Diffuse x-ray scattering study of the formation of microdefects in heat-treated dislocation-free large-diameter silicon wafers

Diffuse x-ray scattering (DXS) is used to study the formation of microdefects (MDs) in heat-treated dislocation-free large-diameter silicon wafers with vacancies. The DXS method is shown to be efficient for investigating MDs in silicon single crystals. Specific defects, such as impurity clouds, are found to form in the silicon wafers during low-temperature annealing at 450°C. These defects are oxygen-rich regions in the solid solution with diffuse coherent interfaces. In the following stages of decomposition of the supersaturated solid solution, oxide precipitates form inside these regions and the impurity clouds disappear. As a result of the decomposition of the supersaturated solid solution of oxygen, interstitial MDs form in the silicon wafers during multistep heat treatment. These MDs lie in the {110} planes and have nonspherical displacement fields. The volume density and size of MDs forming in the silicon wafers at various stages of the decomposition are determined.     

Numerical analysis of time-dependent Boussinesq models

In this paper we analyse numerical models for time-dependent Boussinesq equations. These equations arise when so-called Boussinesq terms are introduced into the shallow water equations. We use the Boussinesq terms proposed by Katapodes and Dingemans. These terms generalize the constant depth terms given by Broer. The shallow water equations are discretized by using fourth-order finite difference formulae for the space derivatives and a fourth-order explicit time integrator. The effect on the stability and accuracy of various discrete Boussinesq terms is investigated. Numerical experiments are presented in the case of a fourth-order Runge-Kutta time integrator.     

Fano direct products as rationally connected fibrations

Combining the connectedness principle of Shokurov and Kollár, we develop a new technique of studying birational maps of natural Fano fiber spaces. We prove that the only structures of a rationally connected fibration on direct products of typical Fano varieties are projections onto the factors. In particular, the groups of biregular and birational self-maps of Fano direct products coincide. __________ Translated from Fundamentalnaya i Prikladnaya Matematika, Vol. 10, No. 4, pp. 183–206, 2004.     

Calculation of the bond ionicity in complex oxides

A technique for calculating the bond ionicity of crystalline materials using electronegativities of elements and taking into account the structure of polyhedra of the complex-oxide structure is proposed.     

The effect of technological microdefects of structure on service life of polymer materials

Within the framework of the kinetic theory of strength, relations for estimation of durability of thermoplastic materials under stationary and non-stationary thermomechanical impacts are obtained It is shown that durability decreases linearly with increase in the natural (Napierian) logarithm of the mean size of microcracks formed during manufacturing of polymer products. __________ Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, pp. 3–6, July, 2007.