源电感的高Q带通滤波器

设计了一款基于新型Cascode有源电感和有源负阻电路的二阶差分有源带通滤波器。新型有源电感和有源负阻电路的采用可实现在滤波器Q值不变的条件下对滤波器的中心频率进行调节。仿真结果表明,通过调节有源电感和有源负阻电路的偏置条件,可有效增大滤波器的Q值,且在保持Q值恒定在226的条件下中心频率的变化范围为0.2-3.7GHz。滤波器的以上特性使其能很好地应用于多频带的无线系统。     

改善SiGe HBTs热稳定性的Ge组分分布优化与设计

The impact of the three state-of-the-art germanium(Ge) profiles(box,trapezoid and triangular) across the base of SiGe heterojunction bipolar transistors(HBTs) under the condition of the same total amount of Ge on the temperature dependence of current gainβand cut-off frequency f_T,as well as the temperature profile,are investigated.It can be found that although theβof HBT with a box Ge profile is larger than that of the others,it decreases the fastest as the temperature increases,while theβof HBT with a triangular Ge profile is smaller than that of the others,but decreases the slowest as the temperature increases.On the other hand,the f_T of HBT with a trapezoid Ge profile is larger than that of the others,but decreases the fastest as the temperature increases,and the f_T of HBT with a box Ge profile is smaller than that of the others,but decreases the slowest as temperature increases.Furthermore,the peak and surface temperature difference between the emitter fingers of the HBT with a triangular Ge profile is higher than that of the others.Based on these results,a novel segmented step box Ge profile is proposed,which has modestβand f_T,and trades off the temperature sensitivity of current gain and cut-off frequency,and the temperature profile of the device.     

具有TiN扩散阻挡层的n-GaAs欧姆接触的可靠性

提出了金属 -半导体欧姆接触退化的快速评估方法——温度斜坡快速评价法 ,并建立了自动评估系统 ,用该方法和系统测得的欧姆接触退化激活能 ,和传统方法相比 ,耗时少 ,所需样品少 ,所得结果和传统方法一致 .针对传统 Au Ge Ni/Au欧姆接触系统的缺点 ,提出了加 Ti N扩散阻挡层的新型欧姆接触系统 .实验表明新型欧姆接触系统的可靠性远远优于传统 Au Ge Ni/Au欧姆接触系统 .     

一种改进型共源-共栅-共漏有源电感

在传统共源-共栅-共漏(CS-CG-CD)有源电感的基础上,提出一种改进型有源电感。在负跨导器的CG晶体管与正跨导器的CD晶体管之间引入带有并联电阻的第一反馈回路和具有小尺寸晶体管的第二反馈回路;另外,在负跨导器的CS晶体管与正跨导器的CD晶体管之间引入调控支路;最终,通过不同模块的相互配合及其他三个外部调控端电压的联合调节,实现了对电感性能的两种重构：1)在同一频率下取得高的Q峰值且Q峰值相对L值可大范围独立调节;2)在不同频率下取得高的Q峰值且Q峰值保持基本不变。验证结果表明,在频率5.81 GHz下,Q峰值可从1 132调谐到15 491,调谐范围高达1 268.5%,而电感值在7.65～7.67 nH之间变化,变化率仅为0.26%;在频率5.72 GHz、7.12 GHz和7.93 GHz下,分别取得了1 274、1 317和1 310的高Q峰值,Q峰值变化率仅为3.38%,同时分别取得了大的电感值7.62 nH、8.08 nH和8.81 nH;有源电感的直流功耗约为38.61 mW。     

一种电感值和Q峰值可相互独立调谐的高线性有源电感

设计了一种电感值和Q峰值可相互独立调谐的高线性有源电感。该电感主要由跨导增强模块、互补共源级模块以及单端负阻模块构成。其中,跨导增强模块不仅可以作为正跨导器,并且可实现对电感值的大范围调谐;互补共源级模块不仅可以作为负跨导器,并且可改善有源电感的线性度;单端负阻模块不仅提高了Q值,并且补偿由电感值的调谐导致的Q峰值的变化。最终,通过以上模块的相互配合及其外部端口电压的协同调控,改善了有源电感的线性度,而且实现了在同一频率下Q峰值相对于电感值可大范围独立调谐以及在不同频率下电感值相对于Q峰值可大范围独立调谐的优秀性能。验证结果表明,该有源电感电感值的-1 dB压缩点为-7 dBm;在2.07 GHz的频率下,Q峰值可从240调节到1573,而电感值从11.89 nH仅变化到12.11 nH;在0.989 GHz、2.070 GHz和3.058 GHz的不同频率下,取得了493.7、501.2和508.4的高Q峰值,变化率仅为3%,而相应频率下的电感值分别为16.1 nH、13.4 nH和6.8 nH,变化率为136.7%。     

功率SiGe/Si HBT的温度特性

测量了Si/SiGe HBT在23~260℃温度范围内的Gummel图、理想因子n、不同基极电流下的发射结电压VBE、电流增益β、共发射极输出特性,以及Early电压VA的变化情况。结果表明,随电流和温度的增加,β减少,VBE随温度的变化率dVBE/dT小于同质结Si BJT。在高集电极-发射极电压和大电流下,在输出特性曲线上观察到了负微分电阻(NDR)特性。结果还显示,电流增益-Early电压积与温度的倒数(1/T)呈线性关系,这对模拟电路应用是很重要和有用的。