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21.
Alois Virag Gernot Friedbacher Manfred Grasserbauer Wolf -Dieter Schubert Michael Fryc Benno Lux 《Mikrochimica acta》1988,96(1-6):57-73
A SIMS method for the direct identification of micro and nanophases based on the quantitative evaluation of atomic and cluster ion intensities is described and applied to the study of the formation of CaS phases in hard metals. 相似文献
22.
P. Wilhartitz A. Virag G. Friedbacher M. Grasserbauer H. M. Ortner 《Fresenius' Journal of Analytical Chemistry》1987,329(2-3):228-236
Summary The ever increasing demands on properties of materials creates a trend also towards ultrapure products. Characterization of these materials is only possible with modern, highly sophisticated analytical techniques such as activation analysis and mass spectrometry, particularly SSMS, SIMS and GDMS [1].Analytical strategies were developed for the determination of about 40 elements in a tungsten matrix with high-performance SIMS. Difficulties like the elimination of interferences had to be overcome. Extrapolated detection limits were established in the range of pg/g (alkali metals, halides) to ng/g (e. g., Ta, Th).Depth profiling and ion imaging gave additional information about the lateral and the depth distribution of the elements.
Multielementepurenanalyse in Wolfram mittels SIMS相似文献