The Storing Matter technique: Preliminary results on PS and PVC

The Storing Matter technique has been developed recently in SAM to perform quantitative analyses with high sensitivity: the sample to be analysed is sputtered by ion bombardment and up to a sub-monolayer of emitted particles is deposited on a collector. In the present work, this collector is subsequently analysed by static Secondary Ion Mass Spectrometry (SIMS). We concentrate on the conservation of the molecular information throughout the deposition and analysis processes. The experiments are realised on PS and PVC films. The deposits have been clearly identified on the collector. The molecular information is partially conserved throughout the deposition and analysis processes. Higher fragmentation in the mass spectra of the collectors is due to double fragmentation in the sputter-deposition and analysis steps.     

C60 growth on Si(100), GaSe(0001) and GeS(001)

C₆₀ films have been grown in ultra high vacuum on various crystalline substrates and the structure of the films has been investigated by low energy electron diffraction (LEED) and high resolution electron energy loss spectroscopy (HREELS). The C₆₀ films form randomly oriented nanocrystals on Si(100), mesoscopic polycrystals on GaSe(0001) and microscopic single crystals on GeS(001). The vibrational structure of the C₆₀/substrate interfaces is analyzed in detail by HREELS carried out in the dipole and impact scattering regimes. It is shown that the epitaxy of C₆₀ on GeS(001) is induced by the weak van der Waals bonding and the peculiar corrugation of the substrate surface.