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121.
D. Reznik T. Fukuda A.Q.R. Baron S. Tsutsui K. Yamada 《Journal of Physics and Chemistry of Solids》2008,69(12):3103-3107
Inelastic X-ray scattering (IXS) was used to study the Cu-O bond-stretching vibrations in the static stripe phase compound La1.48Nd0.4Sr0.12CuO4. It was found that the intrinsic width in Q-space of the previously reported huge anomalous phonon softening and broadening is approximately 0.08 r.l.u. HWHM. A detailed comparison was also made to inelastic neutron scattering (INS) studies, which indicate a two-peak lineshape (with superimposed broad and narrow peaks) in the vicinity of the anomaly. The high resolution IXS data show that the narrow peak is mostly an artifact of the poor transverse Q-resolution of INS. Otherwise, the agreement between the INS and IXS was excellent. 相似文献
122.
Reznik I. A. Gromova Yu. A. Zlatov A. S. Baranov M. A. Orlova A. O. Moshkalev S. A. Maslov V. G. Baranov A. V. Fedorov A. V. 《Optics and Spectroscopy》2017,122(1):114-119
Optics and Spectroscopy - Luminescence and photoelectric properties of hybrid structures based on CdSe/ZnS quantum dots (QDs) and multilayer graphene have been investigated. A correlation between... 相似文献
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M. V. Mezhennyi M. G. Mil’vidskii V. F. Pavlov V. Ya. Reznik 《Physics of the Solid State》2002,44(7):1284-1290
The specific features in the generation and motion of dislocations in silicon single-crystal wafers after different heat treatments are investigated by the four-point bending technique. It is demonstrated that annealing of silicon single-crystal wafers at a temperature of 450°C leads to their substantial hardening as compared to the postgrowth state. The oxygen-containing precipitates and precipitate dislocation pileups formed in the silicon wafer bulk during multistage heat treatment are efficient heterogeneous nucleation sites of dislocations under the action of thermal or mechanical stresses. It is found that the multistage heat treatment of the silicon wafers under conditions providing the formation of an internal getter within their bulk results in considerable disordering of the wafer structure. The inference is made that the formation of the defect state in the crystal lattice of silicon and the strength characteristics of silicon wafers substantially depend on the temperature-time schedules of the low-temperature stage of multistage heat treatment. 相似文献
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V. S. Reznik I. Sh. Salikhov Yu. S. Shvetsov Yu. Ya. Efremov I. Kh. Rizvanov 《Russian Chemical Bulletin》1995,44(2):326-332
Methods for the synthesis of compounds containing two or more pyrimidine rings linked through aliphatic chains with different numbers of carbon atoms are described.Deceased.Translated fromIzvestiya Akademii Nauk. Seriya Khimicheskaya, No. 2, pp. 335–340, February, 1995 相似文献
129.
Andreas Pfrang Boris Reznik Thomas Schimmel Dagmar Gerthsen 《Microscopy and microanalysis》2005,11(1):46-55
The microstructure of carbon-carbon composites obtained by chemical vapor infiltration of a carbon fiber felt was comparatively studied by reflection light microscopy, transmission electron microscopy (TEM), scanning electron microscopy (SEM), atomic force microscopy (AFM), and laser scanning confocal microscopy (LSCM). Ar+ ion etching was used to reveal and distinguish structural units of the pyrolytic carbon matrix. Mechanically polished samples, polished and subsequently ion etched samples, and fractured samples were compared. The values of surface roughness and surface height after polishing or after polishing and subsequent etching determined by AFM and LSCM correlate well with the degree of texture of the matrix layers obtained by polarized light microscopy and selected area electron diffraction. The carbon matrix is composed of structural units or "cells," which contain a carbon fiber and a sequence of several differently textured layers around each fiber. Within high-textured layers columnar grains are well recognizable using polarized reflection light microscopy and confocal microscopy. The size of depressions within high-textured carbon layers found by AFM after ion etching correlates well with the size of differently tilted domains detected by both TEM and SEM. 相似文献
130.
Ovchinnikova N. A. Sinyakov A. E. Reznik A. M. Sakharov S. G. Gorbunova Yu. E. Mikhailov Yu. N. Kanishcheva A. S. Butskii V. D. 《Russian Journal of Coordination Chemistry》2002,28(9):673-677
The reaction of tungsten hexachloride with excess ethyl isocyanate in dichloroethane leads to the insertion of three ligand molecules at one of the tungsten–chlorine bonds. The data of elemental analysis and IR spectroscopy confirm that the thermolysis of the reaction mixture affords the WCl4(L3Cl) complex (I), where L = –N(Et)C(O)–. The structure of the chain of inserted molecules in I is established on the basis of IR and NMR data, and the results of X-ray diffraction analysis of crystals of an organic product (II) of the hydrolysis of I. According to the latter, compound (II) is a derivative of s-triazine—1,3,5-triethyl-1,3,5-triazine-2,4,6-(1H,3H,5H)-trione. 相似文献